DK455786D0 - Anordning til maaling af elektroniske enheder - Google Patents

Anordning til maaling af elektroniske enheder

Info

Publication number
DK455786D0
DK455786D0 DK455786A DK455786A DK455786D0 DK 455786 D0 DK455786 D0 DK 455786D0 DK 455786 A DK455786 A DK 455786A DK 455786 A DK455786 A DK 455786A DK 455786 D0 DK455786 D0 DK 455786D0
Authority
DK
Denmark
Prior art keywords
measurement
electronic devices
electronic
devices
Prior art date
Application number
DK455786A
Other languages
English (en)
Other versions
DK455786A (da
Inventor
Leino Hultin
Original Assignee
Leino Hultin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leino Hultin filed Critical Leino Hultin
Publication of DK455786D0 publication Critical patent/DK455786D0/da
Publication of DK455786A publication Critical patent/DK455786A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Push-Button Switches (AREA)
  • Tests Of Electronic Circuits (AREA)
DK455786A 1985-02-04 1986-09-24 Anordning til maaling af elektroniske enheder DK455786A (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE8500476A SE448404B (sv) 1985-02-04 1985-02-04 Anordning for temporer sammankoppling av ett metinstrument med en elektronisk enhet
PCT/SE1986/000041 WO1986004685A1 (en) 1985-02-04 1986-02-03 Arrangement for the measurement of electronic units

Publications (2)

Publication Number Publication Date
DK455786D0 true DK455786D0 (da) 1986-09-24
DK455786A DK455786A (da) 1986-09-24

Family

ID=20358981

Family Applications (1)

Application Number Title Priority Date Filing Date
DK455786A DK455786A (da) 1985-02-04 1986-09-24 Anordning til maaling af elektroniske enheder

Country Status (6)

Country Link
US (1) US4845427A (da)
EP (1) EP0252080A1 (da)
JP (1) JPS62502062A (da)
DK (1) DK455786A (da)
SE (1) SE448404B (da)
WO (1) WO1986004685A1 (da)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5446393A (en) * 1993-05-21 1995-08-29 Schaefer; Richard K. Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin
KR970009858B1 (ko) * 1994-01-12 1997-06-18 엘지반도체 주식회사 다층 레지스트 패턴 형성방법
US6369592B1 (en) 1999-05-24 2002-04-09 International Business Machines Corporation Probe for testing and repairing printed circuit features
US6191595B1 (en) * 1999-07-30 2001-02-20 Credence Systems Corporation Adhesive attaching, thermal releasing flat pack probe assembly
US7526972B2 (en) 2006-05-08 2009-05-05 Tektronix, Inc. Probe holder for various thickness substrates
CN103884876B (zh) * 2014-03-31 2016-04-27 工业和信息化部电子第五研究所 电子元件热阻测试夹具、系统和方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1910827A (en) * 1930-06-11 1933-05-23 Hazeltine Corp Vacuum-tube voltmeter
US3284964A (en) * 1964-03-26 1966-11-15 Saito Norio Flexible beam structures
FR2085185A1 (en) * 1970-01-09 1971-12-24 Commissariat Energie Atomique Mechanical handling manipulator - remote-controlled and motorised for shielded objects
US3787768A (en) * 1970-12-25 1974-01-22 Matsushita Electric Ind Co Ltd Inspection apparatus for printed circuit boards
GB1508884A (en) * 1975-05-17 1978-04-26 Int Computers Ltd Apparatus for testing printed circuit board assemblies
DE3136896A1 (de) * 1981-09-17 1983-04-14 Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz Vorrichtung zum pruefen einer elektronischen leiterplatte
DE3238949C2 (de) * 1982-10-21 1985-03-14 Hans-Jürgen 6477 Limeshain Wagner Einrichtung zum Prüfen von mit Steckern versehenen Leitungen
FR2538554B3 (fr) * 1982-12-28 1987-04-10 Thomson Csf Dispositif d'interface entre une carte portant un circuit electronique et un systeme de test de ce circuit
GB8303694D0 (en) * 1983-02-10 1983-03-16 Atomic Energy Authority Uk Manipulators
US4625164A (en) * 1984-03-05 1986-11-25 Pylon Company Vacuum actuated bi-level test fixture

Also Published As

Publication number Publication date
WO1986004685A1 (en) 1986-08-14
EP0252080A1 (en) 1988-01-13
US4845427A (en) 1989-07-04
SE448404B (sv) 1987-02-16
SE8500476L (sv) 1986-08-05
DK455786A (da) 1986-09-24
JPS62502062A (ja) 1987-08-13
SE8500476D0 (sv) 1985-02-04

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Legal Events

Date Code Title Description
AHS Application shelved for other reasons than non-payment