SG11201504790SA - Method and system for the examination of a sample by means of thermography - Google Patents

Method and system for the examination of a sample by means of thermography

Info

Publication number
SG11201504790SA
SG11201504790SA SG11201504790SA SG11201504790SA SG11201504790SA SG 11201504790S A SG11201504790S A SG 11201504790SA SG 11201504790S A SG11201504790S A SG 11201504790SA SG 11201504790S A SG11201504790S A SG 11201504790SA SG 11201504790S A SG11201504790S A SG 11201504790SA
Authority
SG
Singapore
Prior art keywords
thermography
examination
sample
Prior art date
Application number
SG11201504790SA
Inventor
Hans Heissenstein
Peter Stolz
Raiko Meinhardt
Original Assignee
Thermosensorik Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermosensorik Gmbh filed Critical Thermosensorik Gmbh
Publication of SG11201504790SA publication Critical patent/SG11201504790SA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/76—Circuitry for compensating brightness variation in the scene by influencing the image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48—Thermography; Techniques using wholly visual means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image
SG11201504790SA 2012-12-17 2013-11-13 Method and system for the examination of a sample by means of thermography SG11201504790SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP12197611.2A EP2743688B1 (en) 2012-12-17 2012-12-17 Method and system for the examination of a sample by means of thermography
PCT/EP2013/073757 WO2014095170A1 (en) 2012-12-17 2013-11-13 Method and system for the examination of a sample by means of thermography

Publications (1)

Publication Number Publication Date
SG11201504790SA true SG11201504790SA (en) 2015-07-30

Family

ID=47630101

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201504790SA SG11201504790SA (en) 2012-12-17 2013-11-13 Method and system for the examination of a sample by means of thermography

Country Status (6)

Country Link
US (1) US9905014B2 (en)
EP (1) EP2743688B1 (en)
JP (1) JP6301951B2 (en)
DE (1) DE112013006039T5 (en)
SG (1) SG11201504790SA (en)
WO (1) WO2014095170A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2743688B1 (en) 2012-12-17 2017-05-03 Thermosensorik Gmbh Method and system for the examination of a sample by means of thermography
US10094823B2 (en) 2015-01-23 2018-10-09 Tokitae Llc Photothermal spectroscopy assay readers, and related assay kits and methods
US9625385B2 (en) * 2015-02-24 2017-04-18 Tokitae Llc Photothermal spectroscopy systems for offset synchronous testing of flow assays and methods of using same
JP6539139B2 (en) * 2015-07-21 2019-07-03 Ｊｆｅテクノリサーチ株式会社 Image processing method for infrared image data and infrared image processing apparatus
DE102015118856B3 (en) * 2015-11-04 2016-08-18 Netzsch-Gerätebau GmbH Method and device for the photothermal examination of a sample
US10033910B2 (en) 2016-04-15 2018-07-24 General Electric Company Synchronous sampling methods for infrared cameras
AT520007B1 (en) * 2017-05-16 2019-09-15 Res Center For Non Destructive Testing Gmbh thermography method
DE102017212681A1 (en) * 2017-07-24 2019-01-24 Skz-Kfe Ggmbh Method and device for nondestructive testing of an object
US11175127B2 (en) 2017-11-13 2021-11-16 Illumina, Inc. System and method for large sample analysis of thin film
JP7000932B2 (en) * 2018-03-13 2022-01-19 トヨタ自動車株式会社 How to identify the abnormal part of the battery
US10710615B2 (en) * 2018-06-05 2020-07-14 The Boeing Company In-motion high-speed non-destructive evaluation for railcar axles
US11435305B2 (en) 2018-12-19 2022-09-06 General Electric Company Thermographic inspection system mounted on motorized apparatus and methods of using same
US11278990B2 (en) * 2019-07-30 2022-03-22 GM Global Technology Operations LLC Weld inspection system and method
US11006053B2 (en) * 2019-07-30 2021-05-11 GM Global Technology Operations LLC Weld inspection system and method
CN111208169A (en) * 2020-02-20 2020-05-29 四川省特种设备检验研究院 Pulse eddy current thermal imaging defect detection method suitable for natural cracks
JP7282238B2 (en) 2020-06-23 2023-05-26 Ｓｅｍｉｔｅｃ株式会社 Thermal conductivity measuring device and thermal conductivity measuring method
CN112801956B (en) * 2021-01-18 2022-04-05 南京工业大学 High-resolution image reconstruction and state evaluation method for marine corrosion under paint layer
DE102021113128A1 (en) 2021-05-20 2022-11-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Method and identification device for detecting a component identification of a component
CN114324472B (en) * 2022-01-26 2023-06-23 首都师范大学 Method for quantitatively measuring thickness or defect depth of sample by square wave infrared thermal imaging

