SE8404376L - METHOD DEVICE FOR IDENTIFYING THE SURFACE PROFILE WITH A FORMAL - Google Patents
METHOD DEVICE FOR IDENTIFYING THE SURFACE PROFILE WITH A FORMALInfo
- Publication number
- SE8404376L SE8404376L SE8404376A SE8404376A SE8404376L SE 8404376 L SE8404376 L SE 8404376L SE 8404376 A SE8404376 A SE 8404376A SE 8404376 A SE8404376 A SE 8404376A SE 8404376 L SE8404376 L SE 8404376L
- Authority
- SE
- Sweden
- Prior art keywords
- point
- light
- devices
- optical axis
- light beam
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Recording Or Reproduction (AREA)
- Measurement Of Optical Distance (AREA)
- Automatic Focus Adjustment (AREA)
Abstract
A measuring set-up is provided which serves for determining the surface profile of an object (13) by measuring the distance between a point on the object (13) and a reference point and by sequential repetition of these measurements. The set-up contains a light source (10), which transmits a thin light beam, a first optical system (11, 19), which guides the light beam to the object (13) in order to produce a point (S1) of light thereon, and a second optical system (11, 23) for guiding the light reflected from the point (S1) of light to a light-sensitive detector (15). The measuring set-up further contains devices (11) which are contained in the first optical system (11, 19) and which focus the light beam on the optical axis (20) of the system, devices (22) for displacing the focal point along the optical axis (20), deflecting devices (21) for deflecting the beam in such a way that the point of light moves on the object (13) or onto the optical axis (20), devices (24) for determining the distance (Zt) between the reference point and the focal point (f) on the optical axis (20) of the first optical system (11, 19), and devices (24) for determining the distance (zd) between the object (13) and the focal point (f) from the distance of the deflection of the light beam from the point of intersection of the light beam with the optical axis on the surface of the object and ... Original abstract incomplete. <IMAGE>
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8404376A SE444728B (en) | 1984-08-31 | 1984-08-31 | METHOD DEVICE FOR IDENTIFYING THE SURFACE PROFILE WITH A FORMAL |
DE19853528684 DE3528684A1 (en) | 1984-08-31 | 1985-08-09 | Measuring set-up for determining the surface profile of an object |
JP60188739A JPH0658213B2 (en) | 1984-08-31 | 1985-08-29 | Measuring device for identifying the surface profile of an object |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8404376A SE444728B (en) | 1984-08-31 | 1984-08-31 | METHOD DEVICE FOR IDENTIFYING THE SURFACE PROFILE WITH A FORMAL |
Publications (3)
Publication Number | Publication Date |
---|---|
SE8404376D0 SE8404376D0 (en) | 1984-08-31 |
SE8404376L true SE8404376L (en) | 1986-03-01 |
SE444728B SE444728B (en) | 1986-04-28 |
Family
ID=20356869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8404376A SE444728B (en) | 1984-08-31 | 1984-08-31 | METHOD DEVICE FOR IDENTIFYING THE SURFACE PROFILE WITH A FORMAL |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPH0658213B2 (en) |
DE (1) | DE3528684A1 (en) |
SE (1) | SE444728B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07107481B2 (en) * | 1987-05-21 | 1995-11-15 | アンリツ株式会社 | Displacement measuring device |
WO1991003988A1 (en) * | 1989-09-22 | 1991-04-04 | Peter Rohleder | Device for the production of tooth replacement parts |
US5355210A (en) * | 1991-12-20 | 1994-10-11 | Rotlex Optics Ltd. | Method and apparatus for measuring optical properties of optical devices |
DE9204528U1 (en) * | 1992-04-02 | 1992-09-17 | Heidelberg Instruments Mikrotechnik GmbH, 6900 Heidelberg | Arrangement for contactless scanning |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2256736C3 (en) * | 1972-11-18 | 1979-01-25 | Ibm Deutschland Gmbh, 7000 Stuttgart | Measuring arrangement for the automatic testing of the surface quality and evenness of a workpiece surface |
US4180322A (en) * | 1978-05-01 | 1979-12-25 | Alcyon Equipment S.A. | Interior measurement of enclosed spaces |
US4299491A (en) * | 1979-12-11 | 1981-11-10 | United Technologies Corporation | Noncontact optical gauging system |
JPS57127933A (en) * | 1981-01-27 | 1982-08-09 | Sharp Corp | Pickup device |
JPS5927207A (en) * | 1982-08-07 | 1984-02-13 | Agency Of Ind Science & Technol | Noncontact type surface shape and roughness meter |
-
1984
- 1984-08-31 SE SE8404376A patent/SE444728B/en not_active IP Right Cessation
-
1985
- 1985-08-09 DE DE19853528684 patent/DE3528684A1/en active Granted
- 1985-08-29 JP JP60188739A patent/JPH0658213B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0658213B2 (en) | 1994-08-03 |
SE8404376D0 (en) | 1984-08-31 |
JPS6165106A (en) | 1986-04-03 |
DE3528684C2 (en) | 1988-12-22 |
SE444728B (en) | 1986-04-28 |
DE3528684A1 (en) | 1986-03-06 |
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