SE323746B - - Google Patents

Info

Publication number
SE323746B
SE323746B SE11496/66A SE1149666A SE323746B SE 323746 B SE323746 B SE 323746B SE 11496/66 A SE11496/66 A SE 11496/66A SE 1149666 A SE1149666 A SE 1149666A SE 323746 B SE323746 B SE 323746B
Authority
SE
Sweden
Application number
SE11496/66A
Inventor
W Bray
E Hamilton
J Alford
H Armand
R Renker
R Ryon
L Jasper
S Moore
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of SE323746B publication Critical patent/SE323746B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
SE11496/66A 1965-08-25 1966-08-25 SE323746B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US482449A US3418573A (en) 1965-08-25 1965-08-25 Universal electronic test system for automatically making static and dynamic tests on an electronic device

Publications (1)

Publication Number Publication Date
SE323746B true SE323746B (xx) 1970-05-11

Family

ID=23916128

Family Applications (1)

Application Number Title Priority Date Filing Date
SE11496/66A SE323746B (xx) 1965-08-25 1966-08-25

Country Status (5)

Country Link
US (1) US3418573A (xx)
JP (1) JPS4417941B1 (xx)
DE (1) DE1541868C3 (xx)
GB (1) GB1160968A (xx)
SE (1) SE323746B (xx)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3512083A (en) * 1966-12-12 1970-05-12 Automated Measurements Corp Sampling system and apparatus for testing electronic devices using a plurality of self-contained probes
US3528006A (en) * 1968-04-01 1970-09-08 Sperry Rand Corp Apparatus for automatically testing the pulse propagation characteristics of digital electronic circuits
US3659088A (en) * 1970-08-06 1972-04-25 Cogar Corp Method for indicating memory chip failure modes
US3676777A (en) * 1970-08-10 1972-07-11 Tektronix Inc Apparatus for automatically testing integrated circuit devices
US4090132A (en) * 1976-03-10 1978-05-16 Solid State Measurements, Inc. Measurement of excess carrier lifetime in semiconductor devices
US4195258A (en) * 1977-03-01 1980-03-25 Intel Corporation Logic analyzer for integrated circuits, microcomputers, and the like
JPS5875073A (ja) * 1981-10-29 1983-05-06 Yokogawa Hewlett Packard Ltd 直流特性測定システム
US4517512A (en) * 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
CU21488A1 (es) * 1982-07-26 1987-06-09 Inst Central De Investigacion Medidor lógico
US9429613B1 (en) * 2012-07-02 2016-08-30 Marshall B. Borchert Time domain reflectometer
US10310006B2 (en) * 2013-03-15 2019-06-04 Hubbell Incorporated DC high potential insulation breakdown test system and method
CN112887037A (zh) * 2021-01-15 2021-06-01 国营芜湖机械厂 一种通导系统射频电路快速测试装置及其测试诊断方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
US3082374A (en) * 1959-06-12 1963-03-19 Itt Automatic testing system and timing device therefor
US3116448A (en) * 1959-08-26 1963-12-31 Shell Oil Co Electrical well logging apparatus having surface digital recording means and a multivibrator included within a downhole instrument
US3287636A (en) * 1962-07-24 1966-11-22 Charbonnages De France Method and apparatus including condenser means for measuring the insulation from earth of electrical networks

Also Published As

Publication number Publication date
GB1160968A (en) 1969-08-13
JPS4417941B1 (xx) 1969-08-07
US3418573A (en) 1968-12-24
DE1541868C3 (de) 1974-02-28
DE1541868B2 (de) 1972-08-17
DE1541868A1 (de) 1970-01-22

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