SU530486A1 - The method of dimensional etching of copper - Google Patents

The method of dimensional etching of copper

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Publication number
SU530486A1
SU530486A1 SU1986974A SU1986974A SU530486A1 SU 530486 A1 SU530486 A1 SU 530486A1 SU 1986974 A SU1986974 A SU 1986974A SU 1986974 A SU1986974 A SU 1986974A SU 530486 A1 SU530486 A1 SU 530486A1
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SU
USSR - Soviet Union
Prior art keywords
copper
aqueous solution
dimensional etching
potassium iodide
etching
Prior art date
Application number
SU1986974A
Other languages
Russian (ru)
Inventor
Людмила Ивановна Максимова
Юрий Иванович Федоров
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Предприятие П/Я В-2194
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Publication date
Application filed by Предприятие П/Я В-2194 filed Critical Предприятие П/Я В-2194
Priority to SU1986974A priority Critical patent/SU530486A1/en
Application granted granted Critical
Publication of SU530486A1 publication Critical patent/SU530486A1/en

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Description

(54) СПОСОБ РАЗМЕРНОГО ТРАВЛЕНИЯ МЕДИ(54) METHOD OF DIMENSIONAL POISONING OF COPPER

отношение), после чего йодистую медь удал ют 10%-ным раствором аммиака в виде растворимого иодно-аммиачного комплекса ECu(NHj)lD , не затрагива  меди, наход щейс  под слоем (Ьоторезиста,ratio), after which copper iodide is removed with a 10% ammonia solution in the form of a soluble ammonium iodine complex ECu (NHj) lD, without affecting the copper, which is under the layer (

Такое решение поставленной задачи позвол ет получить отклонение размеров элементов (линий, диаметров отверстий и т.д.) на меди, полученных после травлени , не более, чем на 1 мкм на сторону по сравнению с размером, заданным на фотошаблоне.Such a solution of the problem posed allows one to obtain a deviation in the size of elements (lines, hole diameters, etc.) on copper, obtained after etching, by no more than 1 µm per side compared to the size specified on the photomask.

Пример. Подложка из полупроводника или изолирующего материала (ситалла, поликора) или другого материала, обработан .на  по 13-14 классам чистоты ГОСТа последовательно обезжириваетс  в растворител х типа четыреххлористого углерода, толуола , спирта, после чего покрываетс  слоем стандартного фоторезиста на центрифуге толщиной 0,6-0,7 мкм, экспонируетс  и про  вл етс  в 0,5 н. растворе КОН, сушитс  при 85°С в течение 20 мин, задубливаетс  при 125°С в течение 30 мин, после чего погружаетс  в состав на основе З КЗ-Н О 1:4:20 (весовое соотношение). Образующийс  в открытых участках белый налет йодистой меди удал етс  затем в 10%-ном растворе аммиака. При этом образуетс  иодноаммичный комплекс.Example. The substrate of semiconductor or insulating material (sitall, policor) or other material is processed in 13-14 grades of GOST cleanliness and subsequently degreased in solvents such as carbon tetrachloride, toluene, alcohol, and then coated with a layer of standard 0.6 thick. -0.7 µm, exhibited and developed in 0.5N. the KOH solution, dried at 85 ° C for 20 minutes, hardened at 125 ° C for 30 minutes, after which it is immersed in a composition based on 3 KZ-H O 1: 4: 20 (weight ratio). The white bloom of copper iodide formed in the open areas is then removed in a 10% ammonia solution. In this case, the one-ammus complex is formed.

При травлении меди дл  получени  линий с исходными размером 6 и 5О мкм получают размеры 4,О; 4,1; 4,3; 1,4:, 25 ... иBy etching copper, to obtain lines with an initial size of 6 and 5 µm, sizes 4, O are obtained; 4.1; 4.3; 1.4: 25 ... and

48,3; 48,15; 48,2;. 48,0; 48,2 ... мкм соответственно .48.3; 48.15; 48.2; 48.0; 48.2 ... μm, respectively.

При использовании обычных травителей дл  меди эти участки оказались полностью стравленными.When using conventional etchants for copper, these areas turned out to be completely etched.

С использованием обычных травителей, например, на основе хлорного железа, получают размеры 36,7; 38,2; 37,7; 37,0... мкм.Using conventional etchants, for example, based on ferric chloride, sizes of 36.7 are obtained; 38.2; 37.7; 37.0 ... μm.

))

Claims (2)

Формула изобретени Invention Formula Способ размерного травлени  меди, например при изготовлении пленочных схем, в водном растворе галоидсодержащих веществ отличающийс  тем, что с целью повышени  точности воспроизведени  рисунка, например пленочных схем, используют водный раствор йодистого кали  и иода при следуюшем соотношении компонентов (в вес.ч.):A method of dimensional etching of copper, for example, in the manufacture of film circuits in an aqueous solution of halide-containing substances, characterized in that in order to improve the reproduction accuracy of a pattern, for example film circuits, an aqueous solution of potassium iodide and iodine is used with the following ratio of components (parts): Иод0,9-1,1Iod0.9-1.1 Йодистый калий 3,5-4,5Potassium iodide 3.5-4.5 Вода19-21,Water19-21, после которого производ т обработку в 1025%-ном растворе аммиака.after which it is processed in a 1025% ammonia solution. Источники информации, прин тые во внимание при экспертизе:Sources of information taken into account in the examination: l.L.H.Shoppe and Р.Б.&ОРП. 3Tid.I-ng,CheTn,voe 51, p. 293-298, 1953.l.L.H.Shoppe and RB & ODP. 3Tid.I-ng, CheTn, voe 51, p. 293-298, 1953. 2. Аренков А.Б. Печатные и пленочные элементы радиоэлектронной аппаратуры. М., Энерги , 1971., с. 127 (прототип).2. Arenkov A.B. Printed and film elements of electronic equipment. M., Energie, 1971., p. 127 (prototype).
SU1986974A 1974-01-11 1974-01-11 The method of dimensional etching of copper SU530486A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
SU1986974A SU530486A1 (en) 1974-01-11 1974-01-11 The method of dimensional etching of copper

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SU530486A1 true SU530486A1 (en) 1976-09-30

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4416725A (en) * 1982-12-30 1983-11-22 International Business Machines Corporation Copper texturing process

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4416725A (en) * 1982-12-30 1983-11-22 International Business Machines Corporation Copper texturing process

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