AT276811B - Fehlerdetektor zur elektroinduktiven Materialprüfung - Google Patents

Fehlerdetektor zur elektroinduktiven Materialprüfung

Info

Publication number
AT276811B
AT276811B AT166167A AT166167A AT276811B AT 276811 B AT276811 B AT 276811B AT 166167 A AT166167 A AT 166167A AT 166167 A AT166167 A AT 166167A AT 276811 B AT276811 B AT 276811B
Authority
AT
Austria
Prior art keywords
electro
fault detector
material testing
inductive material
inductive
Prior art date
Application number
AT166167A
Other languages
English (en)
Original Assignee
Essem Metotest Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Essem Metotest Ab filed Critical Essem Metotest Ab
Application granted granted Critical
Publication of AT276811B publication Critical patent/AT276811B/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
AT166167A 1966-02-24 1967-02-20 Fehlerdetektor zur elektroinduktiven Materialprüfung AT276811B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE2432/66A SE301731B (de) 1966-02-24 1966-02-24

Publications (1)

Publication Number Publication Date
AT276811B true AT276811B (de) 1969-12-10

Family

ID=20259941

Family Applications (1)

Application Number Title Priority Date Filing Date
AT166167A AT276811B (de) 1966-02-24 1967-02-20 Fehlerdetektor zur elektroinduktiven Materialprüfung

Country Status (7)

Country Link
US (1) US3437918A (de)
AT (1) AT276811B (de)
CH (1) CH456197A (de)
DE (1) DE1648450A1 (de)
GB (1) GB1161106A (de)
NL (1) NL6701375A (de)
SE (1) SE301731B (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1567600A (en) * 1975-10-15 1980-05-21 British Gas Corp Lipe line inspection equipment
DE2725354C2 (de) * 1977-06-04 1986-06-12 SKF GmbH, 8720 Schweinfurt Prüfkopf zur induktiven Oberflächenprüfung von metallischen Werkstücken
FR2412841A1 (fr) * 1977-12-26 1979-07-20 Siderurgie Fse Inst Rech Dispositif electromagnetique d'inspection par courants de foucault
FR2538116A1 (fr) * 1982-12-21 1984-06-22 Cgr Dispositif de mesure des defauts structurels d'objets en defilement
GB8426485D0 (en) * 1984-10-19 1984-11-28 Gen Eng Radcliffe Ltd Monitoring
JPH089641Y2 (ja) * 1989-01-30 1996-03-21 株式会社明電舎 スチールベルトのクラック検出装置
US5389876A (en) * 1991-05-06 1995-02-14 General Electric Company Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part
EP0624249B1 (de) * 1992-01-31 1999-03-31 Northrop Grumman Corporation Wirbelstromsondensystem in einem array
US7015690B2 (en) * 2004-05-27 2006-03-21 General Electric Company Omnidirectional eddy current probe and inspection system
US9222917B2 (en) * 2012-07-25 2015-12-29 General Electric Company Broadband eddy current probe

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE846312C (de) * 1943-10-07 1952-08-11 Ernst Heinkel Ag Pruefanordnung zur magnet-induktiven Werkstoff-Fehlerpruefung
US3247453A (en) * 1961-03-09 1966-04-19 Api Instr Company Magnetic flaw detector with exciting and sensing coils axially aligned on opposite sides of the material
US3100281A (en) * 1961-09-28 1963-08-06 Jack C Spanner Apparatus for measuring annular offset between a first metal tube and a second metal tube spatially disposed within the first tube
US3271662A (en) * 1962-08-22 1966-09-06 Api Instr Company Flaw detecting apparatus having multiple pick-up and exciting coils on the same side of the test piece
US3241058A (en) * 1962-08-22 1966-03-15 Api Instr Company Flaw detecting apparatus having null plane positioned sensors which are series connected

Also Published As

Publication number Publication date
NL6701375A (de) 1967-08-25
GB1161106A (en) 1969-08-13
DE1648450A1 (de) 1971-06-09
SE301731B (de) 1968-06-17
US3437918A (en) 1969-04-08
CH456197A (de) 1968-05-15

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Legal Events

Date Code Title Description
EIH Change in the person of patent owner
ELJ Ceased due to non-payment of the annual fee