SG11201709757VA - Methods, systems, and apparatuses for inspecting goods - Google Patents

Methods, systems, and apparatuses for inspecting goods

Info

Publication number
SG11201709757VA
SG11201709757VA SG11201709757VA SG11201709757VA SG11201709757VA SG 11201709757V A SG11201709757V A SG 11201709757VA SG 11201709757V A SG11201709757V A SG 11201709757VA SG 11201709757V A SG11201709757V A SG 11201709757VA SG 11201709757V A SG11201709757V A SG 11201709757VA
Authority
SG
Singapore
Prior art keywords
apparatuses
systems
methods
inspecting goods
inspecting
Prior art date
Application number
SG11201709757VA
Other languages
English (en)
Inventor
Yuanjing Li
Ziran Zhao
Yaohong Liu
Qili Wang
Qiang Li
Jianping Gu
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of SG11201709757VA publication Critical patent/SG11201709757VA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/13—Edge detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/40—Analysis of texture
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/46—Descriptors for shape, contour or point-related descriptors, e.g. scale invariant feature transform [SIFT] or bags of words [BoW]; Salient regional features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/626—Specific applications or type of materials radioactive material
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Image Analysis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Image Processing (AREA)
SG11201709757VA 2015-12-16 2016-08-31 Methods, systems, and apparatuses for inspecting goods SG11201709757VA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201510941150.7A CN106885813B (zh) 2015-12-16 2015-12-16 检查货物的方法、系统和装置
PCT/CN2016/097579 WO2017101514A1 (zh) 2015-12-16 2016-08-31 检查货物的方法、系统和装置

Publications (1)

Publication Number Publication Date
SG11201709757VA true SG11201709757VA (en) 2017-12-28

Family

ID=57083141

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201709757VA SG11201709757VA (en) 2015-12-16 2016-08-31 Methods, systems, and apparatuses for inspecting goods

Country Status (5)

Country Link
US (1) US10134123B2 (zh)
EP (1) EP3182335A3 (zh)
CN (1) CN106885813B (zh)
SG (1) SG11201709757VA (zh)
WO (1) WO2017101514A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108956657A (zh) * 2018-08-23 2018-12-07 深圳码隆科技有限公司 一种安检过程中液体识别方法及其装置
CN110705385B (zh) * 2019-09-12 2022-05-03 深兰科技（上海）有限公司 一种障碍物角度的检测方法、装置、设备及介质
WO2021119946A1 (en) 2019-12-16 2021-06-24 Mekitec Oy Food inspection solution
CN112364903A (zh) * 2020-10-30 2021-02-12 盛视科技股份有限公司 基于x光机的物品分析及多维图像关联方法与系统

