SG11201907780UA - Laser irradiation apparatus, laser irradiation method, and method for manufacturing semiconductor device - Google Patents
Laser irradiation apparatus, laser irradiation method, and method for manufacturing semiconductor deviceInfo
- Publication number
- SG11201907780UA SG11201907780UA SG11201907780UA SG11201907780UA SG11201907780UA SG 11201907780U A SG11201907780U A SG 11201907780UA SG 11201907780U A SG11201907780U A SG 11201907780UA SG 11201907780U A SG11201907780U A SG 11201907780UA SG 11201907780U A SG11201907780U A SG 11201907780UA
- Authority
- SG
- Singapore
- Prior art keywords
- laser irradiation
- semiconductor device
- manufacturing semiconductor
- irradiation apparatus
- laser
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/0006—Working by laser beam, e.g. welding, cutting or boring taking account of the properties of the material involved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/10—Devices involving relative movement between laser beam and workpiece using a fixed support, i.e. involving moving the laser beam
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02592—Microstructure amorphous
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
- H01L21/02675—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth using laser beams
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/268—Bombardment with radiation with high-energy radiation using electromagnetic radiation, e.g. laser radiation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67715—Changing the direction of the conveying path
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67784—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Abstract
A l a s e r i r r a d i a t i o n a p p a r a t u s ( 1 ) a c c o r d i n g t o a n e m b o d i m e n t i n c l u d e s a l a s e r g e n e r a t i o n d e v i c e ( 1 4 ) c o n f i g u r e d t o g e n e r a t e l a s e r l i g h t , a l e v i t a t i o n u n i t ( 1 0 ) c o n f i g u r e d t o l e v i t a t e a n o b j e c t t o b e 5 p r o c e s s e d ( 1 6 ) t o w h i c h t h e l a s e r l i g h t i s a p p l i e d , a n d a c o n v e ya n c e u n i t ( 1 1 ) c o n f i g u r e d t o c o n v e y t h e l e v i t a t e d o b j e c t t o b e p r o c e s s e d ( 1 6 ) . T h e c o n v e y a n c e u n i t ( 1 1 ) i n c l u d e s a h o l d i n g m e c h a n i s m ( 1 2 ) f o r h o l d i n g t h e o b j e c t t o b e p r o c e s s e d ( 1 6 ) b y a b s o r b i n g t h e o b j e c t t o b e p r o c e s s e d ( 1 6 ) , a n d a m o v i n g m e c h a n i s m ( 1 3 ) f o r m o v i n g t h e h o l d i n g 1 0 m e c h a n i s m ( 1 2 ) i n a c o n v e y a n c e d i r e c t i o n . T h e h o l d i n g m e c h a n i s m ( 1 2 ) i n c l u d e s a b a s e ( 1 5 3 ) i n c l u d i n g a p l u r a l i t y o f t h r o u g h h o l e s ( 1 5 2 ) , a p l u r a l i t y o f p i p e s ( 1 4 5 ) e a c h o f w h i c h i s c o n n e c t e d t o a r e s p e c t i v e o n e o f t h e p l u r a l i t y o f t h r o u g h h o l e s ( 1 5 2 ) , a v a c u u m g e n e r a t i o n d e v i c e ( 1 4 4 ) c o n f i g u r e d t o e v a c u a t e a i r f r o m t h e p l u r a l i t y o f p i p e s ( 1 4 5 ) , a n d 1 5 a p l u r a l i t y o f a b s o r p t i o n a s s i s t a n c e v a l v e s ( 1 5 0 ) e a c h o f w h i c h i s d i s p o s e d i n t h e m i d d l e o f a r e s p e c t i v e o n e o f t h e p l u r a l i t y o f p i p e s ( 1 4 5 ) , e a c h o f t h e p l u r a l i t y o f a b s o r p t i o n a s s i s t a n c e v a l v e s ( 1 5 0 ) b e i n g c o n f i g u r e d t o b e c l o s e d w h e n a f l o w r a t e o f a g a s f l o w i n g i n t o t h e p i p e ( 1 4 5 ) t h r o u g h t h e t h r o u g h h o l e ( 1 5 2 ) b e c o m e s e q u a l t o o r h i g h e r t h a n a 2 0 t h r e s h o l d . [ F i g . 9 ]