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US4792683A (en) * 1987-01-16 1988-12-20 Hughes Aircraft Company Thermal technique for simultaneous testing of circuit board solder joints
US6394646B1 (en) * 1999-04-16 2002-05-28 General Electric Company Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography
US6367969B1 (en) 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
US7724925B2 (en) * 1999-12-02 2010-05-25 Thermal Wave Imaging, Inc. System for generating thermographic images using thermographic signal reconstruction
WO2003062809A1 (en) * 2002-01-23 2003-07-31 Marena Systems Corporation Infrared thermography for defect detection and analysis
US7220966B2 (en) * 2003-07-29 2007-05-22 Toyota Motor Manufacturing North America, Inc. Systems and methods for inspecting coatings, surfaces and interfaces
US7186981B2 (en) * 2003-07-29 2007-03-06 Thermal Wave Imaging, Inc. Method and apparatus for thermographic imaging using flash pulse truncation
WO2006023212A2 (en) * 2004-07-26 2006-03-02 Thermal Wave Imaging Infrared camera measurement correction for pulsed excitation with subframe duration
US8581975B2 (en) * 2006-06-16 2013-11-12 Worcester Polytechnic Institute Infrared defect detection system and method for the evaluation of powdermetallic compacts
DE102006043339B4 (en) 2006-09-15 2010-11-11 Siemens Ag Method and device for determining component wall thicknesses by means of thermography
DE102006061794B3 (en) * 2006-12-21 2008-04-30 Thermosensorik Gmbh Welded joint i.e. welded point, checking method, involves examining region from sequence of regions of heat flow dynamic according to sudden extension of its periphery, where welding lens is evaluated according to its position and size
RU2343465C1 (en) 2007-06-04 2009-01-10 Государственное образовательное учреждение высшего профессионального образования "Тамбовский государственный технический университет "ГОУ ВПО "ТГТУ" Method of noncontact nondestructive control of materials thermophysical properties
WO2009003702A1 (en) * 2007-07-04 2009-01-08 Thermosensorik Gmbh Method for the automatic inspection of a welding seam using heat flow thermography
US8577120B1 (en) * 2009-11-05 2013-11-05 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Methods and systems for characterization of an anomaly using infrared flash thermography
US8204294B2 (en) * 2009-11-25 2012-06-19 Toyota Motor Engineering & Manufacturing North America, Inc. Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch
JP2011122859A (en) * 2009-12-08 2011-06-23 Kyoto Institute Of Technology Method and system for diagnosis of defect
US9066028B1 (en) * 2010-01-08 2015-06-23 The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration Methods and systems for measurement and estimation of normalized contrast in infrared thermography
SG11201402855QA (en) 2011-12-10 2014-10-30 Dcg Systems Inc Method for examination of a sample by means of the heat flow thermography
EP2743688B1 (en) 2012-12-17 2017-05-03 Thermosensorik Gmbh Method and system for the examination of a sample by means of thermography

Also Published As

Publication number Publication date
WO2014095170A1 (en) 2014-06-26
JP6301951B2 (en) 2018-03-28
JP2016501376A (en) 2016-01-18
DE112013006039T5 (en) 2016-01-14
US9905014B2 (en) 2018-02-27
US20150339830A1 (en) 2015-11-26
EP2743688B1 (en) 2017-05-03
EP2743688A1 (en) 2014-06-18

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