SG11201804810QA - Process for obtaining thick ordered films with increased periods comprising a block copolymer - Google Patents
Process for obtaining thick ordered films with increased periods comprising a block copolymerInfo
- Publication number
- SG11201804810QA SG11201804810QA SG11201804810QA SG11201804810QA SG11201804810QA SG 11201804810Q A SG11201804810Q A SG 11201804810QA SG 11201804810Q A SG11201804810Q A SG 11201804810QA SG 11201804810Q A SG11201804810Q A SG 11201804810QA SG 11201804810Q A SG11201804810Q A SG 11201804810QA
- Authority
- SG
- Singapore
- Prior art keywords
- international
- obtaining thick
- block copolymer
- increased periods
- ordered films
- Prior art date
Links
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F297/00—Macromolecular compounds obtained by successively polymerising different monomer systems using a catalyst of the ionic or coordination type without deactivating the intermediate polymer
- C08F297/02—Macromolecular compounds obtained by successively polymerising different monomer systems using a catalyst of the ionic or coordination type without deactivating the intermediate polymer using a catalyst of the anionic type
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F297/00—Macromolecular compounds obtained by successively polymerising different monomer systems using a catalyst of the ionic or coordination type without deactivating the intermediate polymer
- C08F297/02—Macromolecular compounds obtained by successively polymerising different monomer systems using a catalyst of the ionic or coordination type without deactivating the intermediate polymer using a catalyst of the anionic type
- C08F297/026—Macromolecular compounds obtained by successively polymerising different monomer systems using a catalyst of the ionic or coordination type without deactivating the intermediate polymer using a catalyst of the anionic type polymerising acrylic acid, methacrylic acid or derivatives thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2014—Contact or film exposure of light sensitive plates such as lithographic plates or circuit boards, e.g. in a vacuum frame
- G03F7/2016—Contact mask being integral part of the photosensitive element and subject to destructive removal during post-exposure processing
Abstract
INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property -' Organization International Bureau res., 00) (43) International Publication Date .... .....r ,„„01 22 June 2017(22.06.2017) WIPO I PCT ID Hit (10) WO 1111111111111111111111111111 International III 2017/103082 III III Publication IIIIIIIIIIIIIIIIIII Number Al RIIIIIIIIIIIIIII (51) International Patent Classification: AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, GO3F 7/00 (2006.01) C08L 53/00 (2006.01) BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, (21) International Application Number: HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, PCT/EP2016/081395 KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, (22) International Filing Date: MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, 16 December 2016 (16.12.2016) NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, (25) Filing Language: English TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, (26) Publication Language: English ZA, ZM, ZW. (30) Priority Data: (84) Designated States (unless otherwise indicated, for every 15.62781 18 December 2015 (18.12.2015) FR kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, (71) Applicant: ARKEMA FRANCE [FR/FR]; 420 rue d'Es- TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, tienne