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017050811A JP6829118B2 (en) | 2017-03-16 | 2017-03-16 | Laser irradiation device, laser irradiation method, and manufacturing method of semiconductor device |
PCT/JP2017/029617 WO2018168002A1 (en) | 2017-03-16 | 2017-08-18 | Laser irradiation apparatus, laser irradiation method, and semiconductor device manufacturing method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201907780UA true SG11201907780UA (en) | 2019-09-27 |
Family
ID=63523391
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201907780UA SG11201907780UA (en) | 2017-03-16 | 2017-08-18 | Laser irradiation apparatus, laser irradiation method, and method for manufacturing semiconductor device |
Country Status (7)
Country | Link |
---|---|
US (2) | US10950474B2 (en) |
JP (1) | JP6829118B2 (en) |
KR (1) | KR20190129871A (en) |
CN (2) | CN110418691B (en) |
SG (1) | SG11201907780UA (en) |
TW (1) | TW201843000A (en) |
WO (1) | WO2018168002A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6887234B2 (en) * | 2016-09-21 | 2021-06-16 | 株式会社日本製鋼所 | Laser irradiation device, laser irradiation method, and manufacturing method of semiconductor device |
KR102041044B1 (en) * | 2018-04-30 | 2019-11-05 | 피에스케이홀딩스 주식회사 | Unit for Supporting Substrate |
JP7249814B2 (en) * | 2019-03-04 | 2023-03-31 | 株式会社Screenホールディングス | Heat treatment apparatus and heat treatment method |
JP7437187B2 (en) * | 2020-02-26 | 2024-02-22 | Jswアクティナシステム株式会社 | Levitation conveyance device and laser processing device |
US20220139755A1 (en) * | 2020-10-30 | 2022-05-05 | Samsung Electronics Co., Ltd. | Semiconductor manufacturing apparatus and chip handling method |
US20240120198A1 (en) * | 2021-01-29 | 2024-04-11 | Jsw Aktina System Co., Ltd. | Conveyance apparatus, conveyance method, and method for manufacturing semiconductor device |
WO2023095188A1 (en) * | 2021-11-24 | 2023-06-01 | Jswアクティナシステム株式会社 | Laser irradiation device, laser irradiation method, and method for manufacturing semiconductor device |
Family Cites Families (27)
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JPS61112843U (en) | 1984-12-28 | 1986-07-17 | ||
JP2768867B2 (en) * | 1991-03-29 | 1998-06-25 | 株式会社日立製作所 | Vacuum chuck device |
JPH0516088A (en) * | 1991-07-11 | 1993-01-26 | Nec Corp | Suction type holding tool |
JP3211428B2 (en) * | 1992-11-04 | 2001-09-25 | 株式会社村田製作所 | Dicing equipment |
JPH06339829A (en) * | 1993-05-31 | 1994-12-13 | Hirata Kiko Kk | Vacuum sucking table |
JPH0750336A (en) * | 1993-08-04 | 1995-02-21 | Hitachi Ltd | Differential suction type vacuum chuck |
JPH1074824A (en) | 1996-08-30 | 1998-03-17 | Nec Kansai Ltd | Vacuum chuck stage for wafer |
US6514339B1 (en) * | 1999-10-29 | 2003-02-04 | Lg. Philips Co., Ltd. | Laser annealing apparatus |
