SG85686A1 - Ion beam implantation using conical magnetic scanning - Google Patents
Ion beam implantation using conical magnetic scanningInfo
- Publication number
- SG85686A1 SG85686A1 SG9906367A SG1999006367A SG85686A1 SG 85686 A1 SG85686 A1 SG 85686A1 SG 9906367 A SG9906367 A SG 9906367A SG 1999006367 A SG1999006367 A SG 1999006367A SG 85686 A1 SG85686 A1 SG 85686A1
- Authority
- SG
- Singapore
- Prior art keywords
- ion beam
- magnetic scanning
- beam implantation
- conical magnetic
- conical
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1472—Deflecting along given lines
- H01J37/1474—Scanning means
- H01J37/1475—Scanning means magnetic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/219,669 US6207963B1 (en) | 1998-12-23 | 1998-12-23 | Ion beam implantation using conical magnetic scanning |
Publications (1)
Publication Number | Publication Date |
---|---|
SG85686A1 true SG85686A1 (en) | 2002-01-15 |
Family
ID=22820235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG9906367A SG85686A1 (en) | 1998-12-23 | 1999-12-14 | Ion beam implantation using conical magnetic scanning |
Country Status (6)
Country | Link |
---|---|
US (1) | US6207963B1 (ko) |
EP (1) | EP1024519A3 (ko) |
JP (1) | JP2000204470A (ko) |
KR (1) | KR100479374B1 (ko) |
SG (1) | SG85686A1 (ko) |
TW (1) | TW445490B (ko) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6885014B2 (en) * | 2002-05-01 | 2005-04-26 | Axcelis Technologies, Inc. | Symmetric beamline and methods for generating a mass-analyzed ribbon ion beam |
US6703628B2 (en) | 2000-07-25 | 2004-03-09 | Axceliss Technologies, Inc | Method and system for ion beam containment in an ion beam guide |
JP4252237B2 (ja) * | 2000-12-06 | 2009-04-08 | 株式会社アルバック | イオン注入装置およびイオン注入方法 |
JP3531628B2 (ja) * | 2001-07-13 | 2004-05-31 | ソニー株式会社 | 磁気記憶装置の製造方法 |
JP3713683B2 (ja) * | 2002-03-05 | 2005-11-09 | 住友イートンノバ株式会社 | イオンビームの質量分離フィルタとその質量分離方法及びこれを使用するイオン源 |
US6918351B2 (en) * | 2002-04-26 | 2005-07-19 | Advanced Ion Beam Technology, Inc. | Apparatus for ion beam implantation |
US6664547B2 (en) | 2002-05-01 | 2003-12-16 | Axcelis Technologies, Inc. | Ion source providing ribbon beam with controllable density profile |
US6664548B2 (en) | 2002-05-01 | 2003-12-16 | Axcelis Technologies, Inc. | Ion source and coaxial inductive coupler for ion implantation system |
US6891174B2 (en) * | 2003-07-31 | 2005-05-10 | Axcelis Technologies, Inc. | Method and system for ion beam containment using photoelectrons in an ion beam guide |
US20050061997A1 (en) * | 2003-09-24 | 2005-03-24 | Benveniste Victor M. | Ion beam slit extraction with mass separation |
US6903350B1 (en) | 2004-06-10 | 2005-06-07 | Axcelis Technologies, Inc. | Ion beam scanning systems and methods for improved ion implantation uniformity |
US7019314B1 (en) * | 2004-10-18 | 2006-03-28 | Axcelis Technologies, Inc. | Systems and methods for ion beam focusing |
US8164070B2 (en) * | 2008-12-05 | 2012-04-24 | Nissin Ion Equipment Co., Ltd. | Collimator magnet for ion implantation system |
MY171019A (en) * | 2009-04-13 | 2019-09-23 | Applied Materials Inc | Modification of magnetic properties of films using ion and neutral beam implantation |
US8138484B2 (en) | 2010-04-28 | 2012-03-20 | Axcelis Technologies Inc. | Magnetic scanning system with improved efficiency |
US8993980B1 (en) | 2013-10-22 | 2015-03-31 | Varian Semiconductor Equipment Associates, Inc. | Dual stage scanner for ion beam control |
US9029811B1 (en) * | 2013-10-22 | 2015-05-12 | Varian Semiconductor Equipment Associates, Inc. | Apparatus to control an ion beam |
TW201603104A (zh) * | 2014-03-13 | 2016-01-16 | Gtat公司 | 用於離子佈植機之磁性掃描系統 |
CN104979156B (zh) * | 2015-07-14 | 2017-03-01 | 东莞帕萨电子装备有限公司 | 束流调节装置 |
CN207458887U (zh) * | 2017-06-16 | 2018-06-05 | 上海凯世通半导体股份有限公司 | 离子注入设备 |
CN110718434B (zh) * | 2018-07-11 | 2022-04-29 | 北京中科信电子装备有限公司 | 一种多线圈电流控制的均匀性调节方法 |
CN113466921B (zh) * | 2021-07-01 | 2023-07-28 | 兰州空间技术物理研究所 | 一种适用于电推力器羽流诊断的静电场离子能量分析仪 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4804852A (en) * | 1987-01-29 | 1989-02-14 | Eaton Corporation | Treating work pieces with electro-magnetically scanned ion beams |
US5373164A (en) * | 1992-07-16 | 1994-12-13 | Eaton Corporation | Ion beam conical scanning system |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5311028A (en) * | 1990-08-29 | 1994-05-10 | Nissin Electric Co., Ltd. | System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions |
US5132544A (en) * | 1990-08-29 | 1992-07-21 | Nissin Electric Company Ltd. | System for irradiating a surface with atomic and molecular ions using two dimensional magnetic scanning |
US5481116A (en) * | 1994-06-10 | 1996-01-02 | Ibis Technology Corporation | Magnetic system and method for uniformly scanning heavy ion beams |
US5438203A (en) * | 1994-06-10 | 1995-08-01 | Nissin Electric Company | System and method for unipolar magnetic scanning of heavy ion beams |
US5554853A (en) * | 1995-03-10 | 1996-09-10 | Krytek Corporation | Producing ion beams suitable for ion implantation and improved ion implantation apparatus and techniques |
US5554857A (en) | 1995-10-19 | 1996-09-10 | Eaton Corporation | Method and apparatus for ion beam formation in an ion implanter |
-
1998
- 1998-12-23 US US09/219,669 patent/US6207963B1/en not_active Expired - Lifetime
-
1999
- 1999-12-02 TW TW088121045A patent/TW445490B/zh not_active IP Right Cessation
- 1999-12-13 EP EP99310005A patent/EP1024519A3/en not_active Ceased
- 1999-12-14 SG SG9906367A patent/SG85686A1/en unknown
- 1999-12-20 JP JP11360948A patent/JP2000204470A/ja active Pending
- 1999-12-20 KR KR10-1999-0059278A patent/KR100479374B1/ko not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4804852A (en) * | 1987-01-29 | 1989-02-14 | Eaton Corporation | Treating work pieces with electro-magnetically scanned ion beams |
US5373164A (en) * | 1992-07-16 | 1994-12-13 | Eaton Corporation | Ion beam conical scanning system |
Also Published As
Publication number | Publication date |
---|---|
KR20000048255A (ko) | 2000-07-25 |
EP1024519A2 (en) | 2000-08-02 |
TW445490B (en) | 2001-07-11 |
US6207963B1 (en) | 2001-03-27 |
JP2000204470A (ja) | 2000-07-25 |
KR100479374B1 (ko) | 2005-03-28 |
EP1024519A3 (en) | 2001-04-18 |
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