SE0702253L - Datoriserad avsyning - Google Patents

Datoriserad avsyning

Info

Publication number
SE0702253L
SE0702253L SE0702253A SE0702253A SE0702253L SE 0702253 L SE0702253 L SE 0702253L SE 0702253 A SE0702253 A SE 0702253A SE 0702253 A SE0702253 A SE 0702253A SE 0702253 L SE0702253 L SE 0702253L
Authority
SE
Sweden
Prior art keywords
computer
scanner
outlines
scanned
scanning
Prior art date
Application number
SE0702253A
Other languages
English (en)
Other versions
SE533521C2 (sv
Inventor
Anders Reyier
Original Assignee
Morphic Technologies Ab Publ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Morphic Technologies Ab Publ filed Critical Morphic Technologies Ab Publ
Priority to SE0702253A priority Critical patent/SE533521C2/sv
Priority to CN200880109841A priority patent/CN101815924A/zh
Priority to PCT/SE2008/051135 priority patent/WO2009048415A1/en
Priority to EP08838423A priority patent/EP2198243A1/en
Publication of SE0702253L publication Critical patent/SE0702253L/sv
Publication of SE533521C2 publication Critical patent/SE533521C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
SE0702253A 2007-10-08 2007-10-08 Förfarande och anordning för datoriserad avsyning för fastställande av avvikelser i föremåls form och mått SE533521C2 (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE0702253A SE533521C2 (sv) 2007-10-08 2007-10-08 Förfarande och anordning för datoriserad avsyning för fastställande av avvikelser i föremåls form och mått
CN200880109841A CN101815924A (zh) 2007-10-08 2008-10-07 物体的计算机化检验方法和装置
PCT/SE2008/051135 WO2009048415A1 (en) 2007-10-08 2008-10-07 Method and device for computerized inspection of objects
EP08838423A EP2198243A1 (en) 2007-10-08 2008-10-07 Method and device for computerized inspection of objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0702253A SE533521C2 (sv) 2007-10-08 2007-10-08 Förfarande och anordning för datoriserad avsyning för fastställande av avvikelser i föremåls form och mått

Publications (2)

Publication Number Publication Date
SE0702253L true SE0702253L (sv) 2009-04-09
SE533521C2 SE533521C2 (sv) 2010-10-12

Family

ID=40549409

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0702253A SE533521C2 (sv) 2007-10-08 2007-10-08 Förfarande och anordning för datoriserad avsyning för fastställande av avvikelser i föremåls form och mått

Country Status (4)

Country Link
EP (1) EP2198243A1 (sv)
CN (1) CN101815924A (sv)
SE (1) SE533521C2 (sv)
WO (1) WO2009048415A1 (sv)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2950987B1 (fr) * 2009-10-07 2011-12-23 Prothese Dentaire Soca Lab De Systeme autonome de traitement de numerisation d'empreintes dentaires
CN103364403A (zh) * 2012-04-06 2013-10-23 鸿富锦精密工业（深圳）有限公司 产品质量自动化控管系统及方法
DE102013104004A1 (de) * 2013-04-19 2014-10-23 Schoen + Sandt Machinery Gmbh Prüfvorrichtung und -Verfahren
CN104697444A (zh) * 2013-12-10 2015-06-10 鸿富锦精密工业（深圳）有限公司 检测系统
CN104006749B (zh) * 2014-05-24 2017-08-15 贵州师范大学 基于在线钢丝绳的测长装置及方法
FR3040782B1 (fr) * 2015-09-08 2017-09-01 Eurostat Group Dispositif et procede de controle d’une piece thermoformee
EP3203180B1 (en) * 2016-02-04 2018-12-05 Mettler-Toledo GmbH Apparatus and methods for dimensioning an object carried by a vehicle moving in a field of measurement
WO2018140021A1 (en) * 2017-01-26 2018-08-02 Hewlett-Packard Development Company, L.P. Disposition of printed 3d objects

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5889582A (en) * 1997-03-10 1999-03-30 Virtek Vision Corporation Image-directed active range finding system
US5956134A (en) * 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
US7126699B1 (en) * 2002-10-18 2006-10-24 Kla-Tencor Technologies Corp. Systems and methods for multi-dimensional metrology and/or inspection of a specimen
US7551272B2 (en) * 2005-11-09 2009-06-23 Aceris 3D Inspection Inc. Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object

Also Published As

Publication number Publication date
CN101815924A (zh) 2010-08-25
SE533521C2 (sv) 2010-10-12
EP2198243A1 (en) 2010-06-23
WO2009048415A1 (en) 2009-04-16

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