SG10201908703VA - System and method for temporal signal measurement of device under test (dut) and method of forming system - Google Patents

System and method for temporal signal measurement of device under test (dut) and method of forming system

Info

Publication number
SG10201908703VA
SG10201908703VA SG10201908703VA SG10201908703VA SG10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA SG 10201908703V A SG10201908703V A SG 10201908703VA
Authority
SG
Singapore
Prior art keywords
dut
under test
device under
signal measurement
temporal signal
Prior art date
Application number
SG10201908703VA
Inventor
Harshang Nileshkumar Pandya
Zhu Xing
Arvindbhai Chimanbhai Patel
Minglei Cui
Original Assignee
Aem Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aem Singapore Pte Ltd filed Critical Aem Singapore Pte Ltd
Publication of SG10201908703VA publication Critical patent/SG10201908703VA/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31716—Testing of input or output with loop-back
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/083—Locating faults in cables, transmission lines, or networks according to type of conductors in cables, e.g. underground
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/088—Aspects of digital computing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
    • H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
    • H03L7/197—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between numbers which are variable in time or the frequency divider dividing by a factor variable in time, e.g. for obtaining fractional frequency division
SG10201908703VA 2018-09-21 2019-09-19 System and method for temporal signal measurement of device under test (dut) and method of forming system SG10201908703VA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG10201808233T 2018-09-21

Publications (1)

Publication Number Publication Date
SG10201908703VA true SG10201908703VA (en) 2020-04-29

Family

ID=67998124

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201908703VA SG10201908703VA (en) 2018-09-21 2019-09-19 System and method for temporal signal measurement of device under test (dut) and method of forming system

Country Status (4)

Country Link
US (1) US10989758B2 (en)
EP (1) EP3627163A1 (en)
CN (1) CN110958057B (en)
SG (1) SG10201908703VA (en)

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5289116A (en) * 1990-05-31 1994-02-22 Hewlett Packard Company Apparatus and method for testing electronic devices
US5589763A (en) * 1995-05-16 1996-12-31 Texas Instruments Incorporated Coherent undersampling digitizer for use with automatic field test equipment
CA2177525C (en) 1996-05-28 2002-01-29 Maurice Stephen O'sullivan Eye mask for measurement of distortion in optical transmission systems
ATE363781T1 (en) 2002-12-30 2007-06-15 Alcatel Lucent DEVICE AND METHOD FOR EYE PATTERN MEASURING A DIGITAL SIGNAL
EP1610137B1 (en) * 2004-06-24 2009-05-20 Verigy (Singapore) Pte. Ltd. Per-pin clock synthesis
US8841923B1 (en) 2007-08-30 2014-09-23 Agilent Technologies, Inc. Device and method for performing remote frequency response measurements
US8261119B2 (en) * 2009-09-10 2012-09-04 Advantest Corporation Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module
KR101918627B1 (en) * 2012-04-04 2018-11-15 삼성전자 주식회사 Data receiver device and testing method thereof
US20170023628A1 (en) * 2015-07-20 2017-01-26 Tektronix, Inc. Time corrected time-domain reflectometer
US10003453B1 (en) * 2015-11-13 2018-06-19 Anritsu Company Phase synchronization of measuring instruments using free space transmission
US10002650B1 (en) 2016-12-21 2018-06-19 Mediatek Inc. Signal quality detection circuit for generating signal quality detection result according to two-dimensional nominal sampling point pattern and associated signal quality detection method

Also Published As

Publication number Publication date
CN110958057B (en) 2022-11-08
CN110958057A (en) 2020-04-03
US10989758B2 (en) 2021-04-27
US20200096568A1 (en) 2020-03-26
EP3627163A1 (en) 2020-03-25

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