SE343705B - - Google Patents

Info

Publication number
SE343705B
SE343705B SE13847/67A SE1384767A SE343705B SE 343705 B SE343705 B SE 343705B SE 13847/67 A SE13847/67 A SE 13847/67A SE 1384767 A SE1384767 A SE 1384767A SE 343705 B SE343705 B SE 343705B
Authority
SE
Sweden
Application number
SE13847/67A
Inventor
W Duda
H Fleischer
J Reynolds
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE343705B publication Critical patent/SE343705B/xx

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D3/00Control of position or direction
    • G05D3/12Control of position or direction using feedback
    • G05D3/20Control of position or direction using feedback using a digital comparing device
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C13/00Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/04Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam
    • G11C13/042Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using optical elements ; using other beam accessed elements, e.g. electron or ion beam using information stored in the form of interference pattern

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Light Sources And Details Of Projection-Printing Devices (AREA)
SE13847/67A 1967-01-12 1967-10-10 SE343705B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US60880967A 1967-01-12 1967-01-12

Publications (1)

Publication Number Publication Date
SE343705B true SE343705B (xx) 1972-03-13

Family

ID=24438098

Family Applications (1)

Application Number Title Priority Date Filing Date
SE13847/67A SE343705B (xx) 1967-01-12 1967-10-10

Country Status (9)

Country Link
US (1) US3541338A (xx)
BE (1) BE703319A (xx)
CH (1) CH476348A (xx)
DE (1) DE1549782C3 (xx)
ES (1) ES345971A1 (xx)
FR (1) FR1538097A (xx)
GB (1) GB1138128A (xx)
NL (1) NL158009B (xx)
SE (1) SE343705B (xx)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3670153A (en) * 1970-10-08 1972-06-13 Rca Corp Machine implemented method for positioning and inspecting an object
US4259019A (en) * 1971-03-22 1981-03-31 Kasper Instruments, Inc. Apparatus for the automatic alignment of two superimposed objects, for example a semiconductor wafer and a transparent mask
US3955072A (en) * 1971-03-22 1976-05-04 Kasper Instruments, Inc. Apparatus for the automatic alignment of two superimposed objects for example a semiconductor wafer and a transparent mask
US4070117A (en) * 1972-06-12 1978-01-24 Kasper Instruments, Inc. Apparatus for the automatic alignment of two superimposed objects, e.g. a semiconductor wafer and mask
DE2114496C3 (de) * 1971-03-25 1981-05-07 Texas Instruments Deutschland Gmbh, 8050 Freising Maschine zum Befestigen von Verbindungsdrähten an mehreren Anschlußstellen eines Halbleiterbauelements und an den zugehörigen Anschlußstellen eines das Halbleiterbauelement aufnehmenden Gehäuses
US3838274A (en) * 1973-03-30 1974-09-24 Western Electric Co Electro-optical article positioning system
US3864564A (en) * 1973-09-26 1975-02-04 Corning Glass Works Acquisition system for slide analysis
US3992099A (en) * 1973-12-12 1976-11-16 Varo, Inc. Source discriminator for measuring angle of arrival and wavelength of radiant energy
US4123165A (en) * 1977-05-31 1978-10-31 The United States Of America As Represented By The Secretary Of The Army Attitude determination using two color, dual-sweeping laser system
US4154532A (en) * 1978-04-20 1979-05-15 The United States Of America As Represented By The Secretary Of The Navy High precision optical alignment system
FR2429447A1 (fr) * 1978-06-23 1980-01-18 Thomson Csf Systeme optique de projection muni d'un positionneur de plaque
US4383757A (en) * 1979-04-02 1983-05-17 Optimetrix Corporation Optical focusing system
US4540278A (en) * 1979-04-02 1985-09-10 Optimetrix Corporation Optical focusing system
FR2472209A1 (fr) * 1979-12-18 1981-06-26 Thomson Csf Systeme optique d'alignement automatique de deux motifs comportant des reperes s'alignement du type reseaux, notamment en photo-repetition directe sur silicium
JPS58113706A (ja) * 1981-12-26 1983-07-06 Nippon Kogaku Kk <Nikon> 水平位置検出装置
US4870289A (en) * 1987-09-25 1989-09-26 Matsushita Electric Industrial Co., Ltd. Apparatus for controlling relation in position between a photomask and a wafer
US4936655A (en) * 1988-07-07 1990-06-26 Grumman Aerospace Corporation Alignment fixture for an optical instrument
US4993809A (en) * 1988-10-07 1991-02-19 Grumman Aerospace Corporation Mounting fixture for an optical instrument
FR2661769B1 (fr) * 1990-05-02 1995-04-21 Thomson Csf Systeme d'enregistrement optique de donnees sur disque, et procedes de lecture et ecriture correspondants.
GB9125603D0 (en) * 1991-12-02 1992-01-29 Gec-Marconi Limited Optical analysis system and positioning apparatus therefor
US5666188A (en) * 1994-11-29 1997-09-09 Napp Systems, Inc. Printing plate mounting device
US5638154A (en) * 1994-11-29 1997-06-10 Napp Systems, Inc. Printing plate mounting device
US5734476A (en) * 1996-12-31 1998-03-31 Pitney Bowes Inc. Method for dimensional weighing with optics
JP3159163B2 (ja) 1998-04-06 2001-04-23 日本電気株式会社 走査露光方法及び走査露光装置
DE102017201794B4 (de) * 2017-02-06 2019-11-07 Carl Zeiss Smt Gmbh Prüfvorrichtung als Bestandteil eines Reflektometers zur Bestimmung einer Strahllage eines Lichtstrahls

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2998746A (en) * 1959-10-13 1961-09-05 Gievers John George Angular measurement system
US3107170A (en) * 1960-05-31 1963-10-15 Netke Martin Production of color images in sensitive emulsions
DE1477524A1 (de) * 1963-07-06 1969-05-29 Licentia Gmbh Verfahren zum selbsttaetigen digitalen Positionieren von Gegenstaenden,insbesondere Maschinenteilen bzw. zu ihrer Lagemessung unter Benutzung von binaeren Codemassstaeben
NL301413A (xx) * 1963-12-05
US3403260A (en) * 1965-03-08 1968-09-24 Bell Telephone Labor Inc Plural channel optical memory using color to discriminate among channels
US3324764A (en) * 1966-08-15 1967-06-13 Altman Gerald Photographic documentary storage process and apparatus

Also Published As

Publication number Publication date
FR1538097A (fr) 1968-08-30
ES345971A1 (es) 1968-12-01
DE1549782B2 (de) 1973-11-22
DE1549782A1 (de) 1971-11-18
NL6712011A (xx) 1968-07-15
DE1549782C3 (de) 1974-06-20
US3541338A (en) 1970-11-17
NL158009B (nl) 1978-09-15
BE703319A (xx) 1968-01-15
GB1138128A (en) 1968-12-27
CH476348A (de) 1969-07-31

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