SE301731B - - Google Patents
Info
- Publication number
- SE301731B SE301731B SE2432/66A SE243266A SE301731B SE 301731 B SE301731 B SE 301731B SE 2432/66 A SE2432/66 A SE 2432/66A SE 243266 A SE243266 A SE 243266A SE 301731 B SE301731 B SE 301731B
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9006—Details, e.g. in the structure or functioning of sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE2432/66A SE301731B (ja) | 1966-02-24 | 1966-02-24 | |
NL6701375A NL6701375A (ja) | 1966-02-24 | 1967-01-27 | |
US613146A US3437918A (en) | 1966-02-24 | 1967-02-01 | Inductive bridge circuit for flaw sensing in which all coils of the bridge are positioned adjacent the test piece |
GB5528/67A GB1161106A (en) | 1966-02-24 | 1967-02-06 | An Electroinductive Sensing Device. |
DE19671648450 DE1648450A1 (de) | 1966-02-24 | 1967-02-14 | Fehlerdetektor zur elektroinduktiven Materialpruefung |
CH211367A CH456197A (de) | 1966-02-24 | 1967-02-14 | Fehlerdetektor zur elektroinduktiven Materialprüfung |
AT166167A AT276811B (de) | 1966-02-24 | 1967-02-20 | Fehlerdetektor zur elektroinduktiven Materialprüfung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE2432/66A SE301731B (ja) | 1966-02-24 | 1966-02-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
SE301731B true SE301731B (ja) | 1968-06-17 |
Family
ID=20259941
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE2432/66A SE301731B (ja) | 1966-02-24 | 1966-02-24 |
Country Status (7)
Country | Link |
---|---|
US (1) | US3437918A (ja) |
AT (1) | AT276811B (ja) |
CH (1) | CH456197A (ja) |
DE (1) | DE1648450A1 (ja) |
GB (1) | GB1161106A (ja) |
NL (1) | NL6701375A (ja) |
SE (1) | SE301731B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1567600A (en) * | 1975-10-15 | 1980-05-21 | British Gas Corp | Lipe line inspection equipment |
DE2725354C2 (de) * | 1977-06-04 | 1986-06-12 | SKF GmbH, 8720 Schweinfurt | Prüfkopf zur induktiven Oberflächenprüfung von metallischen Werkstücken |
FR2412841A1 (fr) * | 1977-12-26 | 1979-07-20 | Siderurgie Fse Inst Rech | Dispositif electromagnetique d'inspection par courants de foucault |
FR2538116A1 (fr) * | 1982-12-21 | 1984-06-22 | Cgr | Dispositif de mesure des defauts structurels d'objets en defilement |
GB8426485D0 (en) * | 1984-10-19 | 1984-11-28 | Gen Eng Radcliffe Ltd | Monitoring |
JPH089641Y2 (ja) * | 1989-01-30 | 1996-03-21 | 株式会社明電舎 | スチールベルトのクラック検出装置 |
US5389876A (en) * | 1991-05-06 | 1995-02-14 | General Electric Company | Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
EP0624249B1 (en) * | 1992-01-31 | 1999-03-31 | Northrop Grumman Corporation | Arrayed eddy current probe system |
US7015690B2 (en) * | 2004-05-27 | 2006-03-21 | General Electric Company | Omnidirectional eddy current probe and inspection system |
US9222917B2 (en) | 2012-07-25 | 2015-12-29 | General Electric Company | Broadband eddy current probe |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE846312C (de) * | 1943-10-07 | 1952-08-11 | Ernst Heinkel Ag | Pruefanordnung zur magnet-induktiven Werkstoff-Fehlerpruefung |
US3247453A (en) * | 1961-03-09 | 1966-04-19 | Api Instr Company | Magnetic flaw detector with exciting and sensing coils axially aligned on opposite sides of the material |
US3100281A (en) * | 1961-09-28 | 1963-08-06 | Jack C Spanner | Apparatus for measuring annular offset between a first metal tube and a second metal tube spatially disposed within the first tube |
US3241058A (en) * | 1962-08-22 | 1966-03-15 | Api Instr Company | Flaw detecting apparatus having null plane positioned sensors which are series connected |
US3271662A (en) * | 1962-08-22 | 1966-09-06 | Api Instr Company | Flaw detecting apparatus having multiple pick-up and exciting coils on the same side of the test piece |
-
1966
- 1966-02-24 SE SE2432/66A patent/SE301731B/xx unknown
-
1967
- 1967-01-27 NL NL6701375A patent/NL6701375A/xx unknown
- 1967-02-01 US US613146A patent/US3437918A/en not_active Expired - Lifetime
- 1967-02-06 GB GB5528/67A patent/GB1161106A/en not_active Expired
- 1967-02-14 CH CH211367A patent/CH456197A/de unknown
- 1967-02-14 DE DE19671648450 patent/DE1648450A1/de active Pending
- 1967-02-20 AT AT166167A patent/AT276811B/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
GB1161106A (en) | 1969-08-13 |
AT276811B (de) | 1969-12-10 |
US3437918A (en) | 1969-04-08 |
CH456197A (de) | 1968-05-15 |
NL6701375A (ja) | 1967-08-25 |
DE1648450A1 (de) | 1971-06-09 |