SG187920A1 - Molybdenum (iv) amide precursors and use thereof in atomic layer deposition - Google Patents

Molybdenum (iv) amide precursors and use thereof in atomic layer deposition Download PDF

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Publication number
SG187920A1
SG187920A1 SG2013012679A SG2013012679A SG187920A1 SG 187920 A1 SG187920 A1 SG 187920A1 SG 2013012679 A SG2013012679 A SG 2013012679A SG 2013012679 A SG2013012679 A SG 2013012679A SG 187920 A1 SG187920 A1 SG 187920A1
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SG
Singapore
Prior art keywords
formula
nmeet
precursor
methyl
methylcyclopentadienyl
Prior art date
Application number
SG2013012679A
Other languages
English (en)
Inventor
Peter Nicholas Heys
Rajesh Odedra
Sarah Louise Hindley
Original Assignee
Sigma Aldrich Co Llc
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Filing date
Publication date
Application filed by Sigma Aldrich Co Llc filed Critical Sigma Aldrich Co Llc
Publication of SG187920A1 publication Critical patent/SG187920A1/en

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00—Processes for applying liquids or other fluent materials
    • B05D1/60—Deposition of organic layers from vapour phase
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F17/00—Metallocenes
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F11/00—Compounds containing elements of Groups 6 or 16 of the Periodic Table
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C23C16/405—Oxides of refractory metals or yttrium
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523—Pulsed gas flow or change of composition over time
    • C23C16/45525—Atomic layer deposition [ALD]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
SG2013012679A 2010-08-27 2011-08-25 Molybdenum (iv) amide precursors and use thereof in atomic layer deposition SG187920A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US37769210P 2010-08-27 2010-08-27
PCT/US2011/049155 WO2012027575A1 (en) 2010-08-27 2011-08-25 Molybdenum (iv) amide precursors and use thereof in atomic layer deposition

Publications (1)

Publication Number Publication Date
SG187920A1 true SG187920A1 (en) 2013-03-28

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
SG2013012679A SG187920A1 (en) 2010-08-27 2011-08-25 Molybdenum (iv) amide precursors and use thereof in atomic layer deposition

Country Status (9)

