SG10201509581SA - Ultrasonic cleaning method and ultrasonic cleaning apparatus - Google Patents
Ultrasonic cleaning method and ultrasonic cleaning apparatusInfo
- Publication number
- SG10201509581SA SG10201509581SA SG10201509581SA SG10201509581SA SG10201509581SA SG 10201509581S A SG10201509581S A SG 10201509581SA SG 10201509581S A SG10201509581S A SG 10201509581SA SG 10201509581S A SG10201509581S A SG 10201509581SA SG 10201509581S A SG10201509581S A SG 10201509581SA
- Authority
- SG
- Singapore
- Prior art keywords
- ultrasonic cleaning
- cleaning apparatus
- cleaning method
- ultrasonic
- cleaning
- Prior art date
Links
- 238000004506 ultrasonic cleaning Methods 0.000 title 2
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012118634A JP5872382B2 (en) | 2012-05-24 | 2012-05-24 | Ultrasonic cleaning method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201509581SA true SG10201509581SA (en) | 2015-12-30 |
Family
ID=48428375
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201509581SA SG10201509581SA (en) | 2012-05-24 | 2013-05-10 | Ultrasonic cleaning method and ultrasonic cleaning apparatus |
Country Status (7)
Country | Link |
---|---|
US (1) | US9773688B2 (en) |
EP (1) | EP2666553B1 (en) |
JP (1) | JP5872382B2 (en) |
KR (2) | KR20130132270A (en) |
CN (1) | CN103418574B (en) |
SG (1) | SG10201509581SA (en) |
TW (1) | TWI548469B (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5872382B2 (en) * | 2012-05-24 | 2016-03-01 | ジルトロニック アクチエンゲゼルシャフトSiltronic AG | Ultrasonic cleaning method |
FR3006209B1 (en) * | 2013-05-31 | 2016-05-06 | Michel Bourdat | DEVICE AND METHOD FOR CLEANING PLATE-SHAPED OBJECTS |
US10994311B2 (en) | 2013-05-31 | 2021-05-04 | Michel Bourdat | Specific device for cleaning electronic components and/or circuits |
CN106311665A (en) * | 2016-11-18 | 2017-01-11 | 吕刚 | Silicon single crystal rod cleaning raw material preparation device for battery piece production |
JP6673527B2 (en) | 2017-03-16 | 2020-03-25 | 日本製鉄株式会社 | Ultrasonic cleaning device and ultrasonic cleaning method |
CN108950630B (en) * | 2018-09-20 | 2023-09-12 | 江苏金曼科技有限责任公司 | Ultrasonic cleaning device for electroplated part |
JP7131622B2 (en) * | 2018-09-26 | 2022-09-06 | 日本製鉄株式会社 | METHOD AND APPARATUS FOR CLEANING METAL PIPE |
KR102379163B1 (en) * | 2020-01-31 | 2022-03-25 | 에스케이실트론 주식회사 | First cleaning apparatus, cleaning equipment and method including the same |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
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GB1112406A (en) * | 1963-11-13 | 1968-05-08 | Minister Of Aviation Uk Government | Improvements in or relating to stirring devices |
JPS60113719A (en) | 1983-11-24 | 1985-06-20 | Mazda Motor Corp | Warming apparatus |
US5017281A (en) * | 1984-12-21 | 1991-05-21 | Tar Sands Energy Ltd. | Treatment of carbonaceous materials |
JPS6224987U (en) * | 1985-07-26 | 1987-02-16 | ||
JPH0426639Y2 (en) | 1988-07-29 | 1992-06-25 | ||
JPH02125792U (en) * | 1989-03-23 | 1990-10-17 | ||
JP3742451B2 (en) | 1996-01-17 | 2006-02-01 | 昌之 都田 | Cleaning method |
TW355815B (en) * | 1996-05-28 | 1999-04-11 | Canon Kasei Kk | Cleaning methods of porous surface and semiconductor surface |
US6058945A (en) * | 1996-05-28 | 2000-05-09 | Canon Kabushiki Kaisha | Cleaning methods of porous surface and semiconductor surface |
JPH10109072A (en) * | 1996-10-04 | 1998-04-28 | Puretetsuku:Kk | High frequency washing device |
TW496786B (en) | 2000-12-16 | 2002-08-01 | Metal Ind Redearch & Amp Dev C | Liquidized gas cleaning system |
JP3453366B2 (en) * | 2001-01-25 | 2003-10-06 | 株式会社半導体先端テクノロジーズ | Apparatus and method for cleaning substrate |
JP2003031535A (en) * | 2001-07-11 | 2003-01-31 | Mitsubishi Electric Corp | Ultrasonic cleaning method of semiconductor manufacturing apparatus |
JP3834611B2 (en) * | 2001-08-16 | 2006-10-18 | 独立行政法人産業技術総合研究所 | Cavitation bubble observation device |
GB2384185B (en) | 2001-12-06 | 2003-12-17 | Barrie Mellor | Cleaning process |
