SG61193G - Testing in the manufacture,operation,and maintenance of optical device assemblies - Google Patents

Testing in the manufacture,operation,and maintenance of optical device assemblies

Info

Publication number
SG61193G
SG61193G SG611/93A SG61193A SG61193G SG 61193 G SG61193 G SG 61193G SG 611/93 A SG611/93 A SG 611/93A SG 61193 A SG61193 A SG 61193A SG 61193 G SG61193 G SG 61193G
Authority
SG
Singapore
Prior art keywords
testing
maintenance
manufacture
optical device
device assemblies
Prior art date
Application number
SG611/93A
Other languages
English (en)
Original Assignee
American Telephone & Telegraph
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone & Telegraph filed Critical American Telephone & Telegraph
Publication of SG61193G publication Critical patent/SG61193G/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/36—Mechanical coupling means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/35—Testing of optical devices, constituted by fibre optics or optical waveguides in which light is transversely coupled into or out of the fibre or waveguide, e.g. using integrating spheres
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optical Integrated Circuits (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Communication System (AREA)
  • Optical Couplings Of Light Guides (AREA)
SG611/93A 1988-03-03 1993-05-07 Testing in the manufacture,operation,and maintenance of optical device assemblies SG61193G (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/163,903 US4828358A (en) 1988-03-03 1988-03-03 Testing in the manufacture, operation, and maintenance of optical device assemblies

Publications (1)

Publication Number Publication Date
SG61193G true SG61193G (en) 1993-07-09

Family

ID=22592099

Family Applications (1)

Application Number Title Priority Date Filing Date
SG611/93A SG61193G (en) 1988-03-03 1993-05-07 Testing in the manufacture,operation,and maintenance of optical device assemblies

Country Status (7)

Country Link
US (1) US4828358A (ja)
EP (1) EP0331337B1 (ja)
JP (1) JP2674823B2 (ja)
KR (1) KR910005952B1 (ja)
CA (1) CA1293772C (ja)
DE (1) DE68903012T2 (ja)
SG (1) SG61193G (ja)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4966433A (en) * 1988-03-03 1990-10-30 At&T Bell Laboratories Device including a component in alignment with a substrate-supported waveguide
DE4142340A1 (de) * 1991-12-20 1993-06-24 Siemens Ag Optoelektronischer ic
US5379359A (en) * 1992-09-29 1995-01-03 Eastman Kodak Company Laser diode coupling to waveguide and method of making same using substrate etching
US5329392A (en) * 1993-03-19 1994-07-12 At&T Bell Laboratories Optical communication system with multiple fiber monitoring
GB2376755A (en) * 2001-06-23 2002-12-24 Bookham Technology Plc Integrated optical device
US6856735B2 (en) * 2001-11-06 2005-02-15 Chromux Technologies, Inc. Tap couplers for fiber optic arrays
US6945708B2 (en) * 2003-02-18 2005-09-20 Jds Uniphase Corporation Planar lightwave circuit package
JP5475104B2 (ja) * 2009-04-01 2014-04-16 オクラロ テクノロジー リミテッド 犠牲導波管試験構造
WO2011007227A1 (en) * 2009-07-13 2011-01-20 Oclaro Technology Limited Integrated photodiode wavelength monitor
US8503848B2 (en) * 2011-01-27 2013-08-06 Hewlett-Packard Development Company, L.P. Waveguide arrays
US10230458B2 (en) 2013-06-10 2019-03-12 Nxp Usa, Inc. Optical die test interface with separate voltages for adjacent electrodes
US9766409B2 (en) 2013-06-10 2017-09-19 Nxp Usa, Inc. Optical redundancy
US9091820B2 (en) 2013-06-10 2015-07-28 Freescale Semiconductor, Inc. Communication system die stack
US9810843B2 (en) 2013-06-10 2017-11-07 Nxp Usa, Inc. Optical backplane mirror
US9094135B2 (en) 2013-06-10 2015-07-28 Freescale Semiconductor, Inc. Die stack with optical TSVs
US9442254B2 (en) 2013-06-10 2016-09-13 Freescale Semiconductor, Inc. Method and apparatus for beam control with optical MEMS beam waveguide
US9261556B2 (en) * 2013-06-10 2016-02-16 Freescale Semiconductor, Inc. Optical wafer and die probe testing
US9435952B2 (en) 2013-06-10 2016-09-06 Freescale Semiconductor, Inc. Integration of a MEMS beam with optical waveguide and deflection in two dimensions
US10012798B2 (en) * 2016-06-30 2018-07-03 International Business Machines Corporation Sacrificial coupler for testing V-grooved integrated circuits

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3584230A (en) * 1969-01-24 1971-06-08 Bell Telephone Labor Inc Light wave coupling into thin films
JPS5224546A (en) * 1975-08-20 1977-02-24 Fujitsu Ltd Monitor device for optical fibers
JPS5643529A (en) * 1979-09-18 1981-04-22 Nec Corp Measuring method of minute refractive index difference between optical waveguide line and its substrate
JPS5769228A (en) * 1980-10-18 1982-04-27 Fuji Electric Co Ltd Deterioration detection system for optical transmitting circuit
JPS6016125U (ja) * 1983-07-12 1985-02-02 日本電気株式会社 光電変換器付光スイツチ
JPS60257431A (ja) * 1984-06-01 1985-12-19 Matsushita Electric Ind Co Ltd 光回路デバイス
JPS61133911A (ja) * 1984-12-03 1986-06-21 Nippon Telegr & Teleph Corp <Ntt> 受発光素子と光導波路との結合方法
JPS61121014A (ja) * 1984-11-16 1986-06-09 Nec Corp 光・電気混成集積回路
ATE76981T1 (de) * 1985-01-07 1992-06-15 Siemens Ag Verfahren zur herstellung einer integriert optischen anordnung.
JPH0736050B2 (ja) * 1985-04-01 1995-04-19 株式会社日立製作所 半導体発光素子と光導波路の結合方式
JPS62187304A (ja) * 1986-02-13 1987-08-15 Matsushita Electric Ind Co Ltd 方向性光結合部品

Also Published As

Publication number Publication date
EP0331337B1 (en) 1992-09-30
DE68903012T2 (de) 1993-02-18
JPH0210242A (ja) 1990-01-16
KR910005952B1 (ko) 1991-08-09
JP2674823B2 (ja) 1997-11-12
US4828358A (en) 1989-05-09
EP0331337A3 (en) 1990-01-24
KR890015042A (ko) 1989-10-28
CA1293772C (en) 1991-12-31
DE68903012D1 (de) 1992-11-05
EP0331337A2 (en) 1989-09-06

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