Country Link
US (1) US9802220B2 (cg-RX-API-DMAC10.html)
EP (1) EP2609102B1 (cg-RX-API-DMAC10.html)
JP (1) JP5873494B2 (cg-RX-API-DMAC10.html)
KR (1) KR101847953B1 (cg-RX-API-DMAC10.html)
CN (1) CN103097394B (cg-RX-API-DMAC10.html)
IL (1) IL224618A (cg-RX-API-DMAC10.html)
SG (1) SG187920A1 (cg-RX-API-DMAC10.html)
TW (1) TWI549958B (cg-RX-API-DMAC10.html)
WO (1) WO2012027575A1 (cg-RX-API-DMAC10.html)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2432363B (en) 2005-11-16 2010-06-23 Epichem Ltd Hafnocene and zirconocene precursors, and use thereof in atomic layer deposition
TWI382987B (zh) 2007-07-24 2013-01-21 Sigma Aldrich Co 應用於化學相沉積製程的有機金屬前驅物
EP2644741B1 (en) 2007-09-14 2015-03-04 Sigma-Aldrich Co. LLC Methods of preparing titanium containing thin films by atomic layer deposition using monocyclopentadienyl titanium-based precursors
TWI467045B (zh) 2008-05-23 2015-01-01 Sigma Aldrich Co 高介電常數電介質薄膜與使用鈰基前驅物製造高介電常數電介質薄膜之方法
EP2462148A1 (en) 2009-08-07 2012-06-13 Sigma-Aldrich Co. LLC High molecular weight alkyl-allyl cobalttricarbonyl complexes and use thereof for preparing dielectric thin films
CN103097394B (zh) 2010-08-27 2016-03-02 辛格玛艾瑞契有限责任公司 钼(iv)酰胺前驱物和其在原子层沉积中的用途
US8927748B2 (en) 2011-08-12 2015-01-06 Sigma-Aldrich Co. Llc Alkyl-substituted allyl carbonyl metal complexes and use thereof for preparing dielectric thin films
JP6209168B2 (ja) 2012-01-26 2017-10-04 シグマ−アルドリッチ・カンパニー、エルエルシー モリブデンアリル錯体及び薄膜堆積におけるその使用
WO2014140672A1 (en) * 2013-03-15 2014-09-18 L'air Liquide, Societe Anonyme Pour I'etude Et I'exploitation Des Procedes Georges Claude Bis(alkylimido)-bis(alkylamido)molybdenum molecules for deposition of molybdenum-containing films
WO2015138390A1 (en) 2014-03-13 2015-09-17 Sigma-Aldrich Co. Llc Molybdenum silylcyclopentadienyl and silylallyl complexes and use thereof in thin film deposition
KR102147190B1 (ko) * 2015-03-20 2020-08-25 에스케이하이닉스 주식회사 막형성조성물 및 그를 이용한 박막 제조 방법
CN113652672B (zh) * 2015-05-27 2023-12-22 Asm Ip 控股有限公司 用于含钼或钨薄膜的ald的前体的合成和用途
US10662527B2 (en) 2016-06-01 2020-05-26 Asm Ip Holding B.V. Manifolds for uniform vapor deposition
KR102727616B1 (ko) 2016-10-07 2024-11-07 삼성전자주식회사 유기 금속 전구체, 이를 이용한 막 형성 방법 및 이를 이용한 반도체 장치의 제조 방법
US10358407B2 (en) 2016-10-12 2019-07-23 Asm Ip Holding B.V. Synthesis and use of precursors for vapor deposition of tungsten containing thin films
KR102474876B1 (ko) * 2017-06-15 2022-12-07 삼성전자주식회사 텅스텐 전구체 및 이를 이용한 텅스텐 함유막의 형성 방법
US11560625B2 (en) 2018-01-19 2023-01-24 Entegris, Inc. Vapor deposition of molybdenum using a bis(alkyl-arene) molybdenum precursor
US11492701B2 (en) 2019-03-19 2022-11-08 Asm Ip Holding B.V. Reactor manifolds
US12516414B2 (en) 2019-03-19 2026-01-06 Asm Ip Holding B.V. Reactor manifolds
KR20210048408A (ko) 2019-10-22 2021-05-03 에이에스엠 아이피 홀딩 비.브이. 반도체 증착 반응기 매니폴드
TWI865725B (zh) 2020-02-10 2024-12-11 荷蘭商Asm Ip私人控股有限公司 高深寬比孔內的氧化鉿之沉積
KR102793252B1 (ko) 2020-03-25 2025-04-08 삼성전자주식회사 몰리브덴 화합물과 이를 이용한 집적회로 소자의 제조 방법
TWI918669B (zh) 2020-06-24 2026-03-21 荷蘭商Asm Ip私人控股有限公司 含鉬薄膜的氣相沉積
KR102901317B1 (ko) * 2020-08-25 2025-12-17 주식회사 아이켐스 몰리브데넘 함유 박막의 제조방법 및 이에 따라 제조된 몰리브데넘 함유 박막.
US11390638B1 (en) 2021-01-12 2022-07-19 Applied Materials, Inc. Molybdenum(VI) precursors for deposition of molybdenum films
US11434254B2 (en) 2021-01-12 2022-09-06 Applied Materials, Inc. Dinuclear molybdenum precursors for deposition of molybdenum-containing films
US11459347B2 (en) 2021-01-12 2022-10-04 Applied Materials, Inc. Molybdenum(IV) and molybdenum(III) precursors for deposition of molybdenum films
US11584768B2 (en) * 2021-01-12 2023-02-21 Applied Materials, Inc. Arene molybdenum (0) precursors for deposition of molybdenum films
US11760768B2 (en) 2021-04-21 2023-09-19 Applied Materials, Inc. Molybdenum(0) precursors for deposition of molybdenum films
US20230002888A1 (en) * 2021-07-01 2023-01-05 Applied Materials, Inc. Method of depositing metal films
US12652972B2 (en) 2022-04-06 2026-06-09 Applied Materials, Inc. Field suppressed metal gapfill
US12559836B2 (en) * 2022-07-29 2026-02-24 Applied Materials, Inc. Bottom up molybdenum gapfill
KR102812241B1 (ko) * 2023-06-16 2025-05-23 에스케이트리켐 주식회사 신규한 몰리브데넘 함유 박막 형성용 전구체 및 이를 이용한 몰리브데넘 함유 박막의 형성 방법.