d'Orves, 92700 Colombes (FR). TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, (72) Inventors: NAVARRO, Christophe; 15 allee de Segure, 64100 Bayonne (FR). NICOLET, Celia; 4, Chemin du LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, Petit Pre, 64230 Sauvagnon (FR) CHEVALIER, Xavier; SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, 1, Boulevard Joseph Vallier, 38100 Grenoble (FR). GW, KM, ML, MR, NE, SN, TD, TG). (74) Agent: LE CROM, Christophe; 420, me d'Estienne Published: d'Orves, 92705 Colombes Cedex (FR). — with international search report (Art 21(3)) (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, 1-1 .4t ei cc O o en (54) Title: PROCESS FOR OBTAINING THICK ORDERED FILMS WITH INCREASED PERIODS COMPRISING A BLOCK - COPOLYMER L .-- (57) : Process for obtaining thick ordered films with increased periods comprising a block copolymer The present invention ::::, relates to a process for obtaining thick ordered films (typically > 20nm) with increased periods (typically > 1 Onm) on a nanometric ei scale of a composition comprising a block copolymer (BCP) deposited on a surface without degradation of the other critical structur- 0 ing parameters (kinetics, structuring defects, critical dimension uniformity), this being whatever the orientation (perpendicular to the ,1 . substrate, parallel to the substrate, etc.); this composition having a product x effective*N (with x effective = Flory-Huggins parameter between two blocks under consideration, and N the total degree of polymerization of these two blocks)of between 0.5 and 40.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1562781A FR3045644A1 (en) | 2015-12-18 | 2015-12-18 | PROCESS FOR OBTAINING THICK ORDERED FILMS AND HIGH PERIODS COMPRISING A BLOCK COPOLYMER |
PCT/EP2016/081395 WO2017103082A1 (en) | 2015-12-18 | 2016-12-16 | Process for obtaining thick ordered films with increased periods comprising a block copolymer |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201804810QA true SG11201804810QA (en) | 2018-07-30 |
Family
ID=55451378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201804810QA SG11201804810QA (en) | 2015-12-18 | 2016-12-16 | Process for obtaining thick ordered films with increased periods comprising a block copolymer |
Country Status (9)
Country | Link |
---|---|
US (1) | US20180364562A1 (en) |
EP (1) | EP3391143A1 (en) |
JP (1) | JP2019507199A (en) |
KR (1) | KR20180095667A (en) |
CN (1) | CN108369373A (en) |
FR (1) | FR3045644A1 (en) |
SG (1) | SG11201804810QA (en) |
TW (1) | TWI658074B (en) |
WO (1) | WO2017103082A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3045645B1 (en) * | 2015-12-18 | 2019-07-05 | Arkema France | METHOD OF REDUCING DEFECTS IN ORDINATED BLOCK COPOLYMER FILM |
FR3045642A1 (en) * | 2015-12-18 | 2017-06-23 | Arkema France | METHOD FOR REDUCING THE STRUCTURING TIME OF ORDINATED BLOCK COPOLYMER FILMS |
FR3045643A1 (en) * | 2015-12-18 | 2017-06-23 | Arkema France | METHOD FOR ENHANCING THE CRITICAL DIMENSIONAL UNIFORMITY OF ORDINATED BLOCK COPOLYMER FILMS |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8193285B2 (en) * | 2006-05-16 | 2012-06-05 | Nippon Soda Co., Ltd. | Block copolymers |
US8398868B2 (en) * | 2009-05-19 | 2013-03-19 | International Business Machines Corporation | Directed self-assembly of block copolymers using segmented prepatterns |
JP2010283928A (en) * | 2009-06-02 | 2010-12-16 | Kuraray Co Ltd | Polymer transducer |
US8349203B2 (en) * | 2009-09-04 | 2013-01-08 | International Business Machines Corporation | Method of forming self-assembled patterns using block copolymers, and articles thereof |
