SG11202107874TA - Information processing system, information processing method, program, and substrate processing apparatus - Google Patents
Information processing system, information processing method, program, and substrate processing apparatusInfo
- Publication number
- SG11202107874TA SG11202107874TA SG11202107874TA SG11202107874TA SG11202107874TA SG 11202107874T A SG11202107874T A SG 11202107874TA SG 11202107874T A SG11202107874T A SG 11202107874TA SG 11202107874T A SG11202107874T A SG 11202107874TA SG 11202107874T A SG11202107874T A SG 11202107874TA
- Authority
- SG
- Singapore
- Prior art keywords
- information processing
- program
- substrate
- processing apparatus
- processing system
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
- G06N20/20—Ensemble learning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
- G06F17/15—Correlation function computation including computation of convolution operations
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Software Systems (AREA)
- Mathematical Physics (AREA)
- Data Mining & Analysis (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- Mathematical Analysis (AREA)
- Pure & Applied Mathematics (AREA)
- Mathematical Optimization (AREA)
- Computational Mathematics (AREA)
- Medical Informatics (AREA)
- Mechanical Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Biomedical Technology (AREA)
- Molecular Biology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Computational Linguistics (AREA)
- Power Engineering (AREA)
- Biophysics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Algebra (AREA)
- Databases & Information Systems (AREA)
- General Factory Administration (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Complex Calculations (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019010209A JP7220573B2 (en) | 2019-01-24 | 2019-01-24 | Information processing system, information processing method, program and substrate processing apparatus |
PCT/JP2019/047317 WO2020153001A1 (en) | 2019-01-24 | 2019-12-04 | Information processing system, information processing method, program, and substrate processing device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202107874TA true SG11202107874TA (en) | 2021-08-30 |
Family
ID=71736336
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202107874TA SG11202107874TA (en) | 2019-01-24 | 2019-12-04 | Information processing system, information processing method, program, and substrate processing apparatus |
Country Status (7)
Country | Link |
---|---|
US (1) | US20220093409A1 (en) |
JP (1) | JP7220573B2 (en) |
KR (1) | KR20210118128A (en) |
CN (1) | CN113329845B (en) |
SG (1) | SG11202107874TA (en) |
TW (1) | TW202042963A (en) |
WO (1) | WO2020153001A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020131353A (en) * | 2019-02-19 | 2020-08-31 | パナソニックIpマネジメント株式会社 | Polishing system, learning device, and learning method of learning device |
CN115697631A (en) * | 2020-12-18 | 2023-02-03 | 应用材料公司 | Adaptive slurry dispensing system |
WO2022138272A1 (en) * | 2020-12-25 | 2022-06-30 | 東京エレクトロン株式会社 | Management system, management method, and management program |
JP2022162709A (en) * | 2021-04-13 | 2022-10-25 | 株式会社Screenホールディングス | Substrate processing device, substrate processing system, and data processing method |
WO2022270345A1 (en) * | 2021-06-22 | 2022-12-29 | 株式会社荏原製作所 | Polishing method and polishing apparatus |
WO2023166991A1 (en) * | 2022-03-01 | 2023-09-07 | 株式会社荏原製作所 | Information processing device, inference device, machine learning device, information processing method, inference method, and machine learning method |
KR20230137613A (en) | 2022-03-22 | 2023-10-05 | 사회복지법인 삼성생명공익재단 | Tumor classification method based on learning model using hip x-ray and analysis apparatus |
WO2023230517A1 (en) * | 2022-05-27 | 2023-11-30 | Onto Innovation Inc. | Performance management of semiconductor substrate tools |
JP2024015933A (en) * | 2022-07-25 | 2024-02-06 | 株式会社荏原製作所 | Information processing device, machine learning device, information processing method, and machine learning method |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5664066A (en) * | 1992-11-09 | 1997-09-02 | The United States Of America As Represented By The United States Department Of Energy | Intelligent system for automatic feature detection and selection or identification |
US6439964B1 (en) | 1999-10-12 | 2002-08-27 | Applied Materials, Inc. | Method of controlling a polishing machine |
TWI264043B (en) * | 2002-10-01 | 2006-10-11 | Tokyo Electron Ltd | Method and system for analyzing data from a plasma process |
US7001243B1 (en) * | 2003-06-27 | 2006-02-21 | Lam Research Corporation | Neural network control of chemical mechanical planarization |
JP5353443B2 (en) * | 2009-05-25 | 2013-11-27 | 株式会社Jvcケンウッド | Data classifier creation device, data classifier, data classifier creation method, data classification method, data classifier creation program, data classification program |
JP2012074574A (en) * | 2010-09-29 | 2012-04-12 | Hitachi Ltd | Control system for processing apparatus and method for controlling processing apparatus |
US8954184B2 (en) * | 2011-01-19 | 2015-02-10 | Tokyo Electron Limited | Tool performance by linking spectroscopic information with tool operational parameters and material measurement information |
KR102205682B1 (en) * | 2012-08-15 | 2021-01-21 | 노바 메주어링 인스트루먼츠 엘티디. | Optical metrology for in-situ measurements |
US10386828B2 (en) * | 2015-12-17 | 2019-08-20 | Lam Research Corporation | Methods and apparatuses for etch profile matching by surface kinetic model optimization |
SG11201902651QA (en) * | 2016-10-18 | 2019-05-30 | Ebara Corp | Substrate processing control system, substrate processing control method, and program |
US10262910B2 (en) * | 2016-12-23 | 2019-04-16 | Lam Research Corporation | Method of feature exaction from time-series of spectra to control endpoint of process |
-
2019
- 2019-01-24 JP JP2019010209A patent/JP7220573B2/en active Active
- 2019-12-03 TW TW108144087A patent/TW202042963A/en unknown
- 2019-12-04 US US17/425,195 patent/US20220093409A1/en active Pending
- 2019-12-04 KR KR1020217026411A patent/KR20210118128A/en unknown
- 2019-12-04 WO PCT/JP2019/047317 patent/WO2020153001A1/en active Application Filing
- 2019-12-04 SG SG11202107874TA patent/SG11202107874TA/en unknown
- 2019-12-04 CN CN201980090127.8A patent/CN113329845B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN113329845A (en) | 2021-08-31 |
WO2020153001A1 (en) | 2020-07-30 |
JP7220573B2 (en) | 2023-02-10 |
CN113329845B (en) | 2023-07-25 |
JP2020120004A (en) | 2020-08-06 |
US20220093409A1 (en) | 2022-03-24 |
KR20210118128A (en) | 2021-09-29 |
TW202042963A (en) | 2020-12-01 |
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