SG11201702791TA - Flip-flop circuit, method of controlling a flip-flop circuit and memory device - Google Patents

Flip-flop circuit, method of controlling a flip-flop circuit and memory device

Info

Publication number
SG11201702791TA
SG11201702791TA SG11201702791TA SG11201702791TA SG11201702791TA SG 11201702791T A SG11201702791T A SG 11201702791TA SG 11201702791T A SG11201702791T A SG 11201702791TA SG 11201702791T A SG11201702791T A SG 11201702791TA SG 11201702791T A SG11201702791T A SG 11201702791TA
Authority
SG
Singapore
Prior art keywords
flip
flop circuit
controlling
memory device
flop
Prior art date
Application number
SG11201702791TA
Inventor
Huey Chian Foong
Original Assignee
Agency Science Tech & Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency Science Tech & Res filed Critical Agency Science Tech & Res
Priority to SG11201702791TA priority Critical patent/SG11201702791TA/en
Publication of SG11201702791TA publication Critical patent/SG11201702791TA/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1673Reading or sensing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1659Cell access
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1675Writing or programming circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/165Auxiliary circuits
    • G11C11/1693Timing circuits or methods
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
SG11201702791TA 2014-10-15 2015-10-15 Flip-flop circuit, method of controlling a flip-flop circuit and memory device SG11201702791TA (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG11201702791TA SG11201702791TA (en) 2014-10-15 2015-10-15 Flip-flop circuit, method of controlling a flip-flop circuit and memory device

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SG10201406633X 2014-10-15
PCT/SG2015/050390 WO2016060617A1 (en) 2014-10-15 2015-10-15 Flip-flop circuit, method of controlling a flip-flop circuit and memory device
SG11201702791TA SG11201702791TA (en) 2014-10-15 2015-10-15 Flip-flop circuit, method of controlling a flip-flop circuit and memory device

Publications (1)

Publication Number Publication Date
SG11201702791TA true SG11201702791TA (en) 2017-05-30

Family

ID=55747028

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201702791TA SG11201702791TA (en) 2014-10-15 2015-10-15 Flip-flop circuit, method of controlling a flip-flop circuit and memory device

Country Status (3)

Country Link
US (1) US10043563B2 (en)
SG (1) SG11201702791TA (en)
WO (1) WO2016060617A1 (en)

Families Citing this family (16)

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Publication number Priority date Publication date Assignee Title
US20170263299A1 (en) * 2016-03-11 2017-09-14 Kabushiki Kaisha Toshiba Semiconductor memory device
DE102016121696A1 (en) 2016-11-11 2018-05-17 Tesat-Spacecom Gmbh & Co.Kg Tristate-capable cross-flow-free output buffer
US10348306B2 (en) * 2017-03-09 2019-07-09 University Of Utah Research Foundation Resistive random access memory based multiplexers and field programmable gate arrays
US10510401B2 (en) * 2017-05-22 2019-12-17 Taiwan Semicondutor Manufacturing Company Limited Semiconductor memory device using shared data line for read/write operation
US20200144293A1 (en) * 2017-09-12 2020-05-07 Intel Corporation Ferroelectric field effect transistors (fefets) having ambipolar channels
US10777566B2 (en) 2017-11-10 2020-09-15 Macronix International Co., Ltd. 3D array arranged for memory and in-memory sum-of-products operations
US10957392B2 (en) 2018-01-17 2021-03-23 Macronix International Co., Ltd. 2D and 3D sum-of-products array for neuromorphic computing system
US10719296B2 (en) 2018-01-17 2020-07-21 Macronix International Co., Ltd. Sum-of-products accelerator array
US11138497B2 (en) 2018-07-17 2021-10-05 Macronix International Co., Ltd In-memory computing devices for neural networks
US11450385B2 (en) * 2018-09-20 2022-09-20 University Of Utah Research Foundation Digital RRAM-based convolutional block
US11636325B2 (en) 2018-10-24 2023-04-25 Macronix International Co., Ltd. In-memory data pooling for machine learning
US11562229B2 (en) 2018-11-30 2023-01-24 Macronix International Co., Ltd. Convolution accelerator using in-memory computation
US11934480B2 (en) 2018-12-18 2024-03-19 Macronix International Co., Ltd. NAND block architecture for in-memory multiply-and-accumulate operations
US11119674B2 (en) * 2019-02-19 2021-09-14 Macronix International Co., Ltd. Memory devices and methods for operating the same
US10783963B1 (en) 2019-03-08 2020-09-22 Macronix International Co., Ltd. In-memory computation device with inter-page and intra-page data circuits
US11132176B2 (en) 2019-03-20 2021-09-28 Macronix International Co., Ltd. Non-volatile computing method in flash memory

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3471838A (en) 1965-06-21 1969-10-07 Magnavox Co Simultaneous read and write memory configuration
EP0475588B1 (en) * 1990-08-17 1996-06-26 STMicroelectronics, Inc. A semiconductor memory with inhibited test mode entry during power-up
JP4543632B2 (en) * 2003-08-07 2010-09-15 日本電気株式会社 Liquid crystal display device and liquid crystal display device driving method
JP5201487B2 (en) * 2007-12-06 2013-06-05 日本電気株式会社 Nonvolatile latch circuit
WO2010007173A1 (en) 2008-07-17 2010-01-21 Universite Paris Sud (Paris 11) A new sense amplifier circuit
US8400822B2 (en) 2010-03-22 2013-03-19 Qualcomm Incorporated Multi-port non-volatile memory that includes a resistive memory element
US8531907B2 (en) 2011-01-28 2013-09-10 Infineon Technologies Ag Semiconductor memory device and method
TWI546784B (en) * 2014-04-30 2016-08-21 聯詠科技股份有限公司 Gate driving circuit and driving method thereof

Also Published As

Publication number Publication date
US20170243624A1 (en) 2017-08-24
US10043563B2 (en) 2018-08-07
WO2016060617A1 (en) 2016-04-21

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