SU884394A1 - Device for measuring wavelength - Google Patents

Device for measuring wavelength Download PDF

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Publication number
SU884394A1
SU884394A1 SU802962292A SU2962292A SU884394A1 SU 884394 A1 SU884394 A1 SU 884394A1 SU 802962292 A SU802962292 A SU 802962292A SU 2962292 A SU2962292 A SU 2962292A SU 884394 A1 SU884394 A1 SU 884394A1
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SU
USSR - Soviet Union
Prior art keywords
measuring
additional
measuring interferometer
monochromator
resonator
Prior art date
Application number
SU802962292A
Other languages
Russian (ru)
Inventor
В.Е. Привалов
В.П. Капралов
Original Assignee
Предприятие П/Я А-1742
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Filing date
Publication date
Application filed by Предприятие П/Я А-1742 filed Critical Предприятие П/Я А-1742
Priority to SU802962292A priority Critical patent/SU884394A1/en
Application granted granted Critical
Publication of SU884394A1 publication Critical patent/SU884394A1/en

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Abstract

УСТРОЙСТВО ДЛЯ ИЗ МЕРЕНИЯ ДЛИН ВОЛН в оптическом диапазоне, содержащее эталонный источник излучени  и, установленные по ходу луча., монохроматор, измерительный интерферометр и блок регистрации интенсивности интерференции, отличающеес  тем, что, с целью повышени  точности и производительности измерений, устройство снабжено активным элементом лазера, установленным внутри измерительного интерферометра так, что его зеркала образуют резонатор, дополнительным i фотоприемником с частотометром и опорным лазером, при этом дополнительный фотоприемник штичёскв зан с обоими лазерами.A device for measuring wavelengths in the optical range, containing a reference radiation source and installed along the beam, a monochromator, a measuring interferometer and an interference intensity recording unit, characterized in that, in order to improve the accuracy and performance of measurements, the device is equipped with an active laser element installed inside the measuring interferometer so that its mirrors form a resonator, an additional i photodetector with a frequency meter and a reference laser, with additional A pinch photocell receiver is used with both lasers.

Description

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Claims (1)

УСТРОЙСТВО ДЛЯ ИЗМЕРЕНИЯ ДЛИН ВОЛН в оптичес'ком диапазоне, содержащее эталонный источник излучения и установленные по ходу луча., монохроматор, измерительный интерферометр и блок регистрации интенсивности интерференции, отличающееся тем, что, с целью повышения точности и производительности измерений, устройство снабжено активным элементом лазера, установленным внутри измерительного интерферометра так, что его зеркала образуют резонатор, дополнительным фотоприемником с частотометром и опорным лазером, при этом дополнительный фотоприемник , оптически связан с обоими лазерами.DEVICE FOR MEASURING LENGTH OF WAVES in the optical range, containing a reference radiation source and installed along the beam., Monochromator, measuring interferometer and interference intensity registration unit, characterized in that, in order to increase the accuracy and performance of measurements, the device is equipped with an active laser element mounted inside the measuring interferometer so that its mirrors form a resonator, an additional photodetector with a frequency meter and a reference laser, with an additional photoprobe receiver, optically coupled to both lasers.
SU802962292A 1980-07-23 1980-07-23 Device for measuring wavelength SU884394A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU802962292A SU884394A1 (en) 1980-07-23 1980-07-23 Device for measuring wavelength

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU802962292A SU884394A1 (en) 1980-07-23 1980-07-23 Device for measuring wavelength

Publications (1)

Publication Number Publication Date
SU884394A1 true SU884394A1 (en) 1982-10-07

Family

ID=20910510

Family Applications (1)

Application Number Title Priority Date Filing Date
SU802962292A SU884394A1 (en) 1980-07-23 1980-07-23 Device for measuring wavelength

Country Status (1)

Country Link
SU (1) SU884394A1 (en)

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
1. Берн М. ,Вольф Э.. Основы оптики. М., НаукаГ, 1973, с. 271. 2. BargerK., Hall J. Appl. Phys. Lett. V. 22, p. 126, 1973. *

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