SG143213A1 - Probe card - Google Patents
Probe cardInfo
- Publication number
- SG143213A1 SG143213A1 SG200718140-7A SG2007181407A SG143213A1 SG 143213 A1 SG143213 A1 SG 143213A1 SG 2007181407 A SG2007181407 A SG 2007181407A SG 143213 A1 SG143213 A1 SG 143213A1
- Authority
- SG
- Singapore
- Prior art keywords
- probe
- probe card
- combining
- bump
- substrate
- Prior art date
Links
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PROBE CARD A probe card includes a substrate, a bump, a probe and a combining member. The bump is formed on the substrate. The probe includes a support beam and a tip protruded from a first end of the support beam. The combining member electrically connects the bump to the probe. The combining member includes a first combining portion and a second combining portion surrounding an outer face of the first combining portion. Thus, the probe of the probe card may be firmly fixed so that the probe card may have improved structural stability.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060118032A KR101088346B1 (en) | 2006-11-28 | 2006-11-28 | Probe Card |
Publications (1)
Publication Number | Publication Date |
---|---|
SG143213A1 true SG143213A1 (en) | 2008-06-27 |
Family
ID=39486930
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200718140-7A SG143213A1 (en) | 2006-11-28 | 2007-11-28 | Probe card |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR101088346B1 (en) |
CN (1) | CN101191801B (en) |
SG (1) | SG143213A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100972995B1 (en) * | 2008-08-08 | 2010-07-30 | 윌테크놀러지(주) | Method for bonding probe |
KR101534110B1 (en) * | 2009-01-19 | 2015-07-20 | (주)엠투엔 | Probe for inspecting electric condition and probe assembly having the same |
KR101127117B1 (en) * | 2010-06-11 | 2012-03-22 | 성균관대학교산학협력단 | Probe unit and method for fabricating the same |
CN103823089A (en) * | 2013-11-26 | 2014-05-28 | 上海华力微电子有限公司 | Probe card |
CN106018566B (en) * | 2016-07-05 | 2018-07-13 | 华中科技大学 | A kind of ultrasonic transduction device |
-
2006
- 2006-11-28 KR KR1020060118032A patent/KR101088346B1/en not_active IP Right Cessation
-
2007
- 2007-11-28 SG SG200718140-7A patent/SG143213A1/en unknown
- 2007-11-28 CN CN2007101681768A patent/CN101191801B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR101088346B1 (en) | 2011-11-30 |
CN101191801A (en) | 2008-06-04 |
KR20080048120A (en) | 2008-06-02 |
CN101191801B (en) | 2012-12-19 |
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