SU617753A1 - Printed circuit board testing arrangement - Google Patents

Printed circuit board testing arrangement

Info

Publication number
SU617753A1
SU617753A1 SU752124043A SU2124043A SU617753A1 SU 617753 A1 SU617753 A1 SU 617753A1 SU 752124043 A SU752124043 A SU 752124043A SU 2124043 A SU2124043 A SU 2124043A SU 617753 A1 SU617753 A1 SU 617753A1
Authority
SU
USSR - Soviet Union
Prior art keywords
tips
printed circuit
potential
current
circuit board
Prior art date
Application number
SU752124043A
Other languages
Russian (ru)
Inventor
Анатолий Григорьевич Андрущенко
Николай Федорович Фомин
Сергей Семенович Мощицкий
Евгений Васильевич Журавель
Анатолий Александрович Бойко
Original Assignee
Предприятие П/Я М-5156
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Предприятие П/Я М-5156 filed Critical Предприятие П/Я М-5156
Priority to SU752124043A priority Critical patent/SU617753A1/en
Application granted granted Critical
Publication of SU617753A1 publication Critical patent/SU617753A1/en

Links

Description

ковый наконечник 7 первого щупа - переход 12, сопротивлени  перехода 12, переходного сопротивлени  переход 12 - контактна  площадка 11, сопротивлени  печатного проводника 10, переходного сопротивлени  втора  контактна  площадка И- второй переход 12, сопротивлени  второго перехода 12, переходного сопротивлени  второй переход 12 -токовый наконечник 7 второго щупа. Падение напр жени  в цепи снимаетс  потенциальными наконечниками 8 щупов с площадок металлизированных переходов 12 и поступает на вход усилител  3, а после усилени  - на вход элемента сравнени  4, где сравниваетс  с заданным значением. При срабатывании элемента сравнени  на его входе по вл етс  сигнал, включающий блок индикации 5.The first tip 7 of the probe is junction 12, junction resistance 12, junction resistance junction 12 — contact pad 11, resistance of the printed conductor 10, second junction resistance, contact junction II, second junction 12, second junction resistance 12, second junction second transition 12-current tip 7 of the second probe. The voltage drop in the circuit is removed by potential tips 8 of the probes from the sites of the metallized transitions 12 and is fed to the input of the amplifier 3, and after amplification to the input of the element of comparison 4, where it is compared with the specified value. When a comparison element is triggered, a signal appears at its input, including a display unit 5.

Так как входное сопротивление усилител  3 значительно больще сопротивлени  измерительной цепи, то весьма незначительное ответвление тока от генератора 2 на вход усилител  3 практически не оказывает вли ни  на результаты измерени . Учитыва , что в момент прохождени  тока по измерительной цепи металлизированный переход 12, контактирующий с наконечниками щупа 1, подвергаютс  вибрации с частотой, равной частоте напр жени , питающего вибраторы (вследствие жесткого соединени  наконечников с вибратором), при некачественном соединении металлизированного перехода 12 с контактной площадкой 11, сопротивление указанного контактного перехода будет измен тьс , что скажетс  на результатах измерени . Таким образом, некачественное соединение будет вы влено.Since the input impedance of amplifier 3 is significantly greater than the resistance of the measuring circuit, the very small current branch from generator 2 to the input of amplifier 3 has almost no effect on the measurement results. Considering that at the moment current passes through the measuring circuit, the metallized junction 12 in contact with the tips of the probe 1 is subjected to vibration with a frequency equal to the frequency of the voltage supplying the vibrators (due to the rigid connection of the tips with the vibrator), with a poor-quality connection of the metallized junction 12 with the contact pad 11, the resistance of said contact junction will vary, which will affect the measurement results. Thus, a poor-quality compound will be identified.

Claims (2)

1.Устройство дл  проверки печатных плат, содержащее токовые и потенциальные наконечники, генератор переменного тока и последовательно соединенные усилитель, элемент сравнени  и блок индикации, отличающеес  тем, что, с целью повыщени  надежности вы влени  некачественных соединений и сокращени  времени проверки , в него введены вибраторы, с каждым из которых жестко соединена пара наконечников- токовый и потенциальный, при этом токовые наконечники подключены к выходу генератора переменного тока, а потенциальные- к входу усилител .1. A device for testing printed circuit boards containing current and potential tips, an alternator and a series-connected amplifier, comparison element and display unit, characterized in that vibrators are inserted into it to increase the reliability of detection of poor connections and shorten the test time. , with each of which a pair of lugs, current and potential, are rigidly connected, while the current tips are connected to the output of the alternator, and the potential tips to the input of the amplifier. 2.Устройство по п. 1, от л и ч а ющеес  тем, что кажда  пара наконечников с соответствующим вибратором выполнены в виде отдельного щупа.2. The device according to claim 1, of the following, in that each pair of tips with a corresponding vibrator are made as a separate probe. Источники ийформации, Прин тые во внимание при экспертивеSources of information Taken into consideration with expert 1.Техническое описание прибор Р336, ЗИП, Краснодар, 1970.1. Technical description of the device P336, spare parts, Krasnodar, 1970. 2.Патент ФРГ № 1953785, кл. G 01R 31/02, 1973.2. The patent of Germany No. 1953785, cl. G 01R 31/02, 1973.
SU752124043A 1975-04-14 1975-04-14 Printed circuit board testing arrangement SU617753A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU752124043A SU617753A1 (en) 1975-04-14 1975-04-14 Printed circuit board testing arrangement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU752124043A SU617753A1 (en) 1975-04-14 1975-04-14 Printed circuit board testing arrangement

Publications (1)

Publication Number Publication Date
SU617753A1 true SU617753A1 (en) 1978-07-30

Family

ID=20616141

Family Applications (1)

Application Number Title Priority Date Filing Date
SU752124043A SU617753A1 (en) 1975-04-14 1975-04-14 Printed circuit board testing arrangement

Country Status (1)

Country Link
SU (1) SU617753A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4721903A (en) * 1985-02-27 1988-01-26 The Boeing Company Probe and method for electrically contacting surfaces with protective coatings
WO1988001390A1 (en) * 1986-08-13 1988-02-25 Villamosenergiaipari Kutató Intézet Contact resistance measuring device and measuring needle therefor
EP0475614A2 (en) * 1990-09-12 1992-03-18 Hewlett-Packard Company Probe contact with small amplitude vibration for bed of nails testing

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4721903A (en) * 1985-02-27 1988-01-26 The Boeing Company Probe and method for electrically contacting surfaces with protective coatings
WO1988001390A1 (en) * 1986-08-13 1988-02-25 Villamosenergiaipari Kutató Intézet Contact resistance measuring device and measuring needle therefor
EP0475614A2 (en) * 1990-09-12 1992-03-18 Hewlett-Packard Company Probe contact with small amplitude vibration for bed of nails testing
EP0475614A3 (en) * 1990-09-12 1992-08-12 Hewlett-Packard Company Improved probe contact through small amplitude vibration for bed of nails testing
US5311119A (en) * 1990-09-12 1994-05-10 Hewlett-Packard Company Probe contact through small amplitude vibration for bed of nails testing

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