SG10201908703VA - System and method for temporal signal measurement of device under test (dut) and method of forming system - Google Patents
System and method for temporal signal measurement of device under test (dut) and method of forming systemInfo
- Publication number
- SG10201908703VA SG10201908703VA SG10201908703VA SG10201908703VA SG10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA
- Authority
- SG
- Singapore
- Prior art keywords
- dut
- under test
- device under
- signal measurement
- temporal signal
- Prior art date
Links
- 238000000034 method Methods 0.000 title 2
- 238000005259 measurement Methods 0.000 title 1
- 230000002123 temporal effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31716—Testing of input or output with loop-back
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
- G01R31/083—Locating faults in cables, transmission lines, or networks according to type of conductors in cables, e.g. underground
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/088—Aspects of digital computing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
- H03L7/197—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SG10201808233T | 2018-09-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG10201908703VA true SG10201908703VA (en) | 2020-04-29 |
Family
ID=67998124
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG10201908703VA SG10201908703VA (en) | 2018-09-21 | 2019-09-19 | System and method for temporal signal measurement of device under test (dut) and method of forming system |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10989758B2 (zh) |
| EP (1) | EP3627163A1 (zh) |
| CN (1) | CN110958057B (zh) |
| SG (1) | SG10201908703VA (zh) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20220079195A (ko) * | 2020-12-04 | 2022-06-13 | 삼성전자주식회사 | 테스트 장치, 테스트 시스템 및 테스트 시스템의 동작방법 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5289116A (en) | 1990-05-31 | 1994-02-22 | Hewlett Packard Company | Apparatus and method for testing electronic devices |
| US5589763A (en) * | 1995-05-16 | 1996-12-31 | Texas Instruments Incorporated | Coherent undersampling digitizer for use with automatic field test equipment |
| CA2177525C (en) | 1996-05-28 | 2002-01-29 | Maurice Stephen O'sullivan | Eye mask for measurement of distortion in optical transmission systems |
| EP1437855B1 (en) | 2002-12-30 | 2007-05-30 | Alcatel Lucent | Device and method of determining an eye diagram of a digital signal |
| EP1610137B1 (en) * | 2004-06-24 | 2009-05-20 | Verigy (Singapore) Pte. Ltd. | Per-pin clock synthesis |
| US8841923B1 (en) | 2007-08-30 | 2014-09-23 | Agilent Technologies, Inc. | Device and method for performing remote frequency response measurements |
| US8261119B2 (en) * | 2009-09-10 | 2012-09-04 | Advantest Corporation | Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module |
| KR101918627B1 (ko) * | 2012-04-04 | 2018-11-15 | 삼성전자 주식회사 | 데이터 수신장치 및 그 테스트 방법 |
| US20170023628A1 (en) * | 2015-07-20 | 2017-01-26 | Tektronix, Inc. | Time corrected time-domain reflectometer |
| US10003453B1 (en) * | 2015-11-13 | 2018-06-19 | Anritsu Company | Phase synchronization of measuring instruments using free space transmission |
| US10002650B1 (en) | 2016-12-21 | 2018-06-19 | Mediatek Inc. | Signal quality detection circuit for generating signal quality detection result according to two-dimensional nominal sampling point pattern and associated signal quality detection method |
-
2019
- 2019-09-19 EP EP19198326.1A patent/EP3627163A1/en active Pending
- 2019-09-19 CN CN201910885125.XA patent/CN110958057B/zh active Active
- 2019-09-19 SG SG10201908703VA patent/SG10201908703VA/en unknown
- 2019-09-19 US US16/575,592 patent/US10989758B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN110958057B (zh) | 2022-11-08 |
| EP3627163A1 (en) | 2020-03-25 |
| US20200096568A1 (en) | 2020-03-26 |
| CN110958057A (zh) | 2020-04-03 |
| US10989758B2 (en) | 2021-04-27 |
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