SE7800736L - Anordning for kontroll av avstand i en bild - Google Patents

Anordning for kontroll av avstand i en bild

Info

Publication number
SE7800736L
SE7800736L SE7800736A SE7800736A SE7800736L SE 7800736 L SE7800736 L SE 7800736L SE 7800736 A SE7800736 A SE 7800736A SE 7800736 A SE7800736 A SE 7800736A SE 7800736 L SE7800736 L SE 7800736L
Authority
SE
Sweden
Prior art keywords
image
control device
distance control
distance
control
Prior art date
Application number
SE7800736A
Other languages
English (en)
Other versions
SE412966B (sv
Inventor
Sok
Original Assignee
Danielsson Per Erik
Kruse Carl Axel Bjorn
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Danielsson Per Erik, Kruse Carl Axel Bjorn filed Critical Danielsson Per Erik
Priority to SE7800736A priority Critical patent/SE412966B/sv
Priority to US05/972,640 priority patent/US4223387A/en
Priority to DE19792901683 priority patent/DE2901683A1/de
Publication of SE7800736L publication Critical patent/SE7800736L/sv
Publication of SE412966B publication Critical patent/SE412966B/sv

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/36—Applying a local operator, i.e. means to operate on image points situated in the vicinity of a given point; Non-linear local filtering operations, e.g. median filtering
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Nonlinear Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Multimedia (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
SE7800736A 1978-01-20 1978-01-20 Anordning for kontroll av avstand mellan objekt i en tvadimensionell diskretiserad bild SE412966B (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE7800736A SE412966B (sv) 1978-01-20 1978-01-20 Anordning for kontroll av avstand mellan objekt i en tvadimensionell diskretiserad bild
US05/972,640 US4223387A (en) 1978-01-20 1978-12-22 Device for examination of distances in a picture
DE19792901683 DE2901683A1 (de) 1978-01-20 1979-01-17 Einrichtung zum pruefen von abstaenden zwischen objekten in einem zweidimensionalen quantisierten bild

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7800736A SE412966B (sv) 1978-01-20 1978-01-20 Anordning for kontroll av avstand mellan objekt i en tvadimensionell diskretiserad bild

Publications (2)

Publication Number Publication Date
SE7800736L true SE7800736L (sv) 1979-07-21
SE412966B SE412966B (sv) 1980-03-24

Family

ID=20333727

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7800736A SE412966B (sv) 1978-01-20 1978-01-20 Anordning for kontroll av avstand mellan objekt i en tvadimensionell diskretiserad bild

Country Status (3)

Country Link
US (1) US4223387A (sv)
DE (1) DE2901683A1 (sv)
SE (1) SE412966B (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4661984A (en) * 1977-06-03 1987-04-28 Bentley William A Line inspection system
US4288852A (en) * 1979-11-28 1981-09-08 General Motors Corporation Method and apparatus for automatically determining sheet metal strain
US4510616A (en) * 1982-01-19 1985-04-09 The Environmental Research Institute Of Michigan Design rule checking using serial neighborhood processors
US4442542A (en) * 1982-01-29 1984-04-10 Sperry Corporation Preprocessing circuitry apparatus for digital data
US4555798A (en) * 1983-06-20 1985-11-26 Kla Instruments Corporation Automatic system and method for inspecting hole quality
US4578810A (en) * 1983-08-08 1986-03-25 Itek Corporation System for printed circuit board defect detection
US4598420A (en) * 1983-12-08 1986-07-01 Mts Systems Corporation Optical grid analyzer system for automatically determining strain in deformed sheet metal
DE3427981A1 (de) * 1984-07-28 1986-02-06 Telefunken electronic GmbH, 7100 Heilbronn Verfahren zur fehlererkennung an definierten strukturen
US4794647A (en) * 1985-04-08 1988-12-27 Northern Telecom Limited Automatic optical inspection system
US4776022A (en) * 1985-04-09 1988-10-04 Aoi Systems, Inc. System for printed circuit board defect detection
US5046109A (en) * 1986-03-12 1991-09-03 Nikon Corporation Pattern inspection apparatus
JPH0679339B2 (ja) * 1988-04-11 1994-10-05 株式会社イーゼル 画像処理方法
US4930099A (en) * 1988-10-07 1990-05-29 Hughes Aircraft Company Wavefront vector correlation processor and method
JP2927916B2 (ja) * 1990-09-04 1999-07-28 三菱電機株式会社 距離検出装置
US5345242A (en) * 1990-09-27 1994-09-06 Loral Aerospace Corp. Clutter rejection using connectivity
JP2500961B2 (ja) * 1990-11-27 1996-05-29 大日本スクリーン製造株式会社 プリント基板の座残り検査方法
US5384860A (en) * 1992-08-20 1995-01-24 Loral Aerospace Corp. Real time connectivity algorithm system

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5022416B1 (sv) * 1969-05-14 1975-07-30
US3706071A (en) * 1970-06-22 1972-12-12 Information Int Inc Binary image processor
US3893080A (en) * 1973-06-29 1975-07-01 Ibm Minutiae recognition system
US3909602A (en) * 1973-09-27 1975-09-30 California Inst Of Techn Automatic visual inspection system for microelectronics
US4003024A (en) * 1975-10-14 1977-01-11 Rockwell International Corporation Two-dimensional binary data enhancement system
JPS5832434B2 (ja) * 1976-11-15 1983-07-13 富士通株式会社 認識装置
US4109237A (en) * 1977-01-17 1978-08-22 Hill Robert B Apparatus and method for identifying individuals through their retinal vasculature patterns

Also Published As

Publication number Publication date
SE412966B (sv) 1980-03-24
DE2901683A1 (de) 1979-07-26
US4223387A (en) 1980-09-16

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