SU1320725A2 - Coordinate defect-marking device - Google Patents

Abstract

The invention relates to methods for non-destructive quality control of products, intended for sorting lengthy products under coordinate control and is an improvement of the invention according to the author. No. 1004862. The purpose of the additional invention is to increase the reliability of the product scrutiny. The flaw detector 12 scans the controlled product and generates Marriage signals to the SP JI

Description

and Repair. In the presence of a rejectable defect, the signal through the waiting multi-wave. The oscillator 8 arrives at the front and rear edges of the pulse separation circuit 9, the one-oscillator 10 generates pulses of a certain duration from this signal, which are fed to the switch 1 of the flaw detectors. The received signal through block 2 re1

The invention relates to rolled-stock inspection (pipes, trousers, etc.) by automated installations, which include a rotary converter flaw detector, can be used in the metallurgical and machine-building industry and is an improvement of the known device according to the main auth., No. 1004862 .

The aim of the invention is to increase the reliability of the product scrutiny by registering two or more repaired defects as a non-bonded defect.

The drawing shows a functional diagram of the device coordinate flaws. .

Coordinate flaw device contains N-channel switch 1 of flawers connected in series, N-channel defect information transfer unit 2 with successively switched sensors 3 and 4 clock pulses, N-channel flaw detector control unit 5 and flaw detectors block 6 (N not shown) located around the perimeter of the product under test (not shown) with an equal distance in the sector between each other (each sector corresponds to a certain angular coordinate from marked defects). To the input Repair defects, switch 1 is connected connected in series

N

(j + 1) -input element OR 7, waiting for multivibrator 8, information extraction circuit 9 enters the unit 6 of defect-meters, marking the defective areas. Upon detection of repaired defects simultaneously in two diametrically opposite zones, the signal through the elements AND 13 enters the input of the element OR 7 and the marking of the defect is carried out in the same way as with the defect Scrap. 1 il.

laziness of the front and rear edges of a pulse, one-shot 10 and a two-hole element OR 11.

The device also contains a defectoscope 12, the Repair output of which is connected to the second input of the two-input element OR 11, and the output to the (N / 2 + 1) input of the element OR 7, and the two-input elements AND 13 in the amount of N / 2 , one input of each of which is connected to i-mu, the other

, - N.

input to the (.1 + y; th output of the switch 1 of flaw detectors, where i

1, 2, ... N / 2, and the outputs of all elements And 13 are connected to the inputs of the element OR 7.

The drawing does not show indications of the passage of signals about defects and

power sources.

The device coordinate flaw works as follows.

Flaw detector 12 signals from the defects being repaired through the decoupling element OR 11 are fed to the input Repair defects of the switch 1 of the flaw detectors, which forms rectangular pulses of them with a duration proportional to

defect distribution, and distributes these pulses over N channels (for N defect-markers) in accordance with the angular coordinate of the detected defects, i.e. produces signals

to the mark of repaired defects by one of the N forming the surface of the product with a continuous (corresponding to the length of the defect) longitudinal mark.

The signals from the N outputs of the switch 1 are transferred by the information transfer unit 2 from the control plane to the plane of the defect emitters synchronously with the movement of the monitored product. The synchronism of the transfer is provided by pulses from the sensors 3 and 4 clock pulses arranged in series along the path of the product and, accordingly, included in the work. The use of two sensors of clock pulses provides tracking and, thus, defect detection of the product along its entire length.

The signals are then amplified in power in the unit 5 of the control of the flaw detectors and are fed to the unit 6 of the defect-testers.

When a rejectable defect is detected, the signals from the output. The marriage of defectoscope 12 is fed to the input of a multivibrating standby 8. In the case of a long defect, these signals are a bundle of n repeating pulses, the interval T between which is equal to the period of rotation of the flaw detector transducer around the item being monitored. The duration of the output pulse of the waiting multivibrator 8 is chosen slightly longer. T. The waiting multivibrator 8 is set to the active state by the first triggering pulse of the packet and returns to the initial state only after the last pulse of the packet. Thus, the waiting multivibrator 8 converts a packet of impulses from a defect into one rectangular pulse, the duration of which is equal to (a little more) n - T and is proportional to (with an accuracy of one t) the length of the defect.

From the output of the waiting multivibrator 8, a rectangular pulse arrives at the front and rear of the front and rear edges of the circuit 9. At the output of circuit 9, two short pulses are formed, corresponding to the leading and falling edges of the input signal, and thus corresponding to the beginning and end of the defect.