US6939206B2 (en) * | 2001-03-12 | 2005-09-06 | Asm Nutool, Inc. | Method and apparatus of sealing wafer backside for full-face electrochemical plating |
TWI226303B (en) * | 2002-04-18 | 2005-01-11 | Olympus Corp | Substrate carrying device |
JP4354873B2 (en) * | 2004-06-04 | 2009-10-28 | パナソニック株式会社 | Electronic component mounting tool |
TWI241976B (en) * | 2004-05-27 | 2005-10-21 | Quanta Display Inc | Substrate transporting apparatus |
JP4511903B2 (en) * | 2004-10-20 | 2010-07-28 | 株式会社ディスコ | Wafer divider |
JP2006310697A (en) | 2005-05-02 | 2006-11-09 | Dainippon Screen Mfg Co Ltd | Vacuum chuck |
US20070076345A1 (en) * | 2005-09-20 | 2007-04-05 | Bang Won B | Substrate placement determination using substrate backside pressure measurement |
US20090031955A1 (en) * | 2007-07-30 | 2009-02-05 | Applied Materials, Inc. | Vacuum chucking heater of axisymmetrical and uniform thermal profile |
KR101142290B1 (en) * | 2007-12-21 | 2012-05-07 | 미쓰보시 다이야몬도 고교 가부시키가이샤 | Laser processing apparatus and laser processing method |
KR101168863B1 (en) * | 2009-02-23 | 2012-07-30 | 가부시키가이샤 소딕 | Colored ceramic vacuum chuck and manufacturing method thereof |
JP4916035B2 (en) * | 2009-08-28 | 2012-04-11 | 東京エレクトロン株式会社 | Substrate transport apparatus and substrate transport method |
JP5877005B2 (en) | 2011-07-29 | 2016-03-02 | 株式会社Screenホールディングス | Substrate processing apparatus, substrate holding apparatus, and substrate holding method |
JP5871366B2 (en) * | 2011-10-25 | 2016-03-01 | 東レエンジニアリング株式会社 | Levitation transfer device |
JP6082702B2 (en) * | 2011-12-28 | 2017-02-15 | 古河電気工業株式会社 | Substrate cutting jig, processing apparatus, and substrate cutting method |
KR20130131799A (en) * | 2012-05-24 | 2013-12-04 | 이상진 | Block for a vacuum chuck |
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JP5858438B2 (en) * | 2013-03-26 | 2016-02-10 | 株式会社日本製鋼所 | Method of manufacturing annealed object, laser annealing base and laser annealing apparatus |
JP6560198B2 (en) * | 2014-05-12 | 2019-08-14 | 株式会社日本製鋼所 | Laser annealing apparatus, continuous conveyance path for laser annealing treatment, and laser annealing treatment method |
KR102440560B1 (en) * | 2015-11-03 | 2022-09-06 | 삼성디스플레이 주식회사 | Laser crystalling apparatus |
-
2017
- 2017-03-16 JP JP2017050811A patent/JP6829118B2/en active Active
- 2017-08-18 KR KR1020197027265A patent/KR20190129871A/en unknown
- 2017-08-18 US US16/485,419 patent/US10950474B2/en active Active
- 2017-08-18 CN CN201780088210.2A patent/CN110418691B/en active Active
- 2017-08-18 SG SG11201907780UA patent/SG11201907780UA/en unknown
- 2017-08-18 CN CN202210054870.1A patent/CN114393295A/en active Pending
- 2017-08-18 WO PCT/JP2017/029617 patent/WO2018168002A1/en active Application Filing
- 2017-09-15 TW TW106131779A patent/TW201843000A/en unknown
-
2021
- 2021-02-05 US US17/168,536 patent/US11676831B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20200006096A1 (en) | 2020-01-02 |
US20210159100A1 (en) | 2021-05-27 |
US11676831B2 (en) | 2023-06-13 |
JP6829118B2 (en) | 2021-02-10 |
KR20190129871A (en) | 2019-11-20 |
US10950474B2 (en) | 2021-03-16 |
CN114393295A (en) | 2022-04-26 |
CN110418691B (en) | 2022-02-15 |
WO2018168002A1 (en) | 2018-09-20 |
TW201843000A (en) | 2018-12-16 |
JP2018157000A (en) | 2018-10-04 |
CN110418691A (en) | 2019-11-05 |
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