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07107190B2 (ja) 1984-03-30 1995-11-15 キヤノン株式会社 光化学気相成長方法
US5064686A (en) 1990-10-29 1991-11-12 Olin Corporation Sub-valent molybdenum, tungsten, and chromium amides as sources for thermal chemical vapor deposition of metal-containing films
GB9929279D0 (en) 1999-12-11 2000-02-02 Epichem Ltd An improved method of and apparatus for the delivery of precursors in the vapour phase to a plurality of epitaxial reactor sites
GB0017968D0 (en) 2000-07-22 2000-09-13 Epichem Ltd An improved process and apparatus for the isolation of pure,or substantially pure,organometallic compounds
JP4472338B2 (ja) 2001-10-26 2010-06-02 シグマ−アルドリッチ・カンパニー 化学気相成長のための改良された前駆体
TW200411923A (en) 2002-07-19 2004-07-01 Asml Us Inc In-situ formation of metal insulator metal capacitors
KR20110118735A (ko) 2003-03-17 2011-10-31 시그마-알드리치컴퍼니 금속 옥사이드층 또는 금속 옥사이드 필름 증착용 전구체
GB0412790D0 (en) 2004-06-08 2004-07-14 Epichem Ltd Precursors for deposition of silicon nitride,silicon oxynitride and metal silicon oxynitrides
GB2432363B (en) 2005-11-16 2010-06-23 Epichem Ltd Hafnocene and zirconocene precursors, and use thereof in atomic layer deposition
US7638645B2 (en) 2006-06-28 2009-12-29 President And Fellows Of Harvard University Metal (IV) tetra-amidinate compounds and their use in vapor deposition
CN101500989B (zh) 2006-06-28 2012-12-19 哈佛学院院长等 四脒基金属(iv)化合物及其在气相沉积中的用途
US7956207B2 (en) 2006-09-28 2011-06-07 Praxair Technology, Inc. Heteroleptic organometallic compounds
TWI382987B (zh) 2007-07-24 2013-01-21 Sigma Aldrich Co 應用於化學相沉積製程的有機金屬前驅物
TWI425110B (zh) 2007-07-24 2014-02-01 辛格瑪艾瑞契公司 以化學相沉積法製造含金屬薄膜之方法
EP2191034B1 (en) 2007-09-14 2013-03-13 Sigma-Aldrich Co. LLC Methods of preparing thin films by atomic layer deposition using monocyclopentadienyl triamino zirconium precursors
EP2644741B1 (en) 2007-09-14 2015-03-04 Sigma-Aldrich Co. LLC Methods of preparing titanium containing thin films by atomic layer deposition using monocyclopentadienyl titanium-based precursors
TW200944535A (en) 2008-03-20 2009-11-01 Sigma Aldrich Co Purification and preparation of phosphorus-containing compounds
TWI467045B (zh) 2008-05-23 2015-01-01 Sigma Aldrich Co 高介電常數電介質薄膜與使用鈰基前驅物製造高介電常數電介質薄膜之方法
TW200949939A (en) 2008-05-23 2009-12-01 Sigma Aldrich Co High-k dielectric films and methods of producing using titanium-based β -diketonate precursors
WO2009143452A1 (en) 2008-05-23 2009-11-26 Sigma-Aldrich Co. High-k dielectric films and methods of producing using cerium-based precursors
TW200949006A (en) 2008-05-23 2009-12-01 Sigma Aldrich Co High-k dielectric films and methods of producing using titanium-based precursors
TW200951241A (en) 2008-05-30 2009-12-16 Sigma Aldrich Co Methods of forming ruthenium-containing films by atomic layer deposition
TW201014924A (en) 2008-06-20 2010-04-16 Sigma Aldrich Co Hafnium and zirconium pyrrolyl-based organometallic precursors and use thereof for preparing dielectric thin films
WO2010114386A1 (en) 2009-03-30 2010-10-07 Universitetet I Oslo Thin films containing molybdenum oxide
JP2012533909A (ja) 2009-07-21 2012-12-27 シグマ−アルドリッチ・カンパニー、エルエルシー チタン含有組成物およびこの組成物のチタン含有薄膜形成のための使用方法
EP2462148A1 (en) 2009-08-07 2012-06-13 Sigma-Aldrich Co. LLC High molecular weight alkyl-allyl cobalttricarbonyl complexes and use thereof for preparing dielectric thin films
US8318572B1 (en) * 2010-02-19 2012-11-27 Intermolecular, Inc. Inexpensive electrode materials to facilitate rutile phase titanium oxide
WO2011115878A1 (en) 2010-03-19 2011-09-22 Sigma-Aldrich Co. Methods for preparing thin fillms by atomic layer deposition using hydrazines
CN103097394B (zh) 2010-08-27 2016-03-02 辛格玛艾瑞契有限责任公司 钼(iv)酰胺前驱物和其在原子层沉积中的用途
US8927748B2 (en) 2011-08-12 2015-01-06 Sigma-Aldrich Co. Llc Alkyl-substituted allyl carbonyl metal complexes and use thereof for preparing dielectric thin films
JP6209168B2 (ja) 2012-01-26 2017-10-04 シグマ−アルドリッチ・カンパニー、エルエルシー モリブデンアリル錯体及び薄膜堆積におけるその使用

Also Published As

Publication number Publication date
WO2012027575A1 (en) 2012-03-01
JP2013540893A (ja) 2013-11-07
TW201219405A (en) 2012-05-16
US20130196065A1 (en) 2013-08-01
KR101847953B1 (ko) 2018-04-11
EP2609102B1 (en) 2014-12-31
CN103097394B (zh) 2016-03-02
KR20130139866A (ko) 2013-12-23
EP2609102A1 (en) 2013-07-03
IL224618A (en) 2015-02-26
TWI549958B (zh) 2016-09-21
JP5873494B2 (ja) 2016-03-01
CN103097394A (zh) 2013-05-08
US9802220B2 (en) 2017-10-31

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