SU669299A1 - Arrangement for automatic registration of semiconductor device characteristics - Google Patents
Arrangement for automatic registration of semiconductor device characteristicsInfo
- Publication number
- SU669299A1 SU669299A1 SU721754626A SU1754626A SU669299A1 SU 669299 A1 SU669299 A1 SU 669299A1 SU 721754626 A SU721754626 A SU 721754626A SU 1754626 A SU1754626 A SU 1754626A SU 669299 A1 SU669299 A1 SU 669299A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- arrangement
- semiconductor device
- device characteristics
- automatic registration
- input
- Prior art date
Links
Description
II
Изобретение относитс к области приборостроени , в частности к измеритетьным приборам, и может быть использовано при измерени х характеристик полупроводниковых приборов.The invention relates to the field of instrumentation, in particular to measuring devices, and can be used to measure the characteristics of semiconductor devices.
Известен характериограф ПНХТ-1, позвол ющий наблюдать вольтамерные характеристики полупроводниковых приборов {1. Однако с его помощью невозможно получить непосредственно характеристику дифференциальной проводимости.The PNHT-1 characterizer is known, which allows observing the current-voltage characteristics of the semiconductor devices {1. However, with its help it is impossible to obtain directly the characteristic of differential conductivity.
Известно также устройство дл автоматического сн ти характеристик полупроводниковых приборов, содержащее генератор нарастающего напр жени , генератор высокой частоты, сумматор напр жени , токосъемпый резистор, фильтр высокой частоты , двухлучевой осциллограф, усилитель, детектор и видеоусилитель 2. Однако оно не дает полной информации оо исследуемом приборе, как о двухполюснике, поскольку он не характеризует сдвига фазы между током и напр жением.It is also known a device for automatically measuring the characteristics of semiconductor devices, comprising a rising voltage generator, a high frequency generator, a voltage adder, a current collecting resistor, a high frequency filter, a two-beam oscilloscope, an amplifier, a detector, and a video amplifier 2. However, it does not provide complete information about the investigated device as a two-pole device, since it does not characterize the phase shift between current and voltage.
Целью изобретени вл етс облегчение визуального разделени емкостных и индуктивных участков характеристики проводимости и повыщение производительности измерений.The aim of the invention is to facilitate the visual separation of capacitive and inductive sections of the conductivity characteristic and an increase in the measurement performance.
. Это достигаетс тем, что в устройство введено дополнительно фазочувствительное устройство, один вход которого через фильтр подключен к чейке дл измер емого полупроводникового прибора, а другой - к генератору высокой частоты, его выход подключен к вертикальному входу двухлучевого осциллографа и через блок формировани меток - ко входу модул ции ркости.. This is achieved by additionally introducing a phase-sensitive device into the device, one input of which is connected to the cell for the measured semiconductor device through a filter and the other to the high-frequency generator, its output connected to the vertical input of a double-beam oscilloscope and through the tagging unit to the input luminance modulation.
На чертеже дана структурна электрическа схема устройства.The drawing shows the structural electrical circuit of the device.
Оно содержит генератора 1 нарастающего напр жени и генератор 2 высокой частоты, выходы которых через сумматор 3 напр жени подключены к одной клемме испытуемого прибора, друга клемма которого заземлена через токосъемный резистор 4, а через фильтр высокой частоты 5, усилитель 6, детектор 7 и видеоусилитель 8 подключена ко входу вертикального отклонени первого луча двухлучевого осциллографа 9. Выход фильтра 5 св зан также с одним входом фазочувствитегтьного устройства 10, другой, вход которого подключен к выходуIt contains a rising voltage generator 1 and a high frequency generator 2, the outputs of which are connected to the same terminal of the test device through the voltage adder 3, the other terminal of which is grounded through the current collector resistor 4, and through the high frequency filter 5, amplifier 6, detector 7 and video amplifier 8 is connected to the vertical deflection input of the first beam of the two-beam oscilloscope 9. The output of the filter 5 is also connected to one input of the phase-sensitive device 10, the other whose input is connected to the output
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU721754626A SU669299A1 (en) | 1972-03-02 | 1972-03-02 | Arrangement for automatic registration of semiconductor device characteristics |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU721754626A SU669299A1 (en) | 1972-03-02 | 1972-03-02 | Arrangement for automatic registration of semiconductor device characteristics |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU669299A1 true SU669299A1 (en) | 1979-06-25 |
Family
ID=20505123
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU721754626A SU669299A1 (en) | 1972-03-02 | 1972-03-02 | Arrangement for automatic registration of semiconductor device characteristics |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU669299A1 (en) |
-
1972
- 1972-03-02 SU SU721754626A patent/SU669299A1/en active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110244112A (en) | A kind of measuring device and measuring method of time domain dielectric material polarization transient state | |
| SU669299A1 (en) | Arrangement for automatic registration of semiconductor device characteristics | |
| US3448378A (en) | Impedance measuring instrument having a voltage divider comprising a pair of amplifiers | |
| US3360726A (en) | Radiation responsive device | |
| US2582851A (en) | Transient analyzer | |
| Shideler et al. | A low-noise potentiostat for the study of small amplitude signals in electrochemistry | |
| SU783715A1 (en) | Apparatus for measuring amplitude-frequency characteristic of amplifier | |
| SU1679421A1 (en) | Method of finding of point of reduced resistance of insulation of power network and device to implement it | |
| Ellis et al. | Measurement of the AC Kerr effect in conducting liquids | |
| SU819750A1 (en) | Device for measuring photoelectric cell noise characteristics | |
| RU2034288C1 (en) | Meter of grain moisture | |
| SU391504A1 (en) | DEVICE FOR MEASURING SMALL MAGNETIC AND ELECTRIC FIELDS | |
| SU362263A1 (en) | ALL-UNION ' | |
| Šicha et al. | Study of moving striations in plasma. II. Investigation of the validity of the microwave and the probe measuring techniques | |
| SU1441336A1 (en) | Apparatus for monitoring the quality of contacts of electronic units | |
| SU712775A1 (en) | Automatic meter of complex resistance components | |
| SU763822A1 (en) | Device for determining volt-ampere responce of switching members | |
| Zijlstra et al. | A mechanical electrometer as noise spectrum analyzer | |
| SU857889A1 (en) | Method of measuring charge carrier energy relaxation time in semiconductors | |
| SU1053016A1 (en) | Device for studying volt-ampere characteristic of state device | |
| SU1425431A1 (en) | Eddy-current thickness gauge | |
| SU1219971A1 (en) | Alternating current bridge for low-reading resistance thermometer | |
| SU708267A1 (en) | Arrangement for measuring varicap parameters | |
| RU2101720C1 (en) | Method and device for measuring voltage drop across semiconductor in misim structure | |
| SU363053A1 (en) | HALL EFFECT METER |