SE7502376L - - Google Patents

Info

Publication number
SE7502376L
SE7502376L SE7502376A SE7502376A SE7502376L SE 7502376 L SE7502376 L SE 7502376L SE 7502376 A SE7502376 A SE 7502376A SE 7502376 A SE7502376 A SE 7502376A SE 7502376 L SE7502376 L SE 7502376L
Authority
SE
Sweden
Application number
SE7502376A
Inventor
H M M Kessels
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of SE7502376L publication Critical patent/SE7502376L/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SE7502376A 1974-03-07 1975-03-04 SE7502376L (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7403065A NL7403065A (nl) 1974-03-07 1974-03-07 Preparaathouder voor een roentgendiffraktieappa- raat.

Publications (1)

Publication Number Publication Date
SE7502376L true SE7502376L (de) 1975-09-08

Family

ID=19820901

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7502376A SE7502376L (de) 1974-03-07 1975-03-04

Country Status (9)

Country Link
US (1) US3973120A (de)
JP (1) JPS50123385A (de)
BE (1) BE826337A (de)
DE (1) DE2507664C3 (de)
FR (1) FR2263512B1 (de)
GB (1) GB1500938A (de)
IT (1) IT1030267B (de)
NL (1) NL7403065A (de)
SE (1) SE7502376L (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954844U (ja) * 1982-10-04 1984-04-10 三井東圧化学株式会社 X線分析用試料ホルダ−
US5181233A (en) * 1991-11-08 1993-01-19 Florida State University Specimen holder
US5350923A (en) * 1992-02-06 1994-09-27 Northern Telecom Limited Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods
US5627872A (en) * 1995-02-03 1997-05-06 Northrop Grumman Corporation Stationary exit window for X-ray lithography beamline
DE10322040A1 (de) * 2003-05-16 2004-12-09 Forschungszentrum Karlsruhe Gmbh Koppel- und Justiervorrichtung für ein Röntgendiffraktometer
ES2378045B1 (es) * 2009-04-13 2013-02-15 Consejo Superior De Investigaciones Científicas (Csic) Dispositivo para alojar una muestra en el interior de una cámara de dispersion o difracción de rayos x.
JP7181603B2 (ja) 2019-08-16 2022-12-01 株式会社リガク X線分析用試料保持装置
EP4012390A1 (de) * 2020-12-11 2022-06-15 Malvern Panalytical B.V. Probenmontagesystem für ein röntgenanalysegerät

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3051834A (en) * 1959-09-16 1962-08-28 Shimula Yoshihiro Automatic recording system of x-ray diffraction patterns

Also Published As

Publication number Publication date
FR2263512B1 (de) 1979-10-19
DE2507664A1 (de) 1975-09-11
DE2507664C3 (de) 1979-07-05
IT1030267B (it) 1979-03-30
BE826337A (fr) 1975-09-05
GB1500938A (en) 1978-02-15
JPS50123385A (de) 1975-09-27
NL7403065A (nl) 1975-09-09
FR2263512A1 (de) 1975-10-03
DE2507664B2 (de) 1978-10-26
US3973120A (en) 1976-08-03

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