SG11202011171TA - High-performance probe card in high-frequency - Google Patents

High-performance probe card in high-frequency

Info

Publication number
SG11202011171TA
SG11202011171TA SG11202011171TA SG11202011171TA SG11202011171TA SG 11202011171T A SG11202011171T A SG 11202011171TA SG 11202011171T A SG11202011171T A SG 11202011171TA SG 11202011171T A SG11202011171T A SG 11202011171TA SG 11202011171T A SG11202011171T A SG 11202011171TA
Authority
SG
Singapore
Prior art keywords
frequency
probe card
performance probe
performance
card
Prior art date
Application number
SG11202011171TA
Inventor
Riccardo Vettori
Original Assignee
Technoprobe Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technoprobe Spa filed Critical Technoprobe Spa
Publication of SG11202011171TA publication Critical patent/SG11202011171TA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Reinforced Plastic Materials (AREA)
  • Laminated Bodies (AREA)
SG11202011171TA 2018-05-16 2019-05-14 High-performance probe card in high-frequency SG11202011171TA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT102018000005444A IT201800005444A1 (en) 2018-05-16 2018-05-16 Measurement board with high performance in high frequency
PCT/EP2019/062276 WO2019219638A1 (en) 2018-05-16 2019-05-14 High-performance probe card in high-frequency

Publications (1)

Publication Number Publication Date
SG11202011171TA true SG11202011171TA (en) 2020-12-30

Family

ID=63080366

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202011171TA SG11202011171TA (en) 2018-05-16 2019-05-14 High-performance probe card in high-frequency

Country Status (9)

Country Link
US (1) US11402428B2 (en)
EP (1) EP3794357B1 (en)
JP (1) JP7416725B2 (en)
KR (1) KR20210010895A (en)
CN (1) CN112119315B (en)
IT (1) IT201800005444A1 (en)
PH (1) PH12020551950A1 (en)
SG (1) SG11202011171TA (en)
WO (1) WO2019219638A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT201900024964A1 (en) * 2019-12-20 2021-06-20 Technoprobe Spa Measuring head for low pitch applications
TWI784439B (en) * 2021-03-12 2022-11-21 冠銓科技實業股份有限公司 Test needle seat structure for high frequency measurement
CN114200278B (en) * 2021-11-29 2022-12-27 强一半导体（苏州）有限公司 Film probe card and probe head thereof
TWI790065B (en) * 2021-12-27 2023-01-11 冠銓科技實業股份有限公司 Improvement of the structure of the test needle seat for high-frequency measurement
WO2023237546A1 (en) * 2022-06-07 2023-12-14 Technoprobe S.P.A. Improved measurement system for the testing of high-frequency devices

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912399A (en) * 1987-06-09 1990-03-27 Tektronix, Inc. Multiple lead probe for integrated circuits in wafer form
US4906920A (en) * 1988-10-11 1990-03-06 Hewlett-Packard Company Self-leveling membrane probe
JP2000131342A (en) 1998-10-20 2000-05-12 Fujitsu Ltd Contactor for electronic part
US6917525B2 (en) * 2001-11-27 2005-07-12 Nanonexus, Inc. Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
JP4480258B2 (en) 2000-03-29 2010-06-16 株式会社日本マイクロニクス Electrical contact device in semiconductor device inspection equipment
US6867607B2 (en) * 2002-01-22 2005-03-15 Sychip, Inc. Membrane test method and apparatus for integrated circuit testing
US6911835B2 (en) 2002-05-08 2005-06-28 Formfactor, Inc. High performance probe system
US7598100B2 (en) * 2004-11-18 2009-10-06 Renesas Technology Corp. Manufacturing method of semiconductor integrated circuit device
JP5065674B2 (en) * 2006-12-28 2012-11-07 ルネサスエレクトロニクス株式会社 Manufacturing method of semiconductor integrated circuit device
JP5049694B2 (en) 2007-08-07 2012-10-17 ルネサスエレクトロニクス株式会社 Probe card, semiconductor inspection apparatus, and semiconductor device manufacturing method
WO2011036718A1 (en) * 2009-09-25 2011-03-31 株式会社アドバンテスト Probe apparatus and testing apparatus
CN102043074A (en) * 2009-10-14 2011-05-04 旺矽科技股份有限公司 High-frequency probe card
JP2013246153A (en) 2012-05-29 2013-12-09 Micronics Japan Co Ltd Probe card
KR20170105030A (en) * 2014-12-30 2017-09-18 테크노프로브 에스.피.에이. Semi-finished products including contact probes for a plurality of test heads and a method for manufacturing the same
US11079406B2 (en) * 2016-08-31 2021-08-03 International Business Machines Corporation Semiconductor micro probe array having compliance
JP2019109103A (en) 2017-12-18 2019-07-04 株式会社ヨコオ Inspection jig

Also Published As

Publication number Publication date
EP3794357A1 (en) 2021-03-24
EP3794357B1 (en) 2022-01-19
US11402428B2 (en) 2022-08-02
IT201800005444A1 (en) 2019-11-16
KR20210010895A (en) 2021-01-28
TW201947231A (en) 2019-12-16
WO2019219638A1 (en) 2019-11-21
CN112119315A (en) 2020-12-22
CN112119315B (en) 2024-04-02
JP7416725B2 (en) 2024-01-17
JP2021524029A (en) 2021-09-09
PH12020551950A1 (en) 2021-08-16
US20210063478A1 (en) 2021-03-04

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