SG11202001640SA - Single crystal of silicon with <100> orientation, which is doped with n-type dopant, and method for producing such a single crystal - Google Patents
Single crystal of silicon with <100> orientation, which is doped with n-type dopant, and method for producing such a single crystalInfo
- Publication number
- SG11202001640SA SG11202001640SA SG11202001640SA SG11202001640SA SG11202001640SA SG 11202001640S A SG11202001640S A SG 11202001640SA SG 11202001640S A SG11202001640S A SG 11202001640SA SG 11202001640S A SG11202001640S A SG 11202001640SA SG 11202001640S A SG11202001640S A SG 11202001640SA
- Authority
- SG
- Singapore
- Prior art keywords
- single crystal
- doped
- orientation
- silicon
- producing
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
- C30B15/04—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt adding doping materials, e.g. for n-p-junction
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/203—Controlling or regulating the relationship of pull rate (v) to axial thermal gradient (G)
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/206—Controlling or regulating the thermal history of growing the ingot
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102017215332.6A DE102017215332A1 (en) | 2017-09-01 | 2017-09-01 | A single crystal of <100> oriented silicon doped with n-type dopant and methods of producing such a single crystal |
PCT/EP2018/073101 WO2019042979A1 (en) | 2017-09-01 | 2018-08-28 | Silicon single crystal with <100> orientation, which is doped with dopant of n-type, and method for producing such a single crystal |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202001640SA true SG11202001640SA (en) | 2020-03-30 |
Family
ID=63407219
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202001640SA SG11202001640SA (en) | 2017-09-01 | 2018-08-28 | Single crystal of silicon with <100> orientation, which is doped with n-type dopant, and method for producing such a single crystal |
Country Status (10)
Country | Link |
---|---|
US (1) | US11390962B2 (en) |
EP (1) | EP3676425B1 (en) |
JP (1) | JP6995980B2 (en) |
KR (1) | KR102381014B1 (en) |
CN (1) | CN111051578A (en) |
DE (1) | DE102017215332A1 (en) |
FI (1) | FI3676425T3 (en) |
SG (1) | SG11202001640SA (en) |
TW (1) | TWI668340B (en) |
WO (1) | WO2019042979A1 (en) |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59102896A (en) * | 1982-11-30 | 1984-06-14 | Toshiba Corp | Method for controlling shape of single crystal |
JPH0644369B2 (en) | 1982-12-28 | 1994-06-08 | オリンパス光学工業株式会社 | Magnetic recording / reproducing device |
JPH05319988A (en) * | 1992-05-25 | 1993-12-03 | Nippon Steel Corp | Production of silicon single crystal |
US5769941A (en) * | 1996-05-01 | 1998-06-23 | Motorola, Inc. | Method of forming semiconductor material |
JP3992800B2 (en) * | 1997-09-22 | 2007-10-17 | Sumco Techxiv株式会社 | Single crystal manufacturing apparatus and single crystal manufacturing method |
JP3612974B2 (en) * | 1997-12-26 | 2005-01-26 | 三菱住友シリコン株式会社 | Crystal growth method |
US6241818B1 (en) | 1999-04-07 | 2001-06-05 | Memc Electronic Materials, Inc. | Method and system of controlling taper growth in a semiconductor crystal growth process |
JP4357068B2 (en) * | 1999-05-11 | 2009-11-04 | Sumco Techxiv株式会社 | Single crystal ingot manufacturing apparatus and method |
DE10025870A1 (en) * | 2000-05-25 | 2001-12-06 | Wacker Siltronic Halbleitermat | Single crystal rod and method of manufacturing the same |
JP3909675B2 (en) * | 2001-04-20 | 2007-04-25 | 信越半導体株式会社 | Silicon single crystal manufacturing apparatus and silicon single crystal manufacturing method using the same |
EP1498517B1 (en) * | 2002-04-24 | 2016-08-31 | Shin-Etsu Handotai Co., Ltd. | Method of manufacturing silicon single crystal |
JP4089354B2 (en) * | 2002-08-30 | 2008-05-28 | 株式会社Sumco | Epitaxial wafer and manufacturing method thereof |
JP4760729B2 (en) * | 2006-02-21 | 2011-08-31 | 株式会社Sumco | Silicon single crystal wafer for IGBT and manufacturing method of silicon single crystal wafer for IGBT |
JP5463693B2 (en) * | 2009-03-03 | 2014-04-09 | 信越半導体株式会社 | Manufacturing method of silicon epitaxial wafer |
DE102009024473B4 (en) * | 2009-06-10 | 2015-11-26 | Siltronic Ag | A method for pulling a single crystal of silicon and then produced single crystal |
KR101275382B1 (en) * | 2010-03-02 | 2013-06-14 | 주식회사 엘지실트론 | Single Crystal Cooling Apparatus and Single Crystal Grower including the same |
JP5831436B2 (en) | 2012-12-11 | 2015-12-09 | 信越半導体株式会社 | Method for producing silicon single crystal |
CN103343385A (en) * | 2013-06-28 | 2013-10-09 | 浙江长兴众成电子有限公司 | Special-shape size czochralski silicon and growth method thereof |
FR3028266B1 (en) * | 2014-11-10 | 2016-12-23 | Commissariat Energie Atomique | PROCESS FOR MANUFACTURING ANY-TYPE MONOCRYSTALLINE SILICON BILGE WITH CONTROLLED OXYGEN THERMAL CONCENTRATION CONCENTRATION |
JP6471492B2 (en) | 2014-12-24 | 2019-02-20 | 株式会社Sumco | Single crystal manufacturing method |
WO2017069112A1 (en) * | 2015-10-23 | 2017-04-27 | 株式会社トクヤマ | Silicon single crystal ingot pull-up device and silicon single crystal ingot production method |
-
2017
- 2017-09-01 DE DE102017215332.6A patent/DE102017215332A1/en not_active Withdrawn
-
2018
- 2018-08-28 EP EP18762067.9A patent/EP3676425B1/en active Active
- 2018-08-28 SG SG11202001640SA patent/SG11202001640SA/en unknown
- 2018-08-28 JP JP2020512371A patent/JP6995980B2/en active Active
- 2018-08-28 KR KR1020207008044A patent/KR102381014B1/en active IP Right Grant
- 2018-08-28 WO PCT/EP2018/073101 patent/WO2019042979A1/en unknown
- 2018-08-28 CN CN201880055731.2A patent/CN111051578A/en active Pending
- 2018-08-28 US US16/643,673 patent/US11390962B2/en active Active
- 2018-08-28 FI FIEP18762067.9T patent/FI3676425T3/en active
- 2018-08-29 TW TW107130081A patent/TWI668340B/en active
Also Published As
Publication number | Publication date |
---|---|
CN111051578A (en) | 2020-04-21 |
JP6995980B2 (en) | 2022-02-03 |
EP3676425A1 (en) | 2020-07-08 |
EP3676425B1 (en) | 2023-10-04 |
KR20200042516A (en) | 2020-04-23 |
JP2020531401A (en) | 2020-11-05 |
KR102381014B1 (en) | 2022-04-01 |
US20200270764A1 (en) | 2020-08-27 |
WO2019042979A1 (en) | 2019-03-07 |
TWI668340B (en) | 2019-08-11 |
US11390962B2 (en) | 2022-07-19 |
DE102017215332A1 (en) | 2019-03-07 |
TW201912850A (en) | 2019-04-01 |
FI3676425T3 (en) | 2023-12-14 |
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