SG49940A1 - Image processing device and method thereof - Google Patents

Image processing device and method thereof

Info

Publication number
SG49940A1
SG49940A1 SG1996009596A SG1996009596A SG49940A1 SG 49940 A1 SG49940 A1 SG 49940A1 SG 1996009596 A SG1996009596 A SG 1996009596A SG 1996009596 A SG1996009596 A SG 1996009596A SG 49940 A1 SG49940 A1 SG 49940A1
Authority
SG
Singapore
Prior art keywords
image processing
processing device
image
processing
Prior art date
Application number
SG1996009596A
Other languages
English (en)
Inventor
Hideshi Ishihara
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Publication of SG49940A1 publication Critical patent/SG49940A1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/13—Edge detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/155—Segmentation; Edge detection involving morphological operators
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Studio Circuits (AREA)
SG1996009596A 1991-09-27 1992-09-28 Image processing device and method thereof SG49940A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27671491A JP3265595B2 (ja) 1991-09-27 1991-09-27 画像処理方法およびその装置

Publications (1)

Publication Number Publication Date
SG49940A1 true SG49940A1 (en) 1998-06-15

Family

ID=17573309

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996009596A SG49940A1 (en) 1991-09-27 1992-09-28 Image processing device and method thereof

Country Status (5)

Country Link
US (1) US5485532A (de)
EP (1) EP0534485B1 (de)
JP (1) JP3265595B2 (de)
DE (1) DE69226917T2 (de)
SG (1) SG49940A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5680485A (en) * 1994-12-19 1997-10-21 Xerox Corporation Method and apparatus employing erosion-based filter pairs for image mapping
US5850468A (en) * 1995-04-11 1998-12-15 Matsushita Electric Industrial Co., Ltd. Flaw detection apparatus
US6038335A (en) * 1995-06-05 2000-03-14 Matsushita Electric Industrial Co. Ltd. Flaw detection apparatus using digital image data indicative of a surface of an object
US6427024B1 (en) * 1999-04-02 2002-07-30 Beltronics, Inc. Apparatus for and method of automatic optical inspection of electronic circuit boards, wafers and the like for defects, using skeletal reference inspection and separately programmable alignment tolerance and detection parameters
US6512849B1 (en) * 2000-05-22 2003-01-28 International Business Machines Corporation Finding objects in an image
AU2002315418A1 (en) * 2002-06-21 2004-01-06 Beltronics, Inc. Optical inspection of electronic circuit boards, wafers and the like, using skeletal reference images and separately programmable alignment tolerance and detection parameters
US6993187B2 (en) * 2003-02-14 2006-01-31 Ikonisys, Inc. Method and system for object recognition using fractal maps
US7062079B2 (en) * 2003-02-14 2006-06-13 Ikonisys, Inc. Method and system for image segmentation
JP4518835B2 (ja) * 2004-05-13 2010-08-04 大日本スクリーン製造株式会社 欠陥検出装置、配線領域抽出装置、欠陥検出方法および配線領域抽出方法
GB2421676B (en) * 2004-12-30 2010-03-24 Fmc Technologies Portioning apparatus and method
CN102202142B (zh) * 2010-03-26 2014-04-30 鸿富锦精密工业（深圳）有限公司 毛刺检测装置及毛刺检测方法
JP5430492B2 (ja) * 2010-05-18 2014-02-26 日本電信電話株式会社 画像処理装置、画像処理方法、プログラムおよび記録媒体
US9846929B2 (en) * 2016-03-24 2017-12-19 Hong Kong Applied Science and Technology Research Institute Company Limited Fast density estimation method for defect inspection application

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3070433D1 (en) * 1980-12-18 1985-05-09 Ibm Method for the inspection and automatic sorting of objects with configurations of fixed dimensional tolerances, and device for carrying out the method
DE3070721D1 (en) * 1980-12-18 1985-07-04 Ibm Process for inspecting and automatically classifying objects presenting configurations with dimensional tolerances and variable rejecting criteria depending on placement, apparatus and circuits therefor
GB2129546B (en) * 1982-11-02 1985-09-25 Cambridge Instr Ltd Image comparison
GB2129547B (en) * 1982-11-02 1986-05-21 Cambridge Instr Ltd Reticle inspection
US4665551A (en) * 1983-12-08 1987-05-12 Machine Vision International Corporation Apparatus and method for implementing transformations in digital image processing
US4648053A (en) * 1984-10-30 1987-03-03 Kollmorgen Technologies, Corp. High speed optical inspection system
US4644585A (en) * 1985-02-11 1987-02-17 Environmental Research Institute Of Michigan Method and apparatus for automatic shape recognition
US4821333A (en) * 1986-08-22 1989-04-11 Environmental Research Inst. Of Michigan Machine learning procedures for generating image domain feature detector structuring elements
DE3838032A1 (de) * 1987-11-09 1989-05-24 Hitachi Ltd Verfahren und einrichtung zur strukturpruefung
JPH02108167A (ja) * 1988-10-17 1990-04-20 Hitachi Constr Mach Co Ltd 光学検査装置

Also Published As

Publication number Publication date
EP0534485B1 (de) 1998-09-09
US5485532A (en) 1996-01-16
JP3265595B2 (ja) 2002-03-11
EP0534485A3 (en) 1995-03-15
DE69226917D1 (de) 1998-10-15
DE69226917T2 (de) 1999-06-02
JPH0591411A (ja) 1993-04-09
EP0534485A2 (de) 1993-03-31

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