SG10201800620XA - Determining method, measuring apparatus and adhesive tape attaching apparatus - Google Patents
Determining method, measuring apparatus and adhesive tape attaching apparatusInfo
- Publication number
- SG10201800620XA SG10201800620XA SG10201800620XA SG10201800620XA SG10201800620XA SG 10201800620X A SG10201800620X A SG 10201800620XA SG 10201800620X A SG10201800620X A SG 10201800620XA SG 10201800620X A SG10201800620X A SG 10201800620XA SG 10201800620X A SG10201800620X A SG 10201800620XA
- Authority
- SG
- Singapore
- Prior art keywords
- adhesive tape
- determining method
- tape attaching
- measuring apparatus
- determining
- Prior art date
Links
- 239000002390 adhesive tape Substances 0.000 title abstract 5
- 239000010410 layer Substances 0.000 abstract 2
- 239000012790 adhesive layer Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/14—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces generated by dead weight, e.g. pendulum; generated by springs tension
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/04—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands
- G01L5/047—Specific indicating or recording arrangements, e.g. for remote indication, for indicating overload or underload
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H35/00—Delivering articles from cutting or line-perforating machines; Article or web delivery apparatus incorporating cutting or line-perforating devices, e.g. adhesive tape dispensers
- B65H35/0006—Article or web delivery apparatus incorporating cutting or line-perforating devices
- B65H35/002—Hand-held or table apparatus
- B65H35/0026—Hand-held or table apparatus for delivering pressure-sensitive adhesive tape
- B65H35/0033—Hand-held or table apparatus for delivering pressure-sensitive adhesive tape and affixing it to a surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/04—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/04—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands
- G01L5/06—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using mechanical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/007—Subject matter not provided for in other groups of this subclass by applying a load, e.g. for resistance or wear testing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0016—Tensile or compressive
- G01N2203/0017—Tensile
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/0032—Generation of the force using mechanical means
- G01N2203/0033—Weight
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/0032—Generation of the force using mechanical means
- G01N2203/0039—Hammer or pendulum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0278—Thin specimens
- G01N2203/0282—Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Adhesive Tapes (AREA)
- Coating Apparatus (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
- Automobile Manufacture Line, Endless Track Vehicle, Trailer (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
DETERMINING METHOD, MEASURING APPARATUS, AND ADHESIVE TAPE ATTACHING APPARATUS A determining method for determining whether or not the tension of an adhesive tape constituting a frame unit is proper, in which a plate-shaped workpiece and an annular frame are attached to the adhesive tape to form the frame unit, is provided. The adhesive tape is composed of a base layer and an adhesive layer formed on the base layer. The determining method includes a supporting step, a downward amount measuring step, and a determining step. (Figure 5B)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017015094A JP6779579B2 (en) | 2017-01-31 | 2017-01-31 | Judgment method, measuring device, and adhesive tape sticking device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201800620XA true SG10201800620XA (en) | 2018-08-30 |
Family
ID=62977156
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201800620XA SG10201800620XA (en) | 2017-01-31 | 2018-01-24 | Determining method, measuring apparatus and adhesive tape attaching apparatus |
Country Status (7)
Country | Link |
---|---|
US (1) | US10294062B2 (en) |
JP (1) | JP6779579B2 (en) |
KR (1) | KR102309434B1 (en) |
CN (1) | CN108376654B (en) |
MY (1) | MY181955A (en) |
SG (1) | SG10201800620XA (en) |
TW (1) | TWI753998B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7281873B2 (en) | 2018-05-14 | 2023-05-26 | 株式会社ディスコ | Wafer processing method |
JP7166718B2 (en) * | 2018-10-17 | 2022-11-08 | 株式会社ディスコ | Wafer processing method |
