SG11201602422WA - Method and apparatus for docking a test head with a peripheral - Google Patents

Method and apparatus for docking a test head with a peripheral

Info

Publication number
SG11201602422WA
SG11201602422WA SG11201602422WA SG11201602422WA SG11201602422WA SG 11201602422W A SG11201602422W A SG 11201602422WA SG 11201602422W A SG11201602422W A SG 11201602422WA SG 11201602422W A SG11201602422W A SG 11201602422WA SG 11201602422W A SG11201602422W A SG 11201602422WA
Authority
SG
Singapore
Prior art keywords
docking
peripheral
test head
test
head
Prior art date
Application number
SG11201602422WA
Inventor
Christopher L West
Charles P Nappen
Steven J Crowell
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Publication of SG11201602422WA publication Critical patent/SG11201602422WA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG11201602422WA 2013-09-30 2014-09-18 Method and apparatus for docking a test head with a peripheral SG11201602422WA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361884345P 2013-09-30 2013-09-30
PCT/US2014/056246 WO2015047857A1 (en) 2013-09-30 2014-09-18 Method and apparatus for docking a test head with a peripheral

Publications (1)

Publication Number Publication Date
SG11201602422WA true SG11201602422WA (en) 2016-04-28

Family

ID=51660646

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201602422WA SG11201602422WA (en) 2013-09-30 2014-09-18 Method and apparatus for docking a test head with a peripheral

Country Status (10)

Country Link
US (1) US9897628B2 (en)
EP (1) EP3052951A1 (en)
JP (1) JP2016537621A (en)
KR (1) KR102353935B1 (en)
CN (1) CN105683767B (en)
MY (1) MY179046A (en)
PH (1) PH12016500428A1 (en)
SG (1) SG11201602422WA (en)
TW (1) TWI654694B (en)
WO (1) WO2015047857A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579566B (en) * 2015-08-10 2017-04-21 創意電子股份有限公司 Circuit probing system and its circuit probing device
CN106500576B (en) * 2016-12-02 2019-04-16 大连理工大学 A method of optimization engine cylinder body, cylinder cap installation way
US20180348286A1 (en) * 2017-06-02 2018-12-06 Murata Manufacturing Co., Ltd. Method for testing electrical connection to module connector on printed circuit board or other structure and related apparatus
TWI627411B (en) * 2017-12-15 2018-06-21 致茂電子股份有限公司 Electrical probe structure
US10877066B2 (en) * 2018-03-01 2020-12-29 Rohde & Schwarz Gmbh & Co. Kg Method and apparatus used for testing a device under test
KR102029400B1 (en) * 2018-04-27 2019-10-07 주식회사 마이크로컨텍솔루션 Socket
KR101896873B1 (en) * 2018-05-02 2018-09-10 주식회사 프로이천 Pin board
TWI663410B (en) * 2018-09-07 2019-06-21 致茂電子股份有限公司 Docking floating mechanism
KR102033560B1 (en) * 2018-11-26 2019-10-17 (주)케미텍 A Test Device Of Semi-Conductor
KR102004441B1 (en) * 2019-03-25 2019-07-29 주식회사 프로이천 Pin board assembly
KR102032290B1 (en) * 2019-03-29 2019-10-15 주식회사 프로이천 Pin board assembly
WO2020263758A1 (en) * 2019-06-24 2020-12-30 Miller Dowel Company Guidance apparatus for assembly of construction panels
TWI726555B (en) * 2019-12-27 2021-05-01 致茂電子股份有限公司 Locking mechanism for a press head and electronic device testing apparatus comprising the same
EP4137707B1 (en) 2020-01-27 2024-07-03 Miller Dowel Company Threaded stepped dowel
WO2021212124A1 (en) * 2020-04-17 2021-10-21 Multiply Labs Inc. System, method, and apparatus facilitating automated modular manufacture of cell therapy
KR102232628B1 (en) * 2020-05-22 2021-03-29 주식회사 영우디에스피 Unclamping sensor of probe unit for inspecting display panel
CN112098754B (en) * 2020-09-11 2024-02-23 北京无线电测量研究所 Electronic component aging test seat and aging test device comprising same
DE102021114564A1 (en) * 2021-06-07 2022-12-08 Turbodynamics Gmbh Docking device and method for coupling second devices for interface units, scheduling system and docking element
KR102399194B1 (en) * 2022-01-11 2022-05-18 주식회사 프로이천 Pin board adapter

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
DE20003730U1 (en) * 1999-07-01 2000-05-18 Vischer & Bolli AG, Dübendorf Clamping device for fixing a feed pin
US6551122B2 (en) * 2000-10-04 2003-04-22 Teradyne, Inc. Low profile pneumatically actuated docking module with power fault release
EP1410048B1 (en) * 2001-07-16 2010-12-29 inTEST Corporation Test head docking system and method
US20040018048A1 (en) * 2002-07-26 2004-01-29 Sausen Earl W. Pneumatic docking system
US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
WO2005015245A2 (en) * 2003-08-06 2005-02-17 Intest Corporation Test head positioning system
US7221175B2 (en) * 2005-05-11 2007-05-22 Stats Chippac Ltd. Self-aligning docking system for electronic device testing
DE102005036808B4 (en) * 2005-08-04 2007-12-13 Stefan Thurmaier Fluid-actuated docking device

Also Published As

Publication number Publication date
TW201528396A (en) 2015-07-16
KR20160063351A (en) 2016-06-03
US20160202292A1 (en) 2016-07-14
PH12016500428B1 (en) 2016-05-23
CN105683767B (en) 2019-08-30
WO2015047857A8 (en) 2016-04-14
MY179046A (en) 2020-10-26
PH12016500428A1 (en) 2016-05-23
US9897628B2 (en) 2018-02-20
TWI654694B (en) 2019-03-21
WO2015047857A1 (en) 2015-04-02
EP3052951A1 (en) 2016-08-10
KR102353935B1 (en) 2022-01-19
JP2016537621A (en) 2016-12-01
CN105683767A (en) 2016-06-15

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