SU741195A1 - Device for measuring four-pole network dissipation parameters - Google Patents

Description

This goal is achieved by the fact that a device for measuring the scattering parameters of a quadrupole containing an emf source, a vector voltmeter, a contact block for connecting a quadrupole under study, a switch consisting of controllable keys and a software block, two exemplary resistors are introduced, the source of emf the reference channel of the vector voltmeter is connected to the input of the first and second controlled keys, the other input of the first controlled key is connected to the housing, and its output is consistent with the first samples m resistor connected to the input of the third controllable switch, whose output is connected to the input of the test quadripole, the output of the second controlled switch is connected to the housing and the other. the input in series with the second exemplary resistor is connected to the output of the fourth controlled key, the input of which is connected to the output of the studied quadrupole, the measuring channel of the vector altmeter is connected to the outputs of the fifth and sixth control keys, the input of the fifth control key is connected to the input of the third controlled key , the input of the sixth controlled key — with the output of the fourth controlled key; the control inputs of the controlled keys are connected to the outputs of the program block,

The drawing shows a block diagram of a device for measuring scattering parameters of a quadrupole.

The device contains an EMF source 1, a vector voltmeter 2, a contact block 3 for connecting a quadrupole 4 under study, a switch 5 consisting of controllable keys b-I and program block 12, and sample resistors 13 and 14. Source of electromotive force with a reference channel of a vector voltmeter 2 is connected to the inputs of the first 6. and second 7 controlled keys, with the other input of the first controlled key connected to the housing, and its output in series with the first exemplary resistor 13 is connected to the input of the third controlled key 8, the output of which is connected with the input of the quadrupole under study 4, the output of the second controlled key is connected to the case, and its other input is connected in series with the second exemplary resistor 14 to the output of the fourth controlled key 9, the input of which is connected to the output of the test quadripole. The measuring channel of the vector voltmeter 2 is connected to the outputs of the fifth and sixth 11 controlled keys. The input of the fifth controllable key is connected to the input of the third controllable key, and the input

the sixth controllable key - with the output of the fourth controllable key. The control inputs of the keys 6-11 are connected to the outputs of the software block 12, which connects the source of the circuit 15.

The device works as follows.

 Using software block 12, an alternate connection is made.

controlled keys 6-11 to the power source 15.

When the controlled keys are turned off, at the output of the source the EMF 1 is registered by the reference channel of the vector

5 voltmeter 2 voltage E, which characterizes twice the value of the incident wave entering the quadrupole 4 input.

When triggered controlled

0 keys b and 10 a signal from an emf source is applied to an exemplary resistor 13. The measuring channel of a vector voltmeter is connected via contacts of a control key 10 to a resistor of RU 13 for measuring complex voltage 0, which characterizes a shunt effect when measuring voltages at the quadrupole.

.J When triggered switches 8 and 9 are triggered, the signal from the source of the variable voltage EMF 1 through the resistor 13 is fed to the input of the quadrupole 4, the output of which is loaded to the resistor

 14, connected to the case via the contacts of the control key 7, Vector voltmeter 2 registers the complex voltage. at the entrance of the quadrupole.

When disabling a controllable key

0 10 and turning on the control key 11, the measuring channel of the vector voltmeter is connected via its contacts to the resistor 14 to measure the complex voltage Ujy, at the output

5 quadrupole when connecting the source of the variable EMF with its output. Similarly, complex voltages E are measured at the output of a source of a variable EMF, and at the output of a quadrupole 4 when it is turned off, iljj at the output and at the input of the quadrupole when the source of a variable EMF is connected to its output.

The given complex elements of the four-port scattering matrix, taking into account the parasitic effect of the input resistance of one of the channels of the vector voltmeter 2, are calculated using the measured voltages using the formulas

9 t,

(

E and "

2UTH / ei

h,

-H (-shch

one

/ Cr

--one

 Oi)

. iT AJTil LO I RI I

n e, o,)

where R, (and Rj resistors 13 and 14, respectively. Resistors perform two functions in the measurement process. First, each resistor is used to calibrate the input resistance of the measuring channel of the vector voltmeter 2 and the parasitic mounting parameters of the measuring device, secondly, as the load, respectively, the input or output of the quadrupole 4,

The proposed algorithm of operation of the device can be easily implemented to measure the scattering parameters of linear elements having any number of leads (pairs of poles).

The introduction of this device into practice allows us to increase the accuracy of scattering parameters by calibrating the device and adjusting the final results. Thus, for example, when measuring voltages with a voltmeter with an input resistance of 1 MΩ 20 pF at the output of a bipolar transistor with an OE whose output resistance is 100 kΩ, the accuracy of determining the reflection coefficient at the output and the forward transmission coefficient increases by 9% or more.

 the invention

A device for measuring scattering parameters of a quadrupole containing an EMF source, a vector voltmeter, a contact block for connecting the test quadrupole, a switch consisting of controllable keys and a software block, characterized in that, in order to improve the accuracy of measurement, two exemplary a resistor, the source of the EMF with the reference channel of the vector voltmeter connected to the input of the first and second

0 controllable keys, another input of the first controllable key is connected to the housing, and its output in series with the first exemplary resistor is connected to the input of the third controllable key, the output of which is connected to the input of the studied quadrupole, the output of the second controllable key is connected to the housing, and another, its input is consistent with the second

A sample resistor is connected to the output of a fourth controlled key, the input of which is connected to the output of a quadrupole under investigation, the measuring channel of the vector voltmeter is connected to the outputs of the fifth and sixth controlled keys, the input of the fifth controlled key is connected to the input of the third controlled key, the input of the sixth control key — from the output of the fourth control key; the control inputs of the control keys are connected to the outputs of the program block.

Information sources,

5 taken into account in the examination

1. Bayorunas E.N. and Eidukas D.Yu., Measurement of high-frequency parameters of transistors with the help of serial-manufactured equipment. Proceedings of the scientific technical conference. Radio measurements Vilnius, 1969, pp.202-204.

2. USSR author's certificate on application no. 2172144/18-09,

C. 01 R 27/28, 15.09.75 (prototype).

five

Claims (2)

Claim A device for measuring the scattering parameters of a four-terminal network containing an EMF source, a vector voltmeter, a contact block for connecting the studied four-terminal network, a switchboard consisting of controlled keys and a program unit, characterized in that, in order to increase the measurement accuracy, two reference resistors are introduced into it moreover, the EMF source with the reference channel of the vector voltmeter is connected to the input of the first and second controlled keys, the other input of the first controlled key is connected to the housing, and its output is it is connected with the first exemplary resistor to the input of the third controlled key, the output of which is connected to the input of the four-terminal under investigation, the output of the second controlled key is connected to the housing, and the other, its input is connected in series with the second exemplary resistor to the output of the fourth controlled key, the input of which is connected to the output the four-terminal under study, the measuring channel of the vector voltmeter is connected to the outputs of the fifth and sixth controlled keys, the input of the fifth controlled key is connected, with the input of the managed key, the input of the sixth managed key - with the output of the fourth managed key, the control inputs of the managed keys are connected to the outputs of the program unit. Sources of information taken into account during the examination 1. Bayorunas E.N. and Eidukas D.Yu. Measurement of high-frequency parameters of transistors using commercially available equipment. Proceedings of the scientific and technical conference. Radio measurements. Vilnius, 1969, p.202-204. 2. USSR author's certificate on application No. 2172144 / 18-09, kh.G 01 R 27/28, 09/15/75 (prototype).