SG10201910926YA - Fill on demand ampoule refill - Google Patents
Fill on demand ampoule refillInfo
- Publication number
- SG10201910926YA SG10201910926YA SG10201910926YA SG10201910926YA SG10201910926YA SG 10201910926Y A SG10201910926Y A SG 10201910926YA SG 10201910926Y A SG10201910926Y A SG 10201910926YA SG 10201910926Y A SG10201910926Y A SG 10201910926YA SG 10201910926Y A SG10201910926Y A SG 10201910926YA
- Authority
- SG
- Singapore
- Prior art keywords
- fill
- demand
- refill
- ampoule refill
- demand ampoule
- Prior art date
Links
- 239000003708 ampul Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65B—MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING
- B65B3/00—Packaging plastic material, semiliquids, liquids or mixed solids and liquids, in individual containers or receptacles, e.g. bags, sacks, boxes, cartons, cans, or jars
- B65B3/04—Methods of, or means for, filling the material into the containers or receptacles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/4481—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67276—Production flow monitoring, e.g. for increasing throughput
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Automation & Control Theory (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/720,595 US11072860B2 (en) | 2014-08-22 | 2015-05-22 | Fill on demand ampoule refill |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201910926YA true SG10201910926YA (en) | 2020-01-30 |
Family
ID=57359190
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201910926YA SG10201910926YA (en) | 2015-05-22 | 2016-05-20 | Fill on demand ampoule refill |
SG10201604041SA SG10201604041SA (en) | 2015-05-22 | 2016-05-20 | Fill on demand ampoule refill |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201604041SA SG10201604041SA (en) | 2015-05-22 | 2016-05-20 | Fill on demand ampoule refill |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6821327B2 (en) |
KR (1) | KR102647515B1 (en) |
CN (2) | CN111508870B (en) |
SG (2) | SG10201910926YA (en) |
TW (1) | TWI713524B (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10351953B2 (en) * | 2017-03-16 | 2019-07-16 | Lam Research Corporation | Systems and methods for flow monitoring in a precursor vapor supply system of a substrate processing system |
CN108962781B (en) * | 2017-05-23 | 2020-12-08 | 北京北方华创微电子装备有限公司 | Liquid medicine supply system |
US12084771B2 (en) | 2021-03-02 | 2024-09-10 | Applied Materials, Inc. | Control of liquid delivery in auto-refill systems |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63136614A (en) * | 1986-11-28 | 1988-06-08 | Hitachi Ltd | Processor |
JP2742327B2 (en) * | 1990-10-19 | 1998-04-22 | 富士写真フイルム株式会社 | Developing device operation method |
US5465766A (en) * | 1993-04-28 | 1995-11-14 | Advanced Delivery & Chemical Systems, Inc. | Chemical refill system for high purity chemicals |
JP3409910B2 (en) * | 1994-02-20 | 2003-05-26 | 株式会社エステック | Liquid material vaporizer |
US5944940A (en) * | 1996-07-09 | 1999-08-31 | Gamma Precision Technology, Inc. | Wafer transfer system and method of using the same |
US6443435B1 (en) * | 2000-10-23 | 2002-09-03 | Applied Materials, Inc. | Vaporization of precursors at point of use |
US20040093938A1 (en) * | 2002-11-15 | 2004-05-20 | Chung-Te Tsai | Liquid in pipeline and liquid level detection and warning system |
JP2006016641A (en) * | 2004-06-30 | 2006-01-19 | L'air Liquide Sa Pour L'etude & L'exploitation Des Procede S Georges Claude | Method for producing metal silicon oxide, method for producing metal silicon oxynitride and method for producing silicon-doped metal nitride |
US8268078B2 (en) * | 2006-03-16 | 2012-09-18 | Tokyo Electron Limited | Method and apparatus for reducing particle contamination in a deposition system |
US20100151261A1 (en) * | 2006-07-21 | 2010-06-17 | Ce Ma | Methods and apparatus for the vaporization and delivery of solution precursors for atomic layer deposition |
KR100855582B1 (en) * | 2007-01-12 | 2008-09-03 | 삼성전자주식회사 | Liquid supplying unit and method, facility for treating substrates with the unit, and method for treating substrates |
US20090214777A1 (en) * | 2008-02-22 | 2009-08-27 | Demetrius Sarigiannis | Multiple ampoule delivery systems |
KR20110088564A (en) * | 2008-11-11 | 2011-08-03 | 프랙스에어 테크놀로지, 인코포레이티드 | Reagent dispensing apparatuses and delivery methods |
WO2010083510A1 (en) * | 2009-01-16 | 2010-07-22 | Veeco Instruments, Inc. | Composition and method for low temperature deposition of ruthenium |
CN103635990B (en) * | 2011-05-28 | 2016-11-16 | 恩特格里斯公司 | There is the ampoule refilled of detergent power |
CN103041954A (en) * | 2011-10-13 | 2013-04-17 | 北大方正集团有限公司 | Liquid level alarm system for spin coating equipment |
JP5841007B2 (en) * | 2012-05-28 | 2016-01-06 | 株式会社Screenセミコンダクターソリューションズ | Chemical supply method and substrate processing apparatus |
JP6199037B2 (en) * | 2013-01-15 | 2017-09-20 | 鳴香株式会社 | Liquid fertilizer supply system and automatic irrigator |
-
2016
- 2016-05-13 JP JP2016096649A patent/JP6821327B2/en active Active
- 2016-05-19 TW TW105115410A patent/TWI713524B/en active
- 2016-05-19 KR KR1020160061379A patent/KR102647515B1/en active IP Right Grant
- 2016-05-20 SG SG10201910926YA patent/SG10201910926YA/en unknown
- 2016-05-20 SG SG10201604041SA patent/SG10201604041SA/en unknown
- 2016-05-23 CN CN202010098763.XA patent/CN111508870B/en active Active
- 2016-05-23 CN CN201610345105.XA patent/CN106169432B/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2017014614A (en) | 2017-01-19 |
CN106169432A (en) | 2016-11-30 |
CN111508870A (en) | 2020-08-07 |
CN111508870B (en) | 2024-03-01 |
KR102647515B1 (en) | 2024-03-13 |
TWI713524B (en) | 2020-12-21 |
SG10201604041SA (en) | 2016-12-29 |
CN106169432B (en) | 2020-03-17 |
JP6821327B2 (en) | 2021-01-27 |
KR20160137400A (en) | 2016-11-30 |
TW201708599A (en) | 2017-03-01 |
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