SE8802372L - Mikroroentgenstraale-spektrometer - Google Patents
Mikroroentgenstraale-spektrometerInfo
- Publication number
- SE8802372L SE8802372L SE8802372A SE8802372A SE8802372L SE 8802372 L SE8802372 L SE 8802372L SE 8802372 A SE8802372 A SE 8802372A SE 8802372 A SE8802372 A SE 8802372A SE 8802372 L SE8802372 L SE 8802372L
- Authority
- SE
- Sweden
- Prior art keywords
- rays
- ray
- radiation
- capillary
- energy
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE8802372A SE8802372L (sv) | 1988-06-23 | 1988-06-23 | Mikroroentgenstraale-spektrometer |
| PCT/SE1989/000346 WO1989012817A1 (en) | 1988-06-23 | 1989-06-19 | X-ray microbeam spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE8802372A SE8802372L (sv) | 1988-06-23 | 1988-06-23 | Mikroroentgenstraale-spektrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| SE8802372D0 SE8802372D0 (sv) | 1988-06-23 |
| SE8802372L true SE8802372L (sv) | 1989-12-24 |
Family
ID=20372722
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE8802372A SE8802372L (sv) | 1988-06-23 | 1988-06-23 | Mikroroentgenstraale-spektrometer |
Country Status (2)
| Country | Link |
|---|---|
| SE (1) | SE8802372L ( ) |
| WO (1) | WO1989012817A1 ( ) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101858874B (zh) * | 2010-05-18 | 2012-07-25 | 北京师范大学 | 微束质子荧光谱仪 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4317036A (en) * | 1980-03-11 | 1982-02-23 | Wang Chia Gee | Scanning X-ray microscope |
-
1988
- 1988-06-23 SE SE8802372A patent/SE8802372L/ not_active Application Discontinuation
-
1989
- 1989-06-19 WO PCT/SE1989/000346 patent/WO1989012817A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO1989012817A1 (en) | 1989-12-28 |
| SE8802372D0 (sv) | 1988-06-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| NAV | Patent application has lapsed |
Ref document number: 8802372-6 Effective date: 19910101 |