SG11201607219PA - Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications - Google Patents

Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications

Info

Publication number
SG11201607219PA
SG11201607219PA SG11201607219PA SG11201607219PA SG11201607219PA SG 11201607219P A SG11201607219P A SG 11201607219PA SG 11201607219P A SG11201607219P A SG 11201607219PA SG 11201607219P A SG11201607219P A SG 11201607219PA SG 11201607219P A SG11201607219P A SG 11201607219PA
Authority
SG
Singapore
Prior art keywords
electronic devices
probe card
testing apparatus
temperature applications
extreme temperature
Prior art date
Application number
SG11201607219PA
Inventor
Riccardo Liberini
Raffaele Vallauri
Giuseppe Crippa
Original Assignee
Technoprobe Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technoprobe Spa filed Critical Technoprobe Spa
Publication of SG11201607219PA publication Critical patent/SG11201607219PA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
SG11201607219PA 2014-03-06 2015-03-05 Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications SG11201607219PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ITMI20140350 2014-03-06
PCT/IB2015/051606 WO2015132748A1 (en) 2014-03-06 2015-03-05 Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications

Publications (1)

Publication Number Publication Date
SG11201607219PA true SG11201607219PA (en) 2016-09-29

Family

ID=50733156

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201607219PA SG11201607219PA (en) 2014-03-06 2015-03-05 Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications

Country Status (10)

Country Link
US (1) US10509056B2 (en)
EP (1) EP3114489B1 (en)
JP (1) JP6637909B2 (en)
KR (1) KR102251299B1 (en)
CN (1) CN107533100B (en)
MY (1) MY177187A (en)
PH (1) PH12016501753A1 (en)
SG (1) SG11201607219PA (en)
TW (1) TWI655438B (en)
WO (1) WO2015132748A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015132747A1 (en) * 2014-03-06 2015-09-11 Technoprobe S.P.A. High-planarity probe card for a testing apparatus for electronic devices
TWI783074B (en) * 2017-11-09 2022-11-11 義大利商探針科技公司 Contact probe for a testing head for testing high-frequency devices
JP7129261B2 (en) * 2018-07-27 2022-09-01 キオクシア株式会社 test equipment
TWI679427B (en) * 2018-10-01 2019-12-11 巨擘科技股份有限公司 Probe card device
US11933816B2 (en) * 2019-03-20 2024-03-19 Celadon Systems, Inc. Portable probe card assembly
DE102019002342A1 (en) * 2019-03-29 2020-10-01 Yamaichi Electronics Deutschland Gmbh Test device and use of the test device
EP3959524A4 (en) 2019-04-26 2023-01-18 FormFactor, Inc. Probe on carrier architecture for vertical probe arrays
TWI750552B (en) * 2019-12-16 2021-12-21 旺矽科技股份有限公司 Positionable probe card and manufacturing method thereof
KR102342806B1 (en) * 2020-03-30 2021-12-23 (주)포인트엔지니어링 Probe head and probe card having the same
KR102393600B1 (en) * 2020-09-11 2022-05-03 스테코 주식회사 Probe card
KR102210841B1 (en) * 2020-10-27 2021-02-02 (주)샘씨엔에스 Ceramic substrate for probe card with low thermal expansion characteristic
CN116811040B (en) * 2023-08-26 2023-11-10 江苏鹏利芝达恩半导体有限公司 Method, apparatus and storage medium for manufacturing ceramic rod for manufacturing vertical probe card

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3715160B2 (en) * 1999-12-02 2005-11-09 株式会社ルネサステクノロジ Probing apparatus and semiconductor device manufacturing method
US6756797B2 (en) * 2001-01-31 2004-06-29 Wentworth Laboratories Inc. Planarizing interposer for thermal compensation of a probe card
US6677771B2 (en) * 2001-06-20 2004-01-13 Advantest Corp. Probe contact system having planarity adjustment mechanism
US7640651B2 (en) * 2003-12-31 2010-01-05 Microfabrica Inc. Fabrication process for co-fabricating multilayer probe array and a space transformer
JP2005010052A (en) * 2003-06-19 2005-01-13 Japan Electronic Materials Corp Probe card
JP2005345443A (en) * 2004-06-07 2005-12-15 Japan Electronic Materials Corp Contact pin for probe card and probe card employing it
US7285968B2 (en) * 2005-04-19 2007-10-23 Formfactor, Inc. Apparatus and method for managing thermally induced motion of a probe card assembly
WO2007142204A1 (en) * 2006-06-08 2007-12-13 Nhk Spring Co., Ltd. Probe card
US7471078B2 (en) * 2006-12-29 2008-12-30 Formfactor, Inc. Stiffener assembly for use with testing devices
KR100806736B1 (en) * 2007-05-11 2008-02-27 주식회사 에이엠에스티 Probe card and method for fabricating the same
US20100207652A1 (en) * 2007-10-08 2010-08-19 Amst Co., Ltd. Method for wafer test and probe card for the same
DE102008034918B4 (en) * 2008-07-26 2012-09-27 Feinmetall Gmbh Electrical test equipment for testing an electrical device under test and electrical test method
US8305101B2 (en) * 2009-02-19 2012-11-06 Advantest America, Inc Microelectronic contactor assembly, structures thereof, and methods of constructing same
JP2012047674A (en) * 2010-08-30 2012-03-08 Advantest Corp Dicing substrate for test, probe, and semiconductor wafer testing apparatus
JP2012093328A (en) * 2010-10-22 2012-05-17 Isao Kimoto Probe card
JP5629723B2 (en) * 2012-04-12 2014-11-26 株式会社アドバンテスト Semiconductor wafer testing method

Also Published As

Publication number Publication date
KR20160130464A (en) 2016-11-11
JP2017515126A (en) 2017-06-08
MY177187A (en) 2020-09-09
CN107533100B (en) 2021-01-22
TWI655438B (en) 2019-04-01
US20160377656A1 (en) 2016-12-29
KR102251299B1 (en) 2021-05-13
PH12016501753B1 (en) 2016-11-07
EP3114489A1 (en) 2017-01-11
WO2015132748A1 (en) 2015-09-11
US10509056B2 (en) 2019-12-17
CN107533100A (en) 2018-01-02
PH12016501753A1 (en) 2016-11-07
JP6637909B2 (en) 2020-01-29
EP3114489B1 (en) 2018-08-01
TW201534931A (en) 2015-09-16

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