SG154364A1 - System and method for the sorting of ic units - Google Patents

System and method for the sorting of ic units

Info

Publication number
SG154364A1
SG154364A1 SG200800949-0A SG2008009490A SG154364A1 SG 154364 A1 SG154364 A1 SG 154364A1 SG 2008009490 A SG2008009490 A SG 2008009490A SG 154364 A1 SG154364 A1 SG 154364A1
Authority
SG
Singapore
Prior art keywords
units
sorting
inspection station
inspecting
flipping
Prior art date
Application number
SG200800949-0A
Inventor
Hae Choon Yang
Original Assignee
Rokko Mechatronics Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rokko Mechatronics Pte Ltd filed Critical Rokko Mechatronics Pte Ltd
Priority to SG200800949-0A priority Critical patent/SG154364A1/en
Priority to CN2009801071995A priority patent/CN102027586B/en
Priority to PCT/SG2009/000036 priority patent/WO2009096904A2/en
Priority to TW098103220A priority patent/TW200944807A/en
Publication of SG154364A1 publication Critical patent/SG154364A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

A method for processing a plurality of IC units comprising the steps of inspecting said units at a first inspection station; moving said IC units along a linearly defined path to a second inspection station; inspecting the units at said second inspection station; flipping said units; inspecting the units at said third inspection station, and; sorting said units into pre- defined categories. Fig 2
SG200800949-0A 2008-01-30 2008-01-30 System and method for the sorting of ic units SG154364A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SG200800949-0A SG154364A1 (en) 2008-01-30 2008-01-30 System and method for the sorting of ic units
CN2009801071995A CN102027586B (en) 2008-01-30 2009-01-30 System and method for the sorting of IC units
PCT/SG2009/000036 WO2009096904A2 (en) 2008-01-30 2009-01-30 System and method for the sorting of ic units
TW098103220A TW200944807A (en) 2008-01-30 2009-02-02 System and method for the sorting of IC units

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200800949-0A SG154364A1 (en) 2008-01-30 2008-01-30 System and method for the sorting of ic units

Publications (1)

Publication Number Publication Date
SG154364A1 true SG154364A1 (en) 2009-08-28

Family

ID=40913453

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200800949-0A SG154364A1 (en) 2008-01-30 2008-01-30 System and method for the sorting of ic units

Country Status (4)

Country Link
CN (1) CN102027586B (en)
SG (1) SG154364A1 (en)
TW (1) TW200944807A (en)
WO (1) WO2009096904A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG171498A1 (en) * 2009-12-01 2011-06-29 Rokko Systems Pte Ltd Method and apparatus for improved sorting of diced substrates
US10907247B2 (en) * 2014-08-13 2021-02-02 Rokko Systems Pte Ltd Apparatus and method for processing sputtered IC units
KR102440451B1 (en) * 2016-01-29 2022-09-06 한미반도체 주식회사 Semiconductor Package Processing Apparatus

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05335386A (en) * 1992-05-28 1993-12-17 Hitachi Ltd Ic handler
CN100501411C (en) * 2005-08-17 2009-06-17 京元电子股份有限公司 Test system for electric components
KR100705655B1 (en) * 2005-10-19 2007-04-09 (주) 인텍플러스 Sorting method of semiconductor package
KR101188841B1 (en) * 2006-06-13 2012-10-08 미래산업 주식회사 Burn-in sorter and sorting method using the same

Also Published As

Publication number Publication date
CN102027586A (en) 2011-04-20
WO2009096904A3 (en) 2011-05-26
CN102027586B (en) 2013-09-18
WO2009096904A2 (en) 2009-08-06
TW200944807A (en) 2009-11-01

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