SG10201605656TA - Method and apparatus for docking a test head with a peripheral - Google Patents

Method and apparatus for docking a test head with a peripheral

Info

Publication number
SG10201605656TA
SG10201605656TA SG10201605656TA SG10201605656TA SG10201605656TA SG 10201605656T A SG10201605656T A SG 10201605656TA SG 10201605656T A SG10201605656T A SG 10201605656TA SG 10201605656T A SG10201605656T A SG 10201605656TA SG 10201605656T A SG10201605656T A SG 10201605656TA
Authority
SG
Singapore
Prior art keywords
docking
peripheral
test head
test
head
Prior art date
Application number
SG10201605656TA
Other languages
English (en)
Inventor
Alyn R Holt
Brian R Moore
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Publication of SG10201605656TA publication Critical patent/SG10201605656TA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4063—Device-to-bus coupling
    • G06F13/409—Mechanical coupling

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG10201605656TA 2011-07-12 2012-07-11 Method and apparatus for docking a test head with a peripheral SG10201605656TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201161506764P 2011-07-12 2011-07-12

Publications (1)

Publication Number Publication Date
SG10201605656TA true SG10201605656TA (en) 2016-08-30

Family

ID=46679277

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201605656TA SG10201605656TA (en) 2011-07-12 2012-07-11 Method and apparatus for docking a test head with a peripheral

Country Status (6)

Country Link
US (1) US20140317453A1 (fr)
EP (1) EP2732298A1 (fr)
CN (1) CN103782182B (fr)
SG (1) SG10201605656TA (fr)
TW (1) TWI574023B (fr)
WO (1) WO2013009817A1 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015006624A2 (fr) * 2013-07-11 2015-01-15 Johnstech International Corporation Broches électroconductrices de centre à centre pour un essai intégré
CN105628981B (zh) * 2014-10-30 2018-09-25 上海电缆研究所有限公司 高频电缆测试平台
US10877066B2 (en) * 2018-03-01 2020-12-29 Rohde & Schwarz Gmbh & Co. Kg Method and apparatus used for testing a device under test
KR102089653B1 (ko) * 2019-12-30 2020-03-16 신종천 테스트 소켓 조립체
TWI720769B (zh) * 2019-12-31 2021-03-01 致茂電子股份有限公司 測試設備及其活動式連結機構
WO2021154370A1 (fr) * 2020-01-29 2021-08-05 Massachusetts Institute Of Technology Monture d'alignement réglable
CN112378358B (zh) * 2020-11-20 2022-03-25 爱佩仪测量设备有限公司 用于三坐标测量机的立柱无缝拼接结构及方法
TWI750984B (zh) * 2020-12-30 2021-12-21 致茂電子股份有限公司 架橋連接式的自動化測試系統
TWI824291B (zh) * 2021-09-10 2023-12-01 鴻勁精密股份有限公司 接合機構及其應用之測試裝置、測試作業機
CN117151032B (zh) * 2023-10-27 2024-01-23 零壹半导体技术(常州)有限公司 基于Kelvin的ATE检测PCB板的测试方法

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US4527942A (en) 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4715574A (en) 1985-11-12 1987-12-29 Intest Corporation Safety lock for materials handling system
US4893074A (en) 1988-05-13 1990-01-09 Intest Corporation Electronic device testing system
US5030869A (en) 1990-07-25 1991-07-09 Intest Corporation Device testing system with cable pivot
US5241870A (en) 1991-07-22 1993-09-07 Intest Corporation Test head manipulator
US6057695A (en) 1993-09-15 2000-05-02 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5600258A (en) 1993-09-15 1997-02-04 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5744974A (en) 1993-09-17 1998-04-28 Xilinx, Inc. Test head interface with vacuum-activated interconnection components
US5982182A (en) 1994-09-01 1999-11-09 Chiu; Michael A. Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
TW273635B (fr) 1994-09-01 1996-04-01 Aesop
WO1996026446A1 (fr) 1995-02-23 1996-08-29 Aesop, Inc. Manipulateur pour une tete d'essai d'un equipement d'essai automatique
US5608334A (en) 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
SG55211A1 (en) 1995-07-05 1998-12-21 Tokyo Electron Ltd Testing apparatus
US5656943A (en) * 1995-10-30 1997-08-12 Motorola, Inc. Apparatus for forming a test stack for semiconductor wafer probing and method for using the same
US5654631A (en) 1995-11-15 1997-08-05 Xilinx, Inc. Vacuum lock handler and tester interface for semiconductor devices
US5678944A (en) 1995-12-07 1997-10-21 Aesop, Inc. Flexural mount kinematic couplings and method
US5949002A (en) 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
US6888343B1 (en) 1999-01-13 2005-05-03 Intest Ip Corporation Test head manipulator
JP4255162B2 (ja) 1999-04-01 2009-04-15 富士機械製造株式会社 電気部品の装着方法および電気部品装着システム
US6407541B1 (en) 1999-07-30 2002-06-18 Credence Systems Corporation Docking mechanism for semiconductor tester
MY138984A (en) 2000-03-01 2009-08-28 Intest Corp Vertical counter balanced test head manipulator
MY127154A (en) 2000-09-22 2006-11-30 Intest Corp Apparatus and method for balancing and for providing a compliant range to a test head
US6551122B2 (en) * 2000-10-04 2003-04-22 Teradyne, Inc. Low profile pneumatically actuated docking module with power fault release
US6838868B1 (en) * 2000-11-07 2005-01-04 Teradyne, Inc. Test head actuation system with positioning and compliant modes
US6617867B2 (en) * 2000-11-29 2003-09-09 Teradyne, Inc. Mechanism for clamping device interface board to peripheral
DE10122049B4 (de) * 2001-05-07 2004-08-19 Heigl, Helmuth, Dr.-Ing. Vorrichtung zum Verriegeln von zwei miteinander zu koppelnden Einrichtungen, insbesondere eines Testkopfs und einer Prüfeinrichtung
AU2002355083A1 (en) * 2001-07-16 2003-03-03 Intest Ip Corp. Test head docking system and method
KR20040106344A (ko) 2002-04-15 2004-12-17 인테스트 아이피 코포레이션 테스트 헤드 포지셔너 시스템
US6729589B2 (en) 2002-10-07 2004-05-04 Gizmonics, Inc. Kinematic mount
US6833696B2 (en) 2003-03-04 2004-12-21 Xandex, Inc. Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
SG137846A1 (en) 2003-08-06 2007-12-28 Intest Corp Test head positioning system
US7276895B2 (en) 2003-10-03 2007-10-02 Intest Corporation Adjustable test head docking apparatus
CN103913697B (zh) 2007-02-23 2017-04-12 英泰斯特股份有限公司 测试头操作系统
US8763962B2 (en) 2007-05-07 2014-07-01 Intest Corporation Cradle and cable handler for a test head manipulator
MY182902A (en) * 2008-07-14 2021-02-05 Intest Corp Test head docking system and method with sliding linkage

Also Published As

Publication number Publication date
CN103782182A (zh) 2014-05-07
WO2013009817A4 (fr) 2013-03-07
TW201305581A (zh) 2013-02-01
WO2013009817A1 (fr) 2013-01-17
TWI574023B (zh) 2017-03-11
EP2732298A1 (fr) 2014-05-21
CN103782182B (zh) 2016-08-24
US20140317453A1 (en) 2014-10-23

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