EP3705862B1 (en) * | 2019-03-05 | 2023-07-05 | Infineon Technologies AG | Method and device for monitoring a dicing tape tension |
CN114735510B (en) * | 2020-12-25 | 2024-02-13 | 无锡市迦南胶粘科技有限公司 | Application method of adhesive tape viscosity detection system |
Family Cites Families (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2751784A (en) * | 1952-06-20 | 1956-06-26 | Gershberg Solomon | Apparatus for testing adhesive tape |
JPH01219609A (en) * | 1988-02-29 | 1989-09-01 | Oji Paper Co Ltd | Method and apparatus for measuring elongation of wound product |
JPH01158948U (en) * | 1988-04-22 | 1989-11-02 | ||
JPH04198381A (en) * | 1990-11-28 | 1992-07-17 | Kanzaki Paper Mfg Co Ltd | Tacky sheet |
JPH05126652A (en) * | 1991-10-31 | 1993-05-21 | Kowa Co | Noncontact tension measuring device |
JPH0712710A (en) * | 1993-06-28 | 1995-01-17 | Resuka:Kk | Adhesiveness testing device |
KR100302311B1 (en) * | 1994-01-03 | 2001-11-30 | 조민호 | Jig apparatus for measuring adhesive property |
KR970048398A (en) * | 1995-12-27 | 1997-07-29 | 김태구 | Adhesion time measuring device of double sided tape |
KR100278137B1 (en) * | 1997-09-04 | 2001-01-15 | 가나이 쓰도무 | Method of mounting semiconductor device and system thereof, method of manufacturing semiconductor device isolator and IC card |
EP1193487A4 (en) * | 2000-04-04 | 2011-10-26 | Lintec Corp | Device and method for measuring adhesive strength |
JP4444619B2 (en) * | 2003-10-10 | 2010-03-31 | リンテック株式会社 | MOUNTING DEVICE AND MOUNTING METHOD |
JP4316392B2 (en) | 2004-01-16 | 2009-08-19 | 株式会社リコー | Peel strength measuring device |
JP4341431B2 (en) | 2004-03-04 | 2009-10-07 | 凸版印刷株式会社 | Thin film adhesion strength evaluation method and apparatus |
JP4880293B2 (en) * | 2005-11-24 | 2012-02-22 | リンテック株式会社 | Sheet sticking device and sticking method |
JP4360684B2 (en) * | 2006-02-22 | 2009-11-11 | 日東電工株式会社 | Adhesive tape pasting method for semiconductor wafer and apparatus using the same |
KR100795105B1 (en) * | 2006-03-08 | 2008-01-17 | (주) 기배이앤티 | Test equipment for adhesive tape |
JP2009076773A (en) | 2007-09-21 | 2009-04-09 | Disco Abrasive Syst Ltd | Chuck table mechanism |
JP5203744B2 (en) * | 2008-02-21 | 2013-06-05 | 株式会社ディスコ | Breaking method of adhesive film mounted on backside of wafer |
JP5113599B2 (en) * | 2008-04-08 | 2013-01-09 | リンテック株式会社 | Sheet sticking device and sticking method |
JP5171944B2 (en) * | 2008-05-09 | 2013-03-27 | 日東電工株式会社 | Peel test apparatus and method for evaluating impact peel characteristics of adhesive tape |
JP5324399B2 (en) * | 2009-11-10 | 2013-10-23 | リンテック株式会社 | Sheet sticking device and sticking method |
JP4568374B1 (en) * | 2010-03-15 | 2010-10-27 | 大宮工業株式会社 | Pasting device and pasting method |
TWM411562U (en) | 2010-09-16 | 2011-09-11 | Tung-Yuan Tsaur | System for measuring peeling force of adhesives |
JP5261534B2 (en) * | 2011-05-18 | 2013-08-14 | リンテック株式会社 | Inspection device |
CN103245608A (en) | 2012-02-14 | 2013-08-14 | 鸿富锦精密工业(深圳)有限公司 | Double faced adhesive tape adhesive force detecting device |
US9016136B1 (en) * | 2013-03-12 | 2015-04-28 | Shurtape Technologies, Llc | Apparatus for testing adhesion of an adhesive tape to a bonding surface under a load applied to the tape |
JP6234161B2 (en) * | 2013-10-24 | 2017-11-22 | 株式会社ディスコ | Adhesive tape sticking device |
JP6178724B2 (en) * | 2013-12-26 | 2017-08-09 | 株式会社ディスコ | Wafer dividing method |
KR102544982B1 (en) * | 2016-09-02 | 2023-06-20 | 삼성디스플레이 주식회사 | Apparatus and method for manufacturing a display apparatus |
-
2017
- 2017-01-31 JP JP2017015094A patent/JP6779579B2/en active Active
-
2018
- 2018-01-23 MY MYPI2018700297A patent/MY181955A/en unknown
- 2018-01-24 SG SG10201800620XA patent/SG10201800620XA/en unknown
- 2018-01-25 KR KR1020180009180A patent/KR102309434B1/en active IP Right Grant
- 2018-01-25 CN CN201810071611.3A patent/CN108376654B/en active Active
- 2018-01-26 TW TW107103006A patent/TWI753998B/en active
- 2018-01-30 US US15/883,718 patent/US10294062B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP6779579B2 (en) | 2020-11-04 |
KR20200067239A (en) | 2020-06-12 |
CN108376654A (en) | 2018-08-07 |
CN108376654B (en) | 2023-04-11 |
MY181955A (en) | 2021-01-15 |
TW201840959A (en) | 2018-11-16 |
KR102309434B1 (en) | 2021-10-05 |
TWI753998B (en) | 2022-02-01 |
US10294062B2 (en) | 2019-05-21 |
US20180215571A1 (en) | 2018-08-02 |
JP2018123211A (en) | 2018-08-09 |
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