The impulses of the beginning and end of the defect are fed to the input of the one-shot 10, which forms a pulse of them with a constant duration T,

T selectable within - - C i T

(N is the number of flaw detectors, -

about Q

Q

e

five

five

the transit time of the flaw detector of one sector of the product between the two defect detectors).

The pulses from the one-shot 10 through the element OR 11 arrive at the input Repairable defects of the switch 1 of the defect-meters, i.e. to the same input of the switch, to which pulses are delivered from the channel Repair of the flaw detector. The element IL 11 separates two channels at the output — the channel The marriage of the converted pulses of the flaw detector and the channel Repair of the flaw detector. .

Let the duration t of the pulse generated by the single vibrator 10 be chosen equal to the period T of rotation of the flaw detector transducer around the test item. The impulse from the beginning of the defect, as well as from its end, converted into a pulse with a duration of Zr T, is fed to the input. Repairable defects of the switch 1 of the defect-meters, i.e. At this input, an impulse appears at the time of a complete revolution of the flaw detector transducer around the product. This is equivalent to the presence of short defects with one step of control in all sectors of the business. Thus, the device of the coordinate flaw mark marks only the beginning and end of the defect, which is the final defect. And each mark represents longitudinal short (equal to one step of control of the product) marks — one mark in each sector (N forming the product) throughout Circulating the surface of the product.

With a duration C of the pulse of the one-shot 10, equal to the transit time of the transducer of the flaw detector by several sectors, for example, three (C 3--), the device

marks the beginning and end of the defect Brac with the same longitudinal short marks, however, not for each sector, but only for three adjacent sectors. In order to mark rejected defects with short marks on only a few (selected for a specific case of conducting1 defects) adjacent sectors, the one-oscillator 10 has an adjustment of the duration

output pulses in the range of several

 you are repairing defects at the same time in any two diametrically opposite sectors

pax - i-M and (i

+ -) - ohm of the controlled product, the device of coordinate flaws produces a mark, for example, i-ro and

/. N.

(1 + -y) -th surface sectors

a controlled article with a continuous label over each defect. In addition, pulses with N

1st and 1 +

-th outputs of the switch 1 of the flawers. They enter the inputs of the corresponding element I 13 and, as coinciding in time, create a rectangular impulse at the output of the element I 13. This pulse through the element OR 7 transfers to the input of the standby multivibrator 8 and acts on it like a pulse from the output of the Marriage of the flaw detector 12, as a result of which the device causes

Editor N.Slobod nickname

Compiled by Yu.Glazkov

Tehred N.Glushchenko Proofreader L.Pilipenko

Order 2653/47 Circulation 776 Subscription

VNIIPI USSR State Committee

for inventions and discoveries 113035, Moscow, Zh-35, Raushsk nab., d. A / 5

Production-polyg-raficheskoe enterprise, Uzhgorod, st. Project, 4

on the test surface, one short mark in each sector of the product or in several adjacent sectors (depending on the selected pulse length of the one-shot 10).

five

0

five

Form Uda Invention

Coordinate flaw device on auth.St. No. 1004862, which is related to the fact that, in order to increase the reliability of product scrutiny, it is equipped with N / 2 two-input elements AND, where N is the number of switched defect-testers, and N / 2 + 1 input element OR, the output of which is connected to to the waiting multivibrator, the first input of each i-ro two-input element AND is connected to the i-th output of the switch of the defectometeers, the second input is connected to the (i + N / 2) output of the switch of the defectomasters, the output of each two-input element AND is connected to the corresponding input of the OR element, and (N / 2 + 1) input element OR prev Classifi- cation for connection to the output Marriage flaw.

Claims (1)

Claim Coordinate flaw detection device according to ed. No. 1004862, characterized in that, in order to increase the reliability of product sorting, it is equipped with N / 2 two-input I elements, where N is the number of switched flaw detectors, and an N / 2 + 1-input OR element, the output of which is connected to the waiting multivibrator, the first input each i-ro of the two-input element And is connected to the i-th output of the flaw detector switch, the second input is to the (i + N / 2) -output of the switch of flaw detectors, the output of each two-input element And is connected to the corresponding input of the OR element, a (N / 2 + 1) - the input of the element OR is intended to connect to the output of the marriage flaw detector.