SE368626B - - Google Patents

Info

Publication number
SE368626B
SE368626B SE13093/71A SE1309371A SE368626B SE 368626 B SE368626 B SE 368626B SE 13093/71 A SE13093/71 A SE 13093/71A SE 1309371 A SE1309371 A SE 1309371A SE 368626 B SE368626 B SE 368626B
Authority
SE
Sweden
Application number
SE13093/71A
Inventor
H Grienauer
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of SE368626B publication Critical patent/SE368626B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
SE13093/71A 1970-10-20 1971-10-15 SE368626B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19702051511 DE2051511B2 (de) 1970-10-20 1970-10-20 Roentgentopographiegeraet

Publications (1)

Publication Number Publication Date
SE368626B true SE368626B (xx) 1974-07-08

Family

ID=5785657

Family Applications (1)

Application Number Title Priority Date Filing Date
SE13093/71A SE368626B (xx) 1970-10-20 1971-10-15

Country Status (6)

Country Link
US (1) US3751662A (xx)
CH (1) CH532785A (xx)
DE (1) DE2051511B2 (xx)
FR (1) FR2111520A5 (xx)
GB (1) GB1372885A (xx)
SE (1) SE368626B (xx)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992624A (en) * 1975-04-29 1976-11-16 The United States Of America As Represented By The Secretary Of The Army Apparatus and method of X-ray topography at cryogenic temperature
DE3439471A1 (de) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Verfahren und vorrichtung zum pruefen einkristalliner gegenstaende
DE4100680A1 (de) * 1991-01-11 1992-07-23 Siemens Ag Verfahren zur zerstoerungsfreien bestimmung von verformungen eines halbleiterkristalles in einem gehaeuse

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2829268A (en) * 1952-05-05 1958-04-01 Industrial Nucleonics Corp Standardization system
US3177360A (en) * 1962-09-14 1965-04-06 Norton Co Diffractometer with a rotatable support to hold plural samples for automatic analysis of crystalline material
US3435219A (en) * 1967-01-30 1969-03-25 Atomic Energy Commission Neutron spectrometer for high neutron flux

Also Published As

Publication number Publication date
DE2051511A1 (de) 1972-05-31
DE2051511C3 (xx) 1973-11-29
FR2111520A5 (xx) 1972-06-02
DE2051511B2 (de) 1973-05-03
CH532785A (de) 1973-01-15
US3751662A (en) 1973-08-07
GB1372885A (en) 1974-11-06

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