SE7800593L - Ytsprickdetektor - Google Patents

Ytsprickdetektor

Info

Publication number
SE7800593L
SE7800593L SE7800593A SE7800593A SE7800593L SE 7800593 L SE7800593 L SE 7800593L SE 7800593 A SE7800593 A SE 7800593A SE 7800593 A SE7800593 A SE 7800593A SE 7800593 L SE7800593 L SE 7800593L
Authority
SE
Sweden
Prior art keywords
surface detector
detector
Prior art date
Application number
SE7800593A
Other languages
English (en)
Swedish (sv)
Inventor
T Godai
Y Takeuchi
K Nakai
K Takeuchi
Y Morioka
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Publication of SE7800593L publication Critical patent/SE7800593L/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE7800593A 1977-01-19 1978-01-18 Ytsprickdetektor SE7800593L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP402277A JPS5389794A (en) 1977-01-19 1977-01-19 Defect inspecting apparatus

Publications (1)

Publication Number Publication Date
SE7800593L true SE7800593L (sv) 1978-07-20

Family

ID=11573328

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7800593A SE7800593L (sv) 1977-01-19 1978-01-18 Ytsprickdetektor

Country Status (5)

Country Link
US (1) US4185921A (xx)
JP (1) JPS5389794A (xx)
DE (1) DE2801869C3 (xx)
GB (1) GB1588371A (xx)
SE (1) SE7800593L (xx)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4331872A (en) * 1979-06-29 1982-05-25 Nippon Steel Corporation Method for measurement of distribution of inclusions in a slab by electron beam irradiation
FR2580203B1 (fr) * 1985-04-12 1987-08-28 Usinor Machine d'ebavurage de brames
DE4214321C2 (de) * 1992-05-04 2002-05-16 Focke & Co Vorrichtung zum Wenden von Packungen
FR2816296B1 (fr) * 2000-11-09 2002-12-20 Commissariat Energie Atomique Dispositif de mise en defilement continu d'objet a symetrie de revolution-application a l'inspection visuelle et au controle
JP4707847B2 (ja) * 2001-01-16 2011-06-22 株式会社トーメーコーポレーション 角膜厚み測定アタッチメント
US20070146692A1 (en) * 2005-12-23 2007-06-28 Xerox Corporation Fiber optic specular surface flaw detection
US7362450B2 (en) * 2005-12-23 2008-04-22 Xerox Corporation Specular surface flaw detection
DE102008020245A1 (de) * 2008-04-22 2009-11-05 Mas Gmbh Prüfstand und Automatisierungsmaschine

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2857800A (en) * 1952-11-20 1958-10-28 Timken Roller Bearing Co Roller inspecting device
US3036491A (en) * 1958-08-20 1962-05-29 Schier Hans Optical arrangement for inspecting bodies of revolution
GB1206136A (en) * 1966-09-29 1970-09-23 Talcoma Teoranta Improved method and apparatus for inspecting translucent containers
US3584963A (en) * 1968-12-27 1971-06-15 Rca Corp Optical flaw detector
JPS5149234B2 (xx) * 1971-08-31 1976-12-25
US3812349A (en) * 1973-04-06 1974-05-21 Laser Sciences Inc Apparatus for inspecting cigarettes or the like
US3901381A (en) * 1973-10-10 1975-08-26 Ball Brothers Service Corp Automatic ware handler
DE2404972A1 (de) * 1974-02-01 1975-08-07 Ciba Geigy Ag Vorrichtung zur ermittlung von fehlstellen auf der oberflaeche eines bewegten reflektierenden materials

Also Published As

Publication number Publication date
JPS5389794A (en) 1978-08-07
DE2801869A1 (de) 1978-07-20
GB1588371A (en) 1981-04-23
US4185921A (en) 1980-01-29
DE2801869B2 (de) 1981-02-26
JPS577663B2 (xx) 1982-02-12
DE2801869C3 (de) 1981-11-12

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