SU1469420A1 - Method of investigating development of crack in sample of current conducting material - Google Patents
Method of investigating development of crack in sample of current conducting material Download PDFInfo
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- SU1469420A1 SU1469420A1 SU874295688A SU4295688A SU1469420A1 SU 1469420 A1 SU1469420 A1 SU 1469420A1 SU 874295688 A SU874295688 A SU 874295688A SU 4295688 A SU4295688 A SU 4295688A SU 1469420 A1 SU1469420 A1 SU 1469420A1
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- SU
- USSR - Soviet Union
- Prior art keywords
- crack
- sample
- contacts
- voltage
- change
- Prior art date
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
(21) 4295688/25-28 ,(22) 06.08.87 (46) 30.03.89. Бюл. № 12 (72) Ю.Л.Афанасьев, А.И.Гневко и М.В.Мукомела(21) 4295688 / 25-28, (22) 08/06/87 (46) 03/30/89. Bul № 12 (72) Yu.L.Afanasyev, A.I.Gnevko and M.V.Mukomela
(53)620.178.3:620.192.46 (088.8).(53) 620.178.3: 620.192.46 (088.8).
(56)Авторское свидетельство СССР № 390405, кл. С 01 N 17/00, 1971.(56) USSR Copyright Certificate No. 390405, cl. From 01 N 17/00, 1971.
(54)СПОСОБ ИССЛЕДОВАНИЯ РАЗВИТИЯ ТРЕЩИНЫ В ОБРАЗЦЕ ЭЛЕКТРОПРОВОДЯЩЕГО М4ТЕРИАЛА(54) METHOD FOR STUDYING THE DEVELOPMENT OF CRACKS IN THE SAMPLE OF ELECTRICAL CONDUCTING M4 TERIAL
(57)Изобретение относитс к махани-, ке разрушени , в частности к способам исследовани развити трещин в металлических образцах методом электрического сопротивлени . Цель изобретени - повышение точности путем исключени вли ни на регистрацию момента начата роста трещины и ее развити изменени сопротивлени образца за счет структурных изменений материала, температуры, тензомеха- нического зффекта, раскрыти начальной трещины и др. фактров, не св занных с изменением длины трещины. 1 ил.(57) The invention relates to machined failure, in particular, to methods for studying the development of cracks in metal samples by the method of electrical resistance. The purpose of the invention is to improve accuracy by eliminating the effect on the registration of the moment of crack growth and its development to change the resistance of the sample due to structural changes in the material, temperature, tensomechanical effect, reveal the initial crack and other factors not related to the change in crack length. 1 il.
1one
Изобретение относитс к механичес- КИМ испытани м материалов, в частности к способам исследовани развити трещин в металлических образцах методом электрического сопротивлени .The invention relates to mechanical KIM testing of materials, in particular, to methods for studying the development of cracks in metal samples by the method of electrical resistance.
Цель изобретени - повьшхение .точности путем исключени вли ни на результаты факторов, вызьшающих изменение электрического сопротивлени материала образца, но не св занных с развитием трещины.The purpose of the invention is to improve the accuracy by eliminating the influence on the results of factors that cause a change in the electrical resistance of the material of the sample, but not associated with the development of a crack.
На чертеже приведена схема установки дл реализации предлагаемого способа.The drawing shows the installation diagram for the implementation of the proposed method.
Установка состоит из источника 1 питани , к которому подключаетс образец 2, дифференциального трансформатора 3, регистрирующего прибора 4 и блока 5 компенсации.The installation consists of a power source 1 to which sample 2 is connected, a differential transformer 3, a recording device 4 and a compensation unit 5.
Способ осуществл ют следукицим образом .The method is carried out in the following way.
Предварительно на модельном образце устанавливают зависимость скорости изменени напр жени между контактами от величины раскрыти трещины . На исследуемом образце 2 устанавливают симметрично относительно вершины трещины (в точках а и Ь) два электрических контакта, пропускают через образец электрический ток от источника 1 питани и нагружают образец 2 монотонно возрастающим усилием Р, при этом след т за скоростью изменени напр жени между I конта;ктами а и b . При достиженииPreviously, the dependence of the rate of change in the voltage between the contacts on the magnitude of the crack opening is established on the model sample. Two electrical contacts are installed symmetrically with respect to the crack tip (at points a and b) on test sample 2, electric current is passed through the source from power supply 1 and sample 2 is loaded with a monotonically increasing force P, and Ktami a and b. Upon reaching
скоростью изменени напр жени значени , соответствующего полному раскрытию трещины, останавливают нагру- жение и наход т точку с, расположенную на линии аЬ, из услови равенства величин напр жений И, Ьс Р венства спротивлений участков аЬ и be). Устанавливают в точке с третийthe rate of change of the voltage value corresponding to the complete crack opening stops the loading and finds the point c located on the ab line, under the condition of equality of the values of the stresses I, bc of the resistance of the sections ab and b). Set at point three
теагэteage
электрический контакт, подключают к измерительной схеме, возобновл ют нагружение образца, измер напр жени между контактами- а и b и напр жени между контактами b и с, учи- тьша за счет последнего вли ние на изменение сопротивлени образца факторов, не св занных с изменение длины трещины.electrical contact, connected to the measuring circuit, resume loading the sample, measuring the voltage between the contacts a and b and the voltage between contacts b and c, taking into account, due to the latter, the influence on the change in the resistance of the sample factors not related to the change in crack lengths.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU874295688A SU1469420A1 (en) | 1987-08-06 | 1987-08-06 | Method of investigating development of crack in sample of current conducting material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU874295688A SU1469420A1 (en) | 1987-08-06 | 1987-08-06 | Method of investigating development of crack in sample of current conducting material |
Publications (1)
Publication Number | Publication Date |
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SU1469420A1 true SU1469420A1 (en) | 1989-03-30 |
Family
ID=21323773
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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SU874295688A SU1469420A1 (en) | 1987-08-06 | 1987-08-06 | Method of investigating development of crack in sample of current conducting material |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU1469420A1 (en) |
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1987
- 1987-08-06 SU SU874295688A patent/SU1469420A1/en active
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