SE8500476D0 - Anordning for metning av elektroniska enheter - Google Patents

Anordning for metning av elektroniska enheter

Info

Publication number
SE8500476D0
SE8500476D0 SE8500476A SE8500476A SE8500476D0 SE 8500476 D0 SE8500476 D0 SE 8500476D0 SE 8500476 A SE8500476 A SE 8500476A SE 8500476 A SE8500476 A SE 8500476A SE 8500476 D0 SE8500476 D0 SE 8500476D0
Authority
SE
Sweden
Prior art keywords
electronic unit
measurement
pct
recess
arrangement
Prior art date
Application number
SE8500476A
Other languages
English (en)
Other versions
SE448404B (sv
SE8500476L (sv
Inventor
L Hultin
Original Assignee
Probe Hb
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Probe Hb filed Critical Probe Hb
Priority to SE8500476A priority Critical patent/SE448404B/sv
Publication of SE8500476D0 publication Critical patent/SE8500476D0/sv
Priority to PCT/SE1986/000041 priority patent/WO1986004685A1/en
Priority to US06/914,826 priority patent/US4845427A/en
Priority to JP61501054A priority patent/JPS62502062A/ja
Priority to EP86901166A priority patent/EP0252080A1/en
Publication of SE8500476L publication Critical patent/SE8500476L/sv
Priority to DK455786A priority patent/DK455786D0/da
Priority to NO863957A priority patent/NO168732C/no
Publication of SE448404B publication Critical patent/SE448404B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Push-Button Switches (AREA)
  • Tests Of Electronic Circuits (AREA)
SE8500476A 1985-02-04 1985-02-04 Anordning for temporer sammankoppling av ett metinstrument med en elektronisk enhet SE448404B (sv)

Priority Applications (7)

Application Number Priority Date Filing Date Title
SE8500476A SE448404B (sv) 1985-02-04 1985-02-04 Anordning for temporer sammankoppling av ett metinstrument med en elektronisk enhet
PCT/SE1986/000041 WO1986004685A1 (en) 1985-02-04 1986-02-03 Arrangement for the measurement of electronic units
US06/914,826 US4845427A (en) 1985-02-04 1986-02-03 Arrangement for the measurement of electronic units
JP61501054A JPS62502062A (ja) 1985-02-04 1986-02-03 電子ユニットの測定装置
EP86901166A EP0252080A1 (en) 1985-02-04 1986-02-03 Arrangement for the measurement of electronic units
DK455786A DK455786D0 (da) 1985-02-04 1986-09-24 Anordning til maaling af elektroniske enheder
NO863957A NO168732C (no) 1985-02-04 1986-10-03 Anordning for midlertidig tilkopling av et maaleinstrumenttil en elektronisk enhet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8500476A SE448404B (sv) 1985-02-04 1985-02-04 Anordning for temporer sammankoppling av ett metinstrument med en elektronisk enhet

Publications (3)

Publication Number Publication Date
SE8500476D0 true SE8500476D0 (sv) 1985-02-04
SE8500476L SE8500476L (sv) 1986-08-05
SE448404B SE448404B (sv) 1987-02-16

Family

ID=20358981

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8500476A SE448404B (sv) 1985-02-04 1985-02-04 Anordning for temporer sammankoppling av ett metinstrument med en elektronisk enhet

Country Status (6)

Country Link
US (1) US4845427A (sv)
EP (1) EP0252080A1 (sv)
JP (1) JPS62502062A (sv)
DK (1) DK455786D0 (sv)
SE (1) SE448404B (sv)
WO (1) WO1986004685A1 (sv)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5446393A (en) * 1993-05-21 1995-08-29 Schaefer; Richard K. Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin
KR970009858B1 (ko) * 1994-01-12 1997-06-18 엘지반도체 주식회사 다층 레지스트 패턴 형성방법
US6369592B1 (en) 1999-05-24 2002-04-09 International Business Machines Corporation Probe for testing and repairing printed circuit features
US6191595B1 (en) * 1999-07-30 2001-02-20 Credence Systems Corporation Adhesive attaching, thermal releasing flat pack probe assembly
US7526972B2 (en) 2006-05-08 2009-05-05 Tektronix, Inc. Probe holder for various thickness substrates
CN103884876B (zh) * 2014-03-31 2016-04-27 工业和信息化部电子第五研究所 电子元件热阻测试夹具、系统和方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1910827A (en) * 1930-06-11 1933-05-23 Hazeltine Corp Vacuum-tube voltmeter
US3284964A (en) * 1964-03-26 1966-11-15 Saito Norio Flexible beam structures
FR2085185A1 (en) * 1970-01-09 1971-12-24 Commissariat Energie Atomique Mechanical handling manipulator - remote-controlled and motorised for shielded objects
US3787768A (en) * 1970-12-25 1974-01-22 Matsushita Electric Ind Co Ltd Inspection apparatus for printed circuit boards
GB1508884A (en) * 1975-05-17 1978-04-26 Int Computers Ltd Apparatus for testing printed circuit board assemblies
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte
DE3238949C2 (de) * 1982-10-21 1985-03-14 Hans-Jürgen 6477 Limeshain Wagner Einrichtung zum Prüfen von mit Steckern versehenen Leitungen
FR2538554B3 (fr) * 1982-12-28 1987-04-10 Thomson Csf Dispositif d'interface entre une carte portant un circuit electronique et un systeme de test de ce circuit
GB8303694D0 (en) * 1983-02-10 1983-03-16 Atomic Energy Authority Uk Manipulators
US4625164A (en) * 1984-03-05 1986-11-25 Pylon Company Vacuum actuated bi-level test fixture

Also Published As

Publication number Publication date
WO1986004685A1 (en) 1986-08-14
US4845427A (en) 1989-07-04
JPS62502062A (ja) 1987-08-13
SE448404B (sv) 1987-02-16
SE8500476L (sv) 1986-08-05
DK455786A (da) 1986-09-24
EP0252080A1 (en) 1988-01-13
DK455786D0 (da) 1986-09-24

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