SE8204751L - Sett och apparat for analysering av gadoliniumoxid - Google Patents

Sett och apparat for analysering av gadoliniumoxid

Info

Publication number
SE8204751L
SE8204751L SE8204751A SE8204751A SE8204751L SE 8204751 L SE8204751 L SE 8204751L SE 8204751 A SE8204751 A SE 8204751A SE 8204751 A SE8204751 A SE 8204751A SE 8204751 L SE8204751 L SE 8204751L
Authority
SE
Sweden
Prior art keywords
primary
radiation
analyzing
gadolinium oxide
materials
Prior art date
Application number
SE8204751A
Other languages
Unknown language ( )
English (en)
Other versions
SE8204751D0 (sv
SE460801B (sv
Inventor
A J Zeits
R O Canada
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of SE8204751D0 publication Critical patent/SE8204751D0/sv
Publication of SE8204751L publication Critical patent/SE8204751L/sv
Publication of SE460801B publication Critical patent/SE460801B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
SE8204751A 1981-08-20 1982-08-18 Saett och apparat foer analysering av aatminstone ett prov innehaallande okaenda koncentrationer av ett primaermaterial och aatminstone ett sekundaermaterial SE460801B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/294,542 US4459258A (en) 1981-08-20 1981-08-20 Elemental analyzer and method

Publications (3)

Publication Number Publication Date
SE8204751D0 SE8204751D0 (sv) 1982-08-18
SE8204751L true SE8204751L (sv) 1983-02-21
SE460801B SE460801B (sv) 1989-11-20

Family

ID=23133889

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8204751A SE460801B (sv) 1981-08-20 1982-08-18 Saett och apparat foer analysering av aatminstone ett prov innehaallande okaenda koncentrationer av ett primaermaterial och aatminstone ett sekundaermaterial

Country Status (6)

Country Link
US (1) US4459258A (sv)
JP (1) JPS5866042A (sv)
DE (1) DE3230005C2 (sv)
ES (1) ES8500499A1 (sv)
IT (1) IT1153156B (sv)
SE (1) SE460801B (sv)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USH75H (en) 1983-11-23 1986-06-03 The United States Of America As Respresented By The United States Department Of Energy Nuclear diagnostic for fast alpha particles
US5053185A (en) * 1990-05-23 1991-10-01 Gamma-Metrics Material analyzer with carousel

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2707555A (en) * 1950-06-08 1955-05-03 Antoine M Gaudin Beryl ore selector
US3102952A (en) * 1954-05-27 1963-09-03 Philips Corp X-ray fluorescence analysis of multi-component systems
GB940056A (en) * 1961-06-06 1963-10-23 Saadia Amiel Determination of o
GB1017595A (en) * 1962-06-20 1966-01-19 Atomic Energy Authority Uk Improvements in or relating to radiometric analysis techniques
US3445651A (en) * 1964-07-06 1969-05-20 Hilger & Watts Ltd Radiometric analysis of powdered sample material
US3562525A (en) * 1967-06-29 1971-02-09 Minnesota Mining & Mfg X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements
US3671744A (en) * 1970-10-05 1972-06-20 Minnesota Mining & Mfg Digital differential emission x-ray gauge
JPS6010257B2 (ja) * 1973-09-08 1985-03-15 正人 森田 同位元素の定量法
ZA741707B (en) * 1974-03-15 1975-07-30 Chamber Of Mines Services Ltd Determining heavy element concentration in ores
DE2727989C3 (de) * 1977-06-22 1980-05-08 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Einrichtung zur Bestimmung von Uran und/oder Thorium in Erzproben
US4229654A (en) * 1978-08-07 1980-10-21 General Electric Company Determining fissile content of nuclear fuel elements

Also Published As

Publication number Publication date
JPS5866042A (ja) 1983-04-20
DE3230005C2 (de) 1986-11-27
IT8222690A1 (it) 1984-01-30
JPH0313544B2 (sv) 1991-02-22
ES515129A0 (es) 1984-10-16
DE3230005A1 (de) 1983-03-24
US4459258A (en) 1984-07-10
IT1153156B (it) 1987-01-14
SE8204751D0 (sv) 1982-08-18
IT8222690A0 (it) 1982-07-30
ES8500499A1 (es) 1984-10-16
SE460801B (sv) 1989-11-20

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