SG10202101815PA - Method for imaging or spectroscopy with a non-linear interferometer - Google Patents

Method for imaging or spectroscopy with a non-linear interferometer

Info

Publication number
SG10202101815PA
SG10202101815PA SG10202101815PA SG10202101815PA SG10202101815PA SG 10202101815P A SG10202101815P A SG 10202101815PA SG 10202101815P A SG10202101815P A SG 10202101815PA SG 10202101815P A SG10202101815P A SG 10202101815PA SG 10202101815P A SG10202101815P A SG 10202101815PA
Authority
SG
Singapore
Prior art keywords
spectroscopy
imaging
linear interferometer
interferometer
linear
Prior art date
Application number
SG10202101815PA
Other languages
English (en)
Inventor
Steinlechner Fabian
Gräfe Dr Markus
Gilaberte Basset Marta
Original Assignee
Fraunhofer Ges Forschung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Ges Forschung filed Critical Fraunhofer Ges Forschung
Publication of SG10202101815PA publication Critical patent/SG10202101815PA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/0201—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal phase variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535—Devices with moving mirror
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/3515—All-optical modulation, gating, switching, e.g. control of a light beam by another light beam
    • G02F1/3517—All-optical modulation, gating, switching, e.g. control of a light beam by another light beam using an interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
SG10202101815PA 2020-02-28 2021-02-23 Method for imaging or spectroscopy with a non-linear interferometer SG10202101815PA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP20159989.1A EP3872464B1 (en) 2020-02-28 2020-02-28 Method for imaging or spectroscopy with a non-linear interferometer

Publications (1)

Publication Number Publication Date
SG10202101815PA true SG10202101815PA (en) 2021-09-29

Family

ID=69742885

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202101815PA SG10202101815PA (en) 2020-02-28 2021-02-23 Method for imaging or spectroscopy with a non-linear interferometer

Country Status (8)

Country Link
US (1) US11454541B2 (ko)
EP (1) EP3872464B1 (ko)
JP (1) JP7340555B2 (ko)
KR (1) KR102533874B1 (ko)
CN (1) CN113324951B (ko)
CA (1) CA3109688C (ko)
DK (1) DK3872464T3 (ko)
SG (1) SG10202101815PA (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12055439B2 (en) * 2019-12-13 2024-08-06 Kyoto University Quantum absorption spectroscopy system and quantum absorption spectroscopy method
WO2023171626A1 (ja) * 2022-03-08 2023-09-14 株式会社島津製作所 分光装置
DE102023108849A1 (de) 2023-04-06 2024-10-10 Humboldt-Universität zu Berlin, Körperschaft des öffentlichen Rechts Optische Anordnung und Verfahren zum Erzeugen eines Messsignals

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6931212B2 (en) * 2000-12-22 2005-08-16 Lucent Technologies Inc. 3R optical signal regeneration
US7538887B1 (en) * 2006-10-26 2009-05-26 Kla-Tencor Corporation Temporal interferometric signal modeling with constant phase shift in white light interferometry
KR100860947B1 (ko) * 2007-06-08 2008-09-30 한국표준과학연구원 적외선 비선형 분자진동 분광 이미징 장치
JP2013057619A (ja) * 2011-09-09 2013-03-28 Canon Inc 計測装置および計測方法
JP2015215313A (ja) * 2014-05-13 2015-12-03 キヤノン株式会社 計測装置及び物品の製造方法
CN105676558A (zh) * 2014-11-19 2016-06-15 华东师范大学 一种基于光学参量过程的非线性干涉仪
US10578421B2 (en) * 2015-09-08 2020-03-03 Institut National De La Recherche Scientifique System and method for phase-readout and active stabilization of optical interferometers
SG11201807118YA (en) * 2016-03-14 2018-09-27 Agency Science Tech & Res Optical system, method of forming and operating the same
CN109477938B (zh) * 2016-06-02 2021-10-29 麻省理工学院 用于光学神经网络的设备和方法
JP2018205430A (ja) * 2017-05-31 2018-12-27 国立研究開発法人産業技術総合研究所 位相シフトデジタルホログラフィ装置及びそのプログラム
JP2019191087A (ja) * 2018-04-27 2019-10-31 株式会社日立ハイテクサイエンス 干渉信号の位相補正方法
KR102613120B1 (ko) * 2018-07-16 2023-12-13 막스-플랑크-게젤샤프트 츄어 푀르더룽 데어 비쎈샤프텐 에.파우. 전자기장의 수색성 간섭 중첩을 이용한 간섭법
DE102018010364A1 (de) * 2018-07-27 2020-01-30 Q.ant GmbH Laserlichtquelle und Laser-Projektor damit
CN109539975A (zh) * 2018-11-14 2019-03-29 哈尔滨工业大学 单频激光干涉仪非线性误差修正方法与装置
CN109814318B (zh) * 2019-03-20 2020-07-28 南开大学 一种量子螺旋成像系统

Also Published As

Publication number Publication date
CN113324951B (zh) 2024-08-20
US20210270671A1 (en) 2021-09-02
KR20210110518A (ko) 2021-09-08
CA3109688A1 (en) 2021-08-28
JP7340555B2 (ja) 2023-09-07
EP3872464A1 (en) 2021-09-01
CN113324951A (zh) 2021-08-31
JP2021139890A (ja) 2021-09-16
US11454541B2 (en) 2022-09-27
CA3109688C (en) 2023-08-22
EP3872464B1 (en) 2024-05-22
KR102533874B1 (ko) 2023-05-18
DK3872464T3 (da) 2024-08-26

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