US8304493B2 (en) * | 2010-08-20 | 2012-11-06 | Micron Technology, Inc. | Methods of forming block copolymers |
US9580534B2 (en) * | 2011-07-29 | 2017-02-28 | Wisconsin Alumni Research Foundation | Block copolymer materials for directed assembly of thin films |
FR2983773B1 (en) * | 2011-12-09 | 2014-10-24 | Arkema France | PROCESS FOR PREPARING SURFACES |
JP5894445B2 (en) * | 2012-01-23 | 2016-03-30 | 東京エレクトロン株式会社 | Etching method and etching apparatus |
US8513356B1 (en) * | 2012-02-10 | 2013-08-20 | Dow Global Technologies Llc | Diblock copolymer blend composition |
US9005877B2 (en) * | 2012-05-15 | 2015-04-14 | Tokyo Electron Limited | Method of forming patterns using block copolymers and articles thereof |
US9012545B2 (en) * | 2012-08-31 | 2015-04-21 | Rohm And Haas Electronic Materials Llc | Composition and method for preparing pattern on a substrate |
CN104918984A (en) * | 2012-10-31 | 2015-09-16 | 陶氏环球技术有限责任公司 | Nanocomposites of copolymers and dielectric materials |
FR3008413B1 (en) * | 2013-07-11 | 2015-08-07 | Arkema France | PROCESS FOR PERPENDICULAR ORIENTATION OF NANODOMAINES OF BLOCK COPOLYMERS USING STATISTICAL OR GRADIENT COPOLYMERS WHERE THE MONOMERS ARE AT LEAST DIFFERENT FROM THOSE PRESENT SPECIFICALLY IN EACH BLOCK OF BLOCK COPOLYMER |
FR3008986B1 (en) * | 2013-07-25 | 2016-12-30 | Arkema France | METHOD OF CONTROLLING THE PERIOD CHARACTERIZING THE MORPHOLOGY OBTAINED FROM A MIXTURE OF BLOCK COPOLYMER AND (CO) POLYMER FROM ONE OF THE BLOCKS |
FR3014877B1 (en) * | 2013-12-17 | 2017-03-31 | Arkema France | METHOD FOR NANOSTRUCTURING A BLOCK COPOLYMER FILM FROM A NON-STRUCTURED BLOCK COPOLYMER BASED ON STYRENE AND METHYL METHACRYLATE, AND NANOSTRUCTURE BLOCK COPOLYMER FILM |
KR102364329B1 (en) * | 2014-01-16 | 2022-02-17 | 브레우어 사이언스, 인코포레이션 | High-chi block copolymers for directed self-assembly |
FR3022249B1 (en) * | 2014-06-11 | 2018-01-19 | Arkema France | METHOD FOR CONTROLLING THE PERIOD OF A NANOSTRUCTUE BLOCK COPOLYMER FILM BASED ON STYRENE AND METHYL METHACRYLATE, AND NANOSTRUCTURE BLOCK COPOLYMER FILM |
FR3045642A1 (en) * | 2015-12-18 | 2017-06-23 | Arkema France | METHOD FOR REDUCING THE STRUCTURING TIME OF ORDINATED BLOCK COPOLYMER FILMS |
FR3045645B1 (en) * | 2015-12-18 | 2019-07-05 | Arkema France | METHOD OF REDUCING DEFECTS IN ORDINATED BLOCK COPOLYMER FILM |
FR3045643A1 (en) * | 2015-12-18 | 2017-06-23 | Arkema France | METHOD FOR ENHANCING THE CRITICAL DIMENSIONAL UNIFORMITY OF ORDINATED BLOCK COPOLYMER FILMS |
-
2015
- 2015-12-18 FR FR1562781A patent/FR3045644A1/en active Pending
-
2016
- 2016-12-16 CN CN201680073926.0A patent/CN108369373A/en active Pending
- 2016-12-16 TW TW105141870A patent/TWI658074B/en not_active IP Right Cessation
- 2016-12-16 WO PCT/EP2016/081395 patent/WO2017103082A1/en active Application Filing
- 2016-12-16 US US16/062,513 patent/US20180364562A1/en not_active Abandoned
- 2016-12-16 EP EP16822939.1A patent/EP3391143A1/en not_active Withdrawn
- 2016-12-16 JP JP2018530688A patent/JP2019507199A/en active Pending
- 2016-12-16 SG SG11201804810QA patent/SG11201804810QA/en unknown
- 2016-12-16 KR KR1020187020582A patent/KR20180095667A/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
FR3045644A1 (en) | 2017-06-23 |
JP2019507199A (en) | 2019-03-14 |
EP3391143A1 (en) | 2018-10-24 |
TW201734102A (en) | 2017-10-01 |
US20180364562A1 (en) | 2018-12-20 |
WO2017103082A1 (en) | 2017-06-22 |
TWI658074B (en) | 2019-05-01 |
CN108369373A (en) | 2018-08-03 |
KR20180095667A (en) | 2018-08-27 |
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