SU397858A1 - SENSOR FOR NONCONTACT MEASUREMENT OF CURRENT CARRIER CONCENTRATION IN SEMICONDUCTORS - Google Patents

SENSOR FOR NONCONTACT MEASUREMENT OF CURRENT CARRIER CONCENTRATION IN SEMICONDUCTORS

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Publication number
SU397858A1
SU397858A1 SU1415384A SU1415384A SU397858A1 SU 397858 A1 SU397858 A1 SU 397858A1 SU 1415384 A SU1415384 A SU 1415384A SU 1415384 A SU1415384 A SU 1415384A SU 397858 A1 SU397858 A1 SU 397858A1
Authority
SU
USSR - Soviet Union
Prior art keywords
sensor
semiconductors
carrier concentration
current carrier
noncontact measurement
Prior art date
Application number
SU1415384A
Other languages
Russian (ru)
Inventor
В. Л. ука Р. А. Б. Толутис Институт физики полупроводников Литовской ССР Ю. К. Пожала
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to SU1415384A priority Critical patent/SU397858A1/en
Application granted granted Critical
Publication of SU397858A1 publication Critical patent/SU397858A1/en

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

1one

Изобретение относитс  к полупроводниковой технике.The invention relates to semiconductor technology.

Известны датчики дл  бесконтактного измерени  концентрации носителей тока в полупроводниках , содержащие две взаимно перпендикул рно расположенные катушки индуктивности , между которыми помещаетс  образец . Одна из катущек (входное устройство) служит дл  возбуждени , а друга  (выходное устройство) индикации размерного резонанса геликоновых волн в исследуемом образце .Sensors are known for contactlessly measuring the concentration of current carriers in semiconductors, containing two mutually perpendicularly located inductors, between which a sample is placed. One of the coils (input device) serves to excite, and the other (output device) indicates the size resonance of the helicon waves in the sample under study.

Недостатком таких датчиков  вл етс  ограниченность нижнего предела из.мер емых концентраций , что обусловлено ограниченностью верхнего частотного диапазона датчика. Частотный диапазон ограничивает длину геликоновой волны IB образце и дл  измерени  малых концентраций носителей тока требуетс  значительное увеличение размеров измер емых образцов. Кроме того, при смене образцов необходимы отключение измерительной аппаратуры, демонтаж, сборка и регулировка датчика.The disadvantage of such sensors is the limitedness of the lower limit of the measured concentrations, due to the limitedness of the upper frequency range of the sensor. The frequency range limits the length of the helicon wave IB of the sample, and a significant increase in the dimensions of the measured samples is required to measure low carrier concentrations. In addition, when changing the sample, it is necessary to disconnect the measuring equipment, dismantle, assemble and adjust the sensor.

Целью изобретени   вл етс  значительное расщирение диапазона измер емых KOHHCiiтраций носител  тока:.The aim of the invention is to significantly extend the range of measured KOHHCii current carrier :.

Эта цель достигаетс  благодар  том}, что датчик содержит две полосковые линии передачи , расположенные взаимно 1перпендикул рно и позвол ющие использо15ать частотны: диапазон от сотен мегагерц до пссколькнх мегагерц . При этом длины геликоновых волн в образце составл ют около миллиметра, что обеспечивает исследование образцов малых размеров, так как в исследуемых образцах больших размерах распределение концентрации носителей тока по объему часто не бывает равномерным, поэтому 1 змеренные величины дают картин} интегральной концентрации.This goal is achieved due to the fact that the sensor contains two strip transmission lines located mutually 1 perpendicular and allowing the use of frequency: the range from hundreds of megahertz to psi-megahertz. In this case, the length of helicon waves in the sample is about a millimeter, which ensures the study of samples of small sizes, since in the studied samples of large sizes the distribution of current carrier concentration by volume is often not uniform, therefore 1 measured values give pictures} of integral concentration.

В случае лш ых исследуемых образцов измеренные значени  более близки к локальной концентрации. Смена образцов в датчике осуществл етс  легко и быстро, благодар  наличию в одной из нолосковых линий сдвигаемой части.In the case of only the samples studied, the measured values are closer to the local concentration. The change of samples in the sensor is easy and fast, due to the presence of a shift part in one of the n-strip lines.

На чертеже схематично показан предложенный датчик.The drawing schematically shows the proposed sensor.

Исследуемый образец 1 помеща1етс  в отверстие в центре металлического корпуса 2. Bcj.xн   посеребренна  полоска - входное устройство 3, к которой присоединен центральный прсвод входного кабел  4, приклеена к диэлектрической пластинке 5. Подвимчн-а  деталь 6 входного устройства, к которой приклеена посеребренна  полоска 7, отодвигаетс  в сторону . Свободный конец полоски 7 с помощью металлической оси 8 подключен к корпусу 2 дл  обеспечени  высокочастотного тока во входном устройстве вблизи исследуемого обThe test sample 1 is placed in the hole in the center of the metal case 2. Bcj.xn silver-plated strip - the input device 3, to which the central cable of the input cable 4 is attached, is glued to the dielectric plate 5. The input part 6 of the input device to which the silver-plated strip is glued 7 is pushed aside. The free end of the strip 7 is connected by a metal axis 8 to the housing 2 to provide a high-frequency current in the input device in the vicinity of the area under study.

SU1415384A 1970-03-18 1970-03-18 SENSOR FOR NONCONTACT MEASUREMENT OF CURRENT CARRIER CONCENTRATION IN SEMICONDUCTORS SU397858A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU1415384A SU397858A1 (en) 1970-03-18 1970-03-18 SENSOR FOR NONCONTACT MEASUREMENT OF CURRENT CARRIER CONCENTRATION IN SEMICONDUCTORS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU1415384A SU397858A1 (en) 1970-03-18 1970-03-18 SENSOR FOR NONCONTACT MEASUREMENT OF CURRENT CARRIER CONCENTRATION IN SEMICONDUCTORS

Publications (1)

Publication Number Publication Date
SU397858A1 true SU397858A1 (en) 1973-09-17

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SU1415384A SU397858A1 (en) 1970-03-18 1970-03-18 SENSOR FOR NONCONTACT MEASUREMENT OF CURRENT CARRIER CONCENTRATION IN SEMICONDUCTORS

Country Status (1)

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SU (1) SU397858A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4220915A (en) * 1978-06-28 1980-09-02 Rca Corporation Resistivity measurement system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4220915A (en) * 1978-06-28 1980-09-02 Rca Corporation Resistivity measurement system

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