SU693383A1 - Device for processing information about flaws of articles - Google Patents

Description

(54) DEVICE FOR PROCESSING INFORMATION ABOUT DEFECTNESS FROM | OELY

the shift register, and the outputs of the AND-NOT elements are connected to the counting inputs of a two-digit Tactical reversible counter, the output of which is the output of the device.

The drawing shows the block diagram of the device. It consists of a flaw detector 1, the output of which is connected to the information input of the shift register 3 through a memory device 2. The shift input of the register 3 and the input of the first single-oscillator

4 are connected if the sensor for moving the product 5. The outputs of the first one-shot 4 are connected to the input of the second one-shot b, as well as to the inputs of the storage device 2 and the first ailement I-HE 7, the output of the second one-shot b is connected to one of the inputs of the second element AND-HE 8. Exit1 The first and second register bits / 3 are connected to the second inputs of the AND-NOT elements, and the outputs of the latter are connected to the double-dec input counters, counter-reversible counter 9. The counter .9 is connected to the indi block; katsyi, -. . ;. - /. . . ,

The device works as follows. . :. .

In the main process, we are still in control of the dates of movement.

5 Generated pulses, for example, every millimeter of the path, passing through the product. These pulses arrive at the shift input of the register.

3 and simultaneously to the input of the one-shot 4. Each pulse from the transducer of the product 5 shifts the information in the register 3 ya one bit and SOBOIM back edge triggers a single-vibration 4, the output impulses of the cbi which go to one of the inputs of the circuit 7, to the input of the zero setting storage device 2 and on the one-shot 6.

Signal on the presence of a drift: kta at any moment of time arrives from defecToCKoria 1 to the input of the obstructive device pplcTiBa 2 and sets it to one state. Another impulse from the sensor. moving product 5 information about; the presence of a defect is copied from the storage device 2 to the first digit of the register 3, the output of the catcher is connected to the second input of the circuit 7, as a result of which the reversible counter, 9 performs the operation of addition, and the storage device 2. comes to its original state.

If the length of the base segment of a KdHewQ beside a controlled product is n mm, then register 3 must have (n + 1) bits.

Assume a product has a single defect. The information on the I Otor is recorded by a counter 9. For a period of n mm. the counter 9 will indicate a unit, and at the moment of arrival of the (n + 1) th pulse from the displacement sensor 5, both signals will go to the inputs of the circuit 8 and the counter 9 will be read, i.e. the counter returns to its original state. . The use of two one-shot 4 and b is due to the need to perform the operations of addition and subtraction by the counter 9 from one impulse of the movement sensor of the product 5. So, if the information about the presence of

The flaw is recorded without a break in register 3 each time a pulse is received from displacement transducer 5, the reversible counter 9 will continuously increase its readings until the information on the presence of a defect is moved to (n + 1) register bit 3, after which, with each 5 Movement Pulse, the product will be added and subtracted by a counter 9, i.e. the counter reading will not change and it will show on the digital display the maximum defectiveness of the item. Such a state of the counter will remain until the recording fails to stop.

about the presence of a defect in the first register bit 3. In this case, with a pulse from the sensor of movement of the product 5, the counter 9 will produce a successively over: reading of the information accumulated by the meter, until it comes to its original (zero) state a) .

. Thus, the proposed device fixes on the digital display the value of the defectiveness of the moving test item, which falls on its base length equal to

.mm ..; ......

The proposed device can be performed completely on the elements of microelectronics. So, K1TK551 trigger should be used as a memory device 2, register 3 - a set of elements K1IR551, elements I-HE 7 and 8 - K1L6553, waiting for: one-shot 4 and b t K2GF182, reversible counter 9 - K1IE556 and K1ID551.

The application of the proposed device will allow improving the quality of products of the extended form produced by enterprises (for example, pipes) due to the operative change of the equipment operation mode depending on the defective values of the manufactured product read from the digital display of the proposed device.

Claims (2)

In some cases, for example, when producing electric welded pipes, it is necessary not only to know the value of efficiency, but also to give an electrical signal to control the welding process. To obtain the above-mentioned analog signal in the proposed device, a counter code converter is applied to a voltage of 10, which is performed on a weight resistor and an operational amplifier of the type K284UD1A. An apparatus for processing information on defects in products containing a flaw detector with elements of discrete logic, characterized in that, in order to improve the quality of control, it contains a shift register, the information input of which is connected to the output of the flaw detector through a memory device and the shift input to the first output pulse sensor of movement of the product, the second output of which is connected to the input of the first one-shot, the first output of which is connected to the inputs, setting zero memory The second output is connected to the input of the second AND-NOT element, the second inputs of the AND-NO elements are connected to the outputs of the first and last bits of the shift register, and the outputs of the elements podklk cheny to the counting inputs of the binary-decimal reversible counter, the output of which is V. the course of the device. . Sources of information taken into account during the examination 1. Welding quality control ;. Edited by V.N. Vrlchenko. Study Guide for engineering universities, Moscow, Mechanical Engineering, 1975 ,; with. 283. 2. Defectoscopy, 1965, No. 4, p. 45-49 (prototype).  WoE to 3