SU1401332A1 - Apparatus for sampling gas - Google Patents

Abstract

The invention relates to analytical instrumentation, is used in non-ferrous metallurgy, the chemical industry and other branches of the national economy. The purpose of the invention is to increase the reliability of the device and reduce energy consumption. To do this, in a device that contains coaxially and directly connected a gas sampling chamber with a working end and a filter chamber with a tapering end and a filtering element inside which is located the supply pipe of the analyzed gas with openings, connected through valves with lines of compressed and analyzed gases, as well as open at one end a purge chamber connected through a valve with a line of compressed gas, the purge chamber is made cooled, and the gas-collecting chamber is made with a cross-section equal to the smaller diameter of the horse hydrochloric portion of the filter chamber. In this case, the working end of the gas sampling chamber is located inside the purge chamber. The working end of the gas sampling chamber is installed from the open end of the purge chamber at a distance of 2-4 times its diameter. The filter element is made with elastic catfish covering it around the perimeter. 3 h. item f-ly, 1 ill. $ 9

Description

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I The invention relates to devices | 1, l of gas sampling from various technological and instrumental devices and can be used in non-ferrous metallurgy, the chemical industry and other branches of the national economy.

The aim of the invention is to increase the reliability and speed of the device and reduce energy consumption.

The drawing shows the proposed device for sampling gas.

The device includes a gas sampling chamber 1 with a working end 2, coaxially and directly connected to the chamber of filter 3 and narrowed by its end 4 and containing an orienting element 5 through which pipe 6 is passed, connected by valve 7 by a compressed air line, and by valve 8 - the line of the analyzed gas. The perimeter filter element is covered by elastic catfish 9.

The gas flow rate through the gas sampling device is primarily determined by the state of the open end of the purge chamber, which is overgrown with mechanical particles and dust many times faster than the filter element. Therefore, in order to reduce the length of time in which the sample is distorted due to blowing the device with compressed gas and reducing the working end of the gas sampling chamber, the cleaning of both nodes is advisable

combine in time and supply compressed gas to the cavity of the filter element much less frequently than to the purge chamber. In case of strong adhesion of mechanical particles and dust to the walls of the filter chamber

Coaxially positioned inside the purge chamber 10 connected by valve 11 to the line of the purge gas, the purge chamber is provided with a cooling jacket 12.

The device is in selection mode.

Robes, as well as in the cleaning mode of the open 25 and gas extraction chamber, for example, if there are particles of elemental sulfur in the gas, their inner surface is lined with fluoroplastic in order to increase the service life of the device from cleaning to cleaning.

The application of the proposed device allows reducing power consumption and increasing reliability by reducing the amount of dust passing through its units, due to the reduction in the volume of the gas-collecting chamber, rational placement of the open end of the purge chamber and the choice of its cross-sectional shape to form a high-velocity jet of compressed gas, lower switching frequency and shut off valves.

youths purge chamber and filter element. In the sampling mode, the valves 7 11 are closed, and the valve 8 is open, while the high-temperature dust-gas flow stops through the open end of the water-cooled purge chamber 10 into the gas- (collecting chamber 1 through its working end 2, then into the filter chamber 3 and through the filter - element 5, tube 6, valve 8, gas line 1 to be analyzed into the gas analyzer (not indicated). The filter element is made by using a filter cloth that allows mechanical particles and dust to pass to the gas analyzer. yvayut valve 11 and fed to it from the compressed gas line. Yield 40 annular sectional purge chamber 1 units.The High-speed jet of compressed gas destro- Niaet mechanical adhesion of the particles and dust, and a wall of the chamber and ejects them to the outside.

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Claims (4)

1. A gas sampling device comprising a gas sampling chamber with a working end and a filter chamber with a tapering end and a filter element connected to a tube, which is connected through To clean the filter element, valves with compressed air and ana close the valve 8 and open the valve 7. By this, the compressed gas from the line enters through the tube 6 into the internal cavity of the filter element 5, as a result of which its pressure increases under the action of overpressure. Changing the shape of the filter element leads to the destruction of dust and particles on its surface and in the pores and their removal by a stream of compressed filter into the chamber, from where it is selected through the I-discharge chamber and the purge chamber (It goes out. If necessary, the cleaning of the device 1 can be automated by switching on and off the electromagnetic gas to be clarified, characterized in that, in order to increase the reliability and speed of the device and reduce energy costs, the gas sampling chamber, opposite to its working end, is connected to the narrowing end of the filter chamber. 2. A device according to claim 1, characterized in that it is provided with a purge chamber and a cooling jacket installed coaxially outside the gas sampling chamber. 3. The device according to claim 2, characterized in that the working end of the gas extraction chamber is installed from the open end of the purge chamber at a distance equal to 2-4 of its diameter. 0 five 7, 8, and 11 using a control unit according to a program defined in time or a signal from a pressure sensor, the sensitive element of which is hydraulically connected to the filter chamber. In addition, when analyzing wet gases in order to prevent the filter element from getting wet and deteriorating its properties, the device can be equipped with an electric heating unit for the filter chamber that automatically maintains the temperature of the analyzed gas above the dew point. The gas flow rate through the gas sampling device is primarily determined by the state of the open end of the purge chamber, which is overgrown with mechanical particles and dust many times faster than the filter element. Therefore, in order to reduce the length of time in which the sample is distorted due to purging the device with compressed gas and reducing energy costs, cleaning both nodes is advisable. Invention Formula 1. A gas sampling device comprising a gas sampling chamber with a working end and a filter chamber with a tapering end and a filter element connected to a tube, which is connected through valves with compressed air and test gas, characterized in that, in order to increase the reliability and speed of the device and reduce energy consumption, the gas sampling chamber, opposite its working end, is connected to the narrowing end of the filter chamber. 2. A device according to claim 1, characterized in that it is provided with a purge chamber and a cooling jacket installed coaxially outside the gas sampling chamber. 3. The device according to claim 2, characterized in that the working end of the gas extraction chamber is installed from the open end of the purge chamber at a distance equal to 2-4 of its diameter. 4. Device no. 1, characterized in that the filter chamber is provided with an elastic catfish covering the filter element around the perimeter.