JP2005093873A (en) | 2003-09-19 | 2005-04-07 | Ebara Corp | Substrate treating device |
JP4352880B2 (en) * | 2003-12-02 | 2009-10-28 | セイコーエプソン株式会社 | Cleaning method and cleaning device |
JP4623706B2 (en) * | 2004-04-14 | 2011-02-02 | 東京エレクトロン株式会社 | Ultrasonic cleaning equipment |
US7443079B2 (en) | 2004-09-17 | 2008-10-28 | Product Systems Incorporated | Method and apparatus for cavitation threshold characterization and control |
US20060060991A1 (en) | 2004-09-21 | 2006-03-23 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for controlled transient cavitation |
US7392814B2 (en) * | 2004-12-24 | 2008-07-01 | Dainippon Screen Mfg. Co., Ltd. | Substrate processing apparatus and method |
JP4159574B2 (en) * | 2005-06-21 | 2008-10-01 | 株式会社カイジョー | Deaeration device and ultrasonic cleaning device using the same |
JP4999338B2 (en) | 2006-03-15 | 2012-08-15 | 東京エレクトロン株式会社 | Substrate cleaning method, substrate cleaning apparatus, program, and recording medium |
JP4869957B2 (en) | 2006-03-22 | 2012-02-08 | 大日本スクリーン製造株式会社 | Substrate processing equipment |
US7691388B2 (en) * | 2006-03-24 | 2010-04-06 | Ocean Nutrition Canada Limited | Compositions comprising Porphyra and methods of making and using thereof |
JP4599321B2 (en) * | 2006-03-30 | 2010-12-15 | 富士フイルム株式会社 | Method for manufacturing magnetic recording medium |
JP4705517B2 (en) * | 2006-05-19 | 2011-06-22 | 東京エレクトロン株式会社 | Substrate cleaning method, substrate cleaning apparatus, program, and recording medium |
JP5015717B2 (en) | 2007-10-15 | 2012-08-29 | 東京エレクトロン株式会社 | Substrate cleaning device |
US8147619B2 (en) * | 2009-05-16 | 2012-04-03 | Heiko Ackermann | Chemical cavitation and cleaning process |
US8026496B2 (en) | 2009-07-02 | 2011-09-27 | Raytheon Company | Acoustic crystal sonoluminescent cavitation devices and IR/THz sources |
JP2011119514A (en) * | 2009-12-04 | 2011-06-16 | Toshiba Corp | Cleaning method of substrate, and cleaning device of substrate |
US20110272836A1 (en) * | 2010-04-12 | 2011-11-10 | Selecta Biosciences, Inc. | Eccentric vessels |
JP2012081430A (en) | 2010-10-13 | 2012-04-26 | Hitachi Kokusai Denki Engineering:Kk | Ultrasonic cleaning apparatus |
JP5526118B2 (en) * | 2011-12-26 | 2014-06-18 | ジルトロニック アクチエンゲゼルシャフト | Ultrasonic cleaning method |
JP5453488B2 (en) * | 2012-05-24 | 2014-03-26 | ジルトロニック アクチエンゲゼルシャフト | Ultrasonic cleaning method and ultrasonic cleaning apparatus |
JP5453487B2 (en) * | 2012-05-24 | 2014-03-26 | ジルトロニック アクチエンゲゼルシャフト | Ultrasonic cleaning method and ultrasonic cleaning apparatus |
JP5872382B2 (en) * | 2012-05-24 | 2016-03-01 | ジルトロニック アクチエンゲゼルシャフトSiltronic AG | Ultrasonic cleaning method |
JP5894858B2 (en) * | 2012-05-24 | 2016-03-30 | ジルトロニック アクチエンゲゼルシャフトSiltronic AG | Ultrasonic cleaning method |
-
2012
- 2012-05-24 JP JP2012118634A patent/JP5872382B2/en not_active Expired - Fee Related
-
2013
- 2013-05-10 SG SG10201509581SA patent/SG10201509581SA/en unknown
- 2013-05-10 KR KR1020130053069A patent/KR20130132270A/en active Application Filing
- 2013-05-10 US US13/891,236 patent/US9773688B2/en active Active
- 2013-05-15 EP EP13167906.0A patent/EP2666553B1/en not_active Not-in-force
- 2013-05-15 TW TW102117186A patent/TWI548469B/en not_active IP Right Cessation
- 2013-05-21 CN CN201310189030.7A patent/CN103418574B/en not_active Expired - Fee Related
-
2015
- 2015-06-12 KR KR1020150083382A patent/KR101990175B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP2666553A1 (en) | 2013-11-27 |
TWI548469B (en) | 2016-09-11 |
JP2013247184A (en) | 2013-12-09 |
KR20130132270A (en) | 2013-12-04 |
US20130312785A1 (en) | 2013-11-28 |
TW201402237A (en) | 2014-01-16 |
CN103418574B (en) | 2016-12-07 |
EP2666553B1 (en) | 2015-12-30 |
US9773688B2 (en) | 2017-09-26 |
KR101990175B1 (en) | 2019-06-17 |
CN103418574A (en) | 2013-12-04 |
KR20150075070A (en) | 2015-07-02 |
JP5872382B2 (en) | 2016-03-01 |
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