SE0601726L - Vinkelmätningar - Google Patents

Vinkelmätningar

Info

Publication number
SE0601726L
SE0601726L SE0601726A SE0601726A SE0601726L SE 0601726 L SE0601726 L SE 0601726L SE 0601726 A SE0601726 A SE 0601726A SE 0601726 A SE0601726 A SE 0601726A SE 0601726 L SE0601726 L SE 0601726L
Authority
SE
Sweden
Prior art keywords
retroreflecting
foil
angle
retroreflecting foil
transitions
Prior art date
Application number
SE0601726A
Other languages
English (en)
Other versions
SE530341C2 (sv
Inventor
Axel Lundvall
Original Assignee
Rolling Optics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rolling Optics filed Critical Rolling Optics
Priority to SE0601726A priority Critical patent/SE530341C2/sv
Priority to PCT/SE2007/050524 priority patent/WO2008024058A1/en
Priority to EP07794134.2A priority patent/EP2057439A4/en
Priority to US12/438,421 priority patent/US7978321B2/en
Publication of SE0601726L publication Critical patent/SE0601726L/sv
Publication of SE530341C2 publication Critical patent/SE530341C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • G02B3/0062—Stacked lens arrays, i.e. refractive surfaces arranged in at least two planes, without structurally separate optical elements in-between
    • G02B3/0068—Stacked lens arrays, i.e. refractive surfaces arranged in at least two planes, without structurally separate optical elements in-between arranged in a single integral body or plate, e.g. laminates or hybrid structures with other optical elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/12—Reflex reflectors
    • G02B5/126—Reflex reflectors including curved refracting surface

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SE0601726A 2006-08-22 2006-08-22 Förfarande och anordning för vinkelbestämning med retroreflekterande folie SE530341C2 (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE0601726A SE530341C2 (sv) 2006-08-22 2006-08-22 Förfarande och anordning för vinkelbestämning med retroreflekterande folie
PCT/SE2007/050524 WO2008024058A1 (en) 2006-08-22 2007-07-12 Method and device for angle determination and retroref lecting foil
EP07794134.2A EP2057439A4 (en) 2006-08-22 2007-07-12 METHOD AND DEVICE FOR ANGLE DETERMINATION AND RETROREFLECTIVE FILM
US12/438,421 US7978321B2 (en) 2006-08-22 2007-07-12 Angle measurements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0601726A SE530341C2 (sv) 2006-08-22 2006-08-22 Förfarande och anordning för vinkelbestämning med retroreflekterande folie

Publications (2)

Publication Number Publication Date
SE0601726L true SE0601726L (sv) 2008-02-23
SE530341C2 SE530341C2 (sv) 2008-05-06

Family

ID=39107058

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0601726A SE530341C2 (sv) 2006-08-22 2006-08-22 Förfarande och anordning för vinkelbestämning med retroreflekterande folie

Country Status (4)

Country Link
US (1) US7978321B2 (sv)
EP (1) EP2057439A4 (sv)
SE (1) SE530341C2 (sv)
WO (1) WO2008024058A1 (sv)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2599912C2 (ru) * 2014-01-30 2016-10-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования Московский государственный университет геодезии и картографии (МИИГАиК) Устройство для измерения изменения угловой координаты объекта в плоскости
FR3025307B1 (fr) * 2014-08-29 2016-12-09 Thales Sa Systeme de detection de posture a retroreflecteur comportant un maillage filaire
WO2017138441A1 (ja) * 2016-02-10 2017-08-17 株式会社エンプラス マーカ
EP3553462B1 (en) 2016-12-12 2021-05-26 National Institute of Advanced Industrial Science and Technology Marker and marker manufacturing method
JP2021101175A (ja) * 2019-12-24 2021-07-08 スリーエム イノベイティブ プロパティズ カンパニー 検出装置、及び検出方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1918705A (en) * 1930-12-20 1933-07-18 Herbert E Ives Parallax panoramagram
US3989775A (en) * 1971-03-01 1976-11-02 Bakelite Xylonite Limited Method of making a retro-reflective beaded material
US4082426A (en) * 1976-11-26 1978-04-04 Minnesota Mining And Manufacturing Company Retroreflective sheeting with retroreflective markings
SE503429C2 (sv) * 1994-06-06 1996-06-10 Industrimateriel Ab Retroreflektor
SE9804247L (sv) * 1998-12-08 2000-03-27 East Of Sweden Ab Färgselekterande retroreflektor
DE19956912A1 (de) * 1999-11-26 2001-08-09 Heidenhain Gmbh Dr Johannes Winkelmeßsystem und Winkelmeßverfahren zur berührungslosen Winkelmessung
US7068434B2 (en) * 2000-02-22 2006-06-27 3M Innovative Properties Company Sheeting with composite image that floats
US6500526B1 (en) * 2000-09-28 2002-12-31 Avery Dennison Corporation Retroreflective sheeting containing a validation image and methods of making the same
DK1893074T3 (da) * 2005-05-18 2013-11-04 Visual Physics Llc Billedvisning og mikrooptisk sikkerhedssystem

Also Published As

Publication number Publication date
US7978321B2 (en) 2011-07-12
SE530341C2 (sv) 2008-05-06
EP2057439A1 (en) 2009-05-13
WO2008024058A1 (en) 2008-02-28
US20100245806A1 (en) 2010-09-30
EP2057439A4 (en) 2014-07-23

Similar Documents

Publication Publication Date Title
WO2003014777A3 (en) Optical film having microreplicated structures
JP2017524161A5 (sv)
WO2007133684A8 (en) Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy
WO2009114114A3 (en) Prismatic lens and reflector/refractor device
WO2005101171A3 (en) Multi-light-source illumination system for optical pointing devices
BR0213070A (pt) Luminária guia de luz, e, lâmpada de sinalização para um veìculo automotivo
TW200609538A (en) Composite optical lens with an integrated reflector
WO2006068264A3 (en) Optical device and light source
DE60142516D1 (de) Optischer strahlaufweiter mit substratlichtwellenleitung
TW200602630A (en) Optical cell measurement apparatus
SE0601726L (sv) Vinkelmätningar
TW200712741A (en) Multiple location illumination system and projection display system employing same
ATE405951T1 (de) Modul für die projektion eines lichtstrahls
TWI268339B (en) Displacement measuring device and method, an internal diameter measuring device by use of the variance of the wavelength to measure the displacement and the internal diameter
WO2008047346A3 (en) Semitransparent integrated optic mirror
DE602004017235D1 (de) Sserachsenspiegeln
WO2010010311A3 (fr) Dispositif optique et procede de mesure de rotation d'un objet
JP2011009021A5 (sv)
JP2005346970A5 (sv)
WO2008152979A1 (ja) 光走査型センサ
JP2009276114A5 (sv)
TW201415077A (zh) 用於一顯微鏡之多方向照明及顯微鏡
JP2006251397A5 (sv)
EP2541132A3 (en) Vehicle lamp
JP2013061530A5 (sv)

Legal Events

Date Code Title Description
NUG Patent has lapsed