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5367552A (en) * 1991-10-03 1994-11-22 In Vision Technologies, Inc. Automatic concealed object detection system having a pre-scan stage
US6018562A (en) * 1995-11-13 2000-01-25 The United States Of America As Represented By The Secretary Of The Army Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
US6069936A (en) * 1997-08-18 2000-05-30 Eg&G Astrophysics Material discrimination using single-energy x-ray imaging system
US7337686B2 (en) 2004-09-10 2008-03-04 Qylur Security Systems, Inc. Multi-threat detection system
US8600149B2 (en) 2008-08-25 2013-12-03 Telesecurity Sciences, Inc. Method and system for electronic inspection of baggage and cargo
EP2430396B1 (en) * 2009-05-16 2020-01-15 Rapiscan Systems, Inc. Systems and methods for automated, rapid detection of high-atomic-number materials
JP5685027B2 (ja) * 2010-09-07 2015-03-18 キヤノン株式会社 情報処理装置、物体把持システム、ロボットシステム、情報処理方法、物体把持方法およびプログラム
TW201344592A (zh) * 2012-04-27 2013-11-01 Altek Autotronics Corp 影像校正系統及其影像校正方法
WO2015036056A1 (en) * 2013-09-16 2015-03-19 Metaio Gmbh Method and system for determining a model of at least part of a real object
CN104750697B (zh) * 2013-12-27 2019-01-25 同方威视技术股份有限公司 基于透视图像内容的检索系统、检索方法以及安全检查设备
CN103744120A (zh) * 2013-12-30 2014-04-23 中云智慧（北京）科技有限公司 一种违禁品辅助鉴别方法及装置
DE102014205447A1 (de) 2014-03-24 2015-09-24 Smiths Heimann Gmbh Detektion von Gegenständen in einem Objekt
RU2690224C2 (ru) * 2014-04-03 2019-05-31 Конинклейке Филипс Н.В. Обследующее устройство для обработки и анализа изображения
US9633267B2 (en) * 2014-04-04 2017-04-25 Conduent Business Services, Llc Robust windshield detection via landmark localization
WO2015185629A2 (en) * 2014-06-06 2015-12-10 Lego A/S Interactive game apparatus and toy construction system
CN104181178B (zh) * 2014-08-18 2016-08-17 公安部第一研究所 一种通道式双视角x射线液态物品安全检查系统
CN104502381A (zh) * 2015-01-06 2015-04-08 安徽中福光电科技有限公司 一种解决通道式x光机实用性问题的“6331”方法
CN105068134B (zh) * 2015-07-29 2017-09-15 公安部第一研究所 一种利用x射线多视角图像探测鞋中藏匿危险品的方法
US20170061686A1 (en) * 2015-08-28 2017-03-02 Hai Yu Stage view presentation method and system
AU2016315938B2 (en) * 2015-08-31 2022-02-24 Cape Analytics, Inc. Systems and methods for analyzing remote sensing imagery
WO2017201486A1 (en) * 2016-05-19 2017-11-23 Simbe Robotics Inc. Method for automatically generating waypoints for imaging shelves within a store
US10650512B2 (en) * 2016-06-14 2020-05-12 The Regents Of The University Of Michigan Systems and methods for topographical characterization of medical image data

Also Published As

Publication number Publication date
WO2017101514A1 (zh) 2017-06-22
BR112017025624A2 (zh) 2018-08-07
CN106885813A (zh) 2017-06-23
CN106885813B (zh) 2019-06-07
EP3182335A2 (en) 2017-06-21
US10134123B2 (en) 2018-11-20
US20170178312A1 (en) 2017-06-22
EP3182335A3 (en) 2017-07-19

Similar Documents

Publication Publication Date Title
PL3171332T3 (pl) Sposoby i systemy do kontroli towarów
HK1246941A1 (zh) 訂單處理方法及系統
IL258804B (en) Systems and methods for adaptive detection - area of defects
IL257849A (en) Systems and methods for detecting and scoring anomalies
EP3266009A4 (en) Systems and methods for monitoring transported items
SG11201707096WA (en) Systems and methods for order pairing
PT3259386T (pt) Sistemas e métodos para desempenho de imunoensaios
HK1216218A2 (zh) 用於物品查找及定位的系統及方法
SG11201607652UA (en) Systems and methods for inspecting cargoes
EP3141432A4 (en) Inspection device, inspection system, and inspection method
GB201802233D0 (en) Defect discrimination apparatus, methods, and systems
GB201602881D0 (en) Item monitoring system and method
GB2542079B (en) Ranging measurement apparatus, methods, and systems
GB2545861B (en) Combined NMR-resistivity measurement apparatus, systems, and methods
SG11201607836WA (en) Inspection methods and systems
HK1252032A1 (zh) 測試系統和測試方法
HUE051034T2 (hu) Szenzorok szeleprendszerekhez, valamint hozzá tartozó szerkezetek, rendszerek és eljárások
SG10201500398VA (en) Systems and Methods for Creating and Evaluating Experiments
GB2542905B (en) Systems, devices, and methods for providing passenger transport
SG10201505793RA (en) Methods and systems for ranking merchants
HK1255058A1 (zh) 用於與帳戶交互的系統、設備和方法
HK1211703A1 (zh) 檢查設備、方法和系統
SG11201709757VA (en) Methods, systems, and apparatuses for inspecting goods
GB2547173B (en) Blade-mounted sensor apparatus, systems, and methods
GB201714215D0 (en) Formation property measurement apparatus, methods, and systems