SU617753A1 - Printed circuit board testing arrangement - Google Patents
Printed circuit board testing arrangementInfo
- Publication number
- SU617753A1 SU617753A1 SU752124043A SU2124043A SU617753A1 SU 617753 A1 SU617753 A1 SU 617753A1 SU 752124043 A SU752124043 A SU 752124043A SU 2124043 A SU2124043 A SU 2124043A SU 617753 A1 SU617753 A1 SU 617753A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- tips
- printed circuit
- potential
- current
- circuit board
- Prior art date
Links
Description
ковый наконечник 7 первого щупа - переход 12, сопротивлени перехода 12, переходного сопротивлени переход 12 - контактна площадка 11, сопротивлени печатного проводника 10, переходного сопротивлени втора контактна площадка И- второй переход 12, сопротивлени второго перехода 12, переходного сопротивлени второй переход 12 -токовый наконечник 7 второго щупа. Падение напр жени в цепи снимаетс потенциальными наконечниками 8 щупов с площадок металлизированных переходов 12 и поступает на вход усилител 3, а после усилени - на вход элемента сравнени 4, где сравниваетс с заданным значением. При срабатывании элемента сравнени на его входе по вл етс сигнал, включающий блок индикации 5.The first tip 7 of the probe is junction 12, junction resistance 12, junction resistance junction 12 — contact pad 11, resistance of the printed conductor 10, second junction resistance, contact junction II, second junction 12, second junction resistance 12, second junction second transition 12-current tip 7 of the second probe. The voltage drop in the circuit is removed by potential tips 8 of the probes from the sites of the metallized transitions 12 and is fed to the input of the amplifier 3, and after amplification to the input of the element of comparison 4, where it is compared with the specified value. When a comparison element is triggered, a signal appears at its input, including a display unit 5.
Так как входное сопротивление усилител 3 значительно больще сопротивлени измерительной цепи, то весьма незначительное ответвление тока от генератора 2 на вход усилител 3 практически не оказывает вли ни на результаты измерени . Учитыва , что в момент прохождени тока по измерительной цепи металлизированный переход 12, контактирующий с наконечниками щупа 1, подвергаютс вибрации с частотой, равной частоте напр жени , питающего вибраторы (вследствие жесткого соединени наконечников с вибратором), при некачественном соединении металлизированного перехода 12 с контактной площадкой 11, сопротивление указанного контактного перехода будет измен тьс , что скажетс на результатах измерени . Таким образом, некачественное соединение будет вы влено.Since the input impedance of amplifier 3 is significantly greater than the resistance of the measuring circuit, the very small current branch from generator 2 to the input of amplifier 3 has almost no effect on the measurement results. Considering that at the moment current passes through the measuring circuit, the metallized junction 12 in contact with the tips of the probe 1 is subjected to vibration with a frequency equal to the frequency of the voltage supplying the vibrators (due to the rigid connection of the tips with the vibrator), with a poor-quality connection of the metallized junction 12 with the contact pad 11, the resistance of said contact junction will vary, which will affect the measurement results. Thus, a poor-quality compound will be identified.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU752124043A SU617753A1 (en) | 1975-04-14 | 1975-04-14 | Printed circuit board testing arrangement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU752124043A SU617753A1 (en) | 1975-04-14 | 1975-04-14 | Printed circuit board testing arrangement |
Publications (1)
Publication Number | Publication Date |
---|---|
SU617753A1 true SU617753A1 (en) | 1978-07-30 |
Family
ID=20616141
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU752124043A SU617753A1 (en) | 1975-04-14 | 1975-04-14 | Printed circuit board testing arrangement |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU617753A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4721903A (en) * | 1985-02-27 | 1988-01-26 | The Boeing Company | Probe and method for electrically contacting surfaces with protective coatings |
WO1988001390A1 (en) * | 1986-08-13 | 1988-02-25 | Villamosenergiaipari Kutató Intézet | Contact resistance measuring device and measuring needle therefor |
EP0475614A2 (en) * | 1990-09-12 | 1992-03-18 | Hewlett-Packard Company | Probe contact with small amplitude vibration for bed of nails testing |
-
1975
- 1975-04-14 SU SU752124043A patent/SU617753A1/en active
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4721903A (en) * | 1985-02-27 | 1988-01-26 | The Boeing Company | Probe and method for electrically contacting surfaces with protective coatings |
WO1988001390A1 (en) * | 1986-08-13 | 1988-02-25 | Villamosenergiaipari Kutató Intézet | Contact resistance measuring device and measuring needle therefor |
EP0475614A2 (en) * | 1990-09-12 | 1992-03-18 | Hewlett-Packard Company | Probe contact with small amplitude vibration for bed of nails testing |
EP0475614A3 (en) * | 1990-09-12 | 1992-08-12 | Hewlett-Packard Company | Improved probe contact through small amplitude vibration for bed of nails testing |
US5311119A (en) * | 1990-09-12 | 1994-05-10 | Hewlett-Packard Company | Probe contact through small amplitude vibration for bed of nails testing |
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