SG11201402855QA - Method for examination of a sample by means of the heat flow thermography - Google Patents

Method for examination of a sample by means of the heat flow thermography

Info

Publication number
SG11201402855QA
SG11201402855QA SG11201402855QA SG11201402855QA SG11201402855QA SG 11201402855Q A SG11201402855Q A SG 11201402855QA SG 11201402855Q A SG11201402855Q A SG 11201402855QA SG 11201402855Q A SG11201402855Q A SG 11201402855QA SG 11201402855Q A SG11201402855Q A SG 11201402855QA
Authority
SG
Singapore
Prior art keywords
examination
sample
heat flow
flow thermography
thermography
Prior art date
Application number
SG11201402855QA
Inventor
Haymo Lang
Jochen Mielke
Original Assignee
Dcg Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dcg Systems Inc filed Critical Dcg Systems Inc
Publication of SG11201402855QA publication Critical patent/SG11201402855QA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
SG11201402855QA 2011-12-10 2012-12-10 Method for examination of a sample by means of the heat flow thermography SG11201402855QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102011120808 2011-12-10
PCT/EP2012/074982 WO2013083846A1 (en) 2011-12-10 2012-12-10 Method for examination of a sample by means of the heat flow thermography

Publications (1)

Publication Number Publication Date
SG11201402855QA true SG11201402855QA (en) 2014-10-30

Family

ID=47435912

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201402855QA SG11201402855QA (en) 2011-12-10 2012-12-10 Method for examination of a sample by means of the heat flow thermography

Country Status (7)

Country Link
US (1) US9816866B2 (en)
EP (1) EP2788742A1 (en)
JP (1) JP2015500476A (en)
KR (1) KR20140091784A (en)
CN (1) CN104145184A (en)
SG (1) SG11201402855QA (en)
WO (1) WO2013083846A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2743688B1 (en) 2012-12-17 2017-05-03 Thermosensorik Gmbh Method and system for the examination of a sample by means of thermography
EP2952884B1 (en) 2014-06-04 2019-07-03 DCG Systems GmbH Method for examination of a sample by means of the lock-in thermography
US10750153B2 (en) 2014-09-22 2020-08-18 Samsung Electronics Company, Ltd. Camera system for three-dimensional video
JP6539139B2 (en) * 2015-07-21 2019-07-03 Ｊｆｅテクノリサーチ株式会社 Image processing method for infrared image data and infrared image processing apparatus
JP6933613B2 (en) * 2017-08-10 2021-09-08 Ｊｆｅテクノリサーチ株式会社 Temperature distribution measuring device and temperature distribution measuring method
JP7006104B2 (en) * 2017-10-03 2022-01-24 株式会社デンソー Airflow measuring device
CN108051093A (en) * 2017-12-02 2018-05-18 北京工业大学 For the infrared thermal imaging temp measuring method in IGBT module temperature field in probe power circulation experiment
BR102018012268B1 (en) * 2018-06-15 2021-09-14 Universidade Federal De Santa Catarina -Ufsc SYSTEM FOR INSPECTING A REPAIR OR JOINT OF COMPOUND MATERIAL APPLIED TO A STRUCTURE
JP7065060B2 (en) 2018-08-20 2022-05-11 Ｊｆｅテクノリサーチ株式会社 Fluid flow measuring device and gas detecting device

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6367969B1 (en) 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
US6751342B2 (en) * 1999-12-02 2004-06-15 Thermal Wave Imaging, Inc. System for generating thermographic images using thermographic signal reconstruction
US7724925B2 (en) * 1999-12-02 2010-05-25 Thermal Wave Imaging, Inc. System for generating thermographic images using thermographic signal reconstruction
DE10150633C5 (en) 2001-10-12 2014-09-04 Thermosensorik Gmbh Method and device for non-contact, non-destructive automatic testing of material connections, in particular the quality control of welded joints
KR20040103918A (en) 2002-01-23 2004-12-09 마리나 시스템 코포레이션 Infrared thermography for defect detection and analysis
JP3940335B2 (en) 2002-08-05 2007-07-04 ▲隆▼英 阪上 Defect inspection method and apparatus
US7186981B2 (en) 2003-07-29 2007-03-06 Thermal Wave Imaging, Inc. Method and apparatus for thermographic imaging using flash pulse truncation
WO2006023212A2 (en) 2004-07-26 2006-03-02 Thermal Wave Imaging Infrared camera measurement correction for pulsed excitation with subframe duration
EP1852697B1 (en) * 2004-10-04 2010-12-22 Siemens Aktiengesellschaft Method for determing material parameters of an object from temperature-versus-time (t-t) data
DE102006043339B4 (en) 2006-09-15 2010-11-11 Siemens Ag Method and device for determining component wall thicknesses by means of thermography
RU2343465C1 (en) 2007-06-04 2009-01-10 Государственное образовательное учреждение высшего профессионального образования "Тамбовский государственный технический университет "ГОУ ВПО "ТГТУ" Method of noncontact nondestructive control of materials thermophysical properties

Also Published As

Publication number Publication date
WO2013083846A1 (en) 2013-06-13
US20140328370A1 (en) 2014-11-06
KR20140091784A (en) 2014-07-22
US9816866B2 (en) 2017-11-14
CN104145184A (en) 2014-11-12
JP2015500476A (en) 2015-01-05
EP2788742A1 (en) 2014-10-15

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