SE0303612D0 - Metod och anordning för mätning av dimensioner och egenskaper hos ett mätobjekt - Google Patents

Metod och anordning för mätning av dimensioner och egenskaper hos ett mätobjekt

Info

Publication number
SE0303612D0
SE0303612D0 SE0303612A SE0303612A SE0303612D0 SE 0303612 D0 SE0303612 D0 SE 0303612D0 SE 0303612 A SE0303612 A SE 0303612A SE 0303612 A SE0303612 A SE 0303612A SE 0303612 D0 SE0303612 D0 SE 0303612D0
Authority
SE
Sweden
Prior art keywords
measured
transmitter coil
magnetic field
coil
measuring
Prior art date
Application number
SE0303612A
Other languages
English (en)
Other versions
SE0303612L (sv
SE527091C2 (sv
Inventor
Sten Linder
Original Assignee
Abb Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Ab filed Critical Abb Ab
Priority to SE0303612A priority Critical patent/SE527091C2/sv
Publication of SE0303612D0 publication Critical patent/SE0303612D0/sv
Priority to PT48091540T priority patent/PT1709390E/pt
Priority to US10/585,111 priority patent/US7701205B2/en
Priority to EP04809154A priority patent/EP1709390B1/en
Priority to JP2006546919A priority patent/JP4559435B2/ja
Priority to CNB2004800394760A priority patent/CN100520277C/zh
Priority to ES04809154T priority patent/ES2395727T3/es
Priority to PCT/SE2004/001981 priority patent/WO2005064268A1/en
Publication of SE0303612L publication Critical patent/SE0303612L/sv
Publication of SE527091C2 publication Critical patent/SE527091C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/46—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a transmitter on the other side
SE0303612A 2003-12-31 2003-12-31 Metod och anordning för beröringsfri mätning av tjocklek och elektriska ledningsförmåga hos ett mätobjekt SE527091C2 (sv)

Priority Applications (8)

Application Number Priority Date Filing Date Title
SE0303612A SE527091C2 (sv) 2003-12-31 2003-12-31 Metod och anordning för beröringsfri mätning av tjocklek och elektriska ledningsförmåga hos ett mätobjekt
PT48091540T PT1709390E (pt) 2003-12-31 2004-12-22 Método e dispositivo para medição da espessura e da condutividade elétrica de um objeto a ser medido
US10/585,111 US7701205B2 (en) 2003-12-31 2004-12-22 Method and device for measuring the thickness and the electrical conductivity of electrically conducting sheets
EP04809154A EP1709390B1 (en) 2003-12-31 2004-12-22 A method and device for measuring the thickness and the electrical conductivity of an object of measurement
JP2006546919A JP4559435B2 (ja) 2003-12-31 2004-12-22 測定対象のオブジェクト厚さ及び電気伝導度を測定するための方法及びデバイス
CNB2004800394760A CN100520277C (zh) 2003-12-31 2004-12-22 用于测量测量物体的厚度和电导率的方法及装置
ES04809154T ES2395727T3 (es) 2003-12-31 2004-12-22 Método y dispositivo para medir el espesor y la conductividad eléctrica de un objeto de medición
PCT/SE2004/001981 WO2005064268A1 (en) 2003-12-31 2004-12-22 A method and device for measuring the thickness and the electrical conductivity of an object of measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0303612A SE527091C2 (sv) 2003-12-31 2003-12-31 Metod och anordning för beröringsfri mätning av tjocklek och elektriska ledningsförmåga hos ett mätobjekt

Publications (3)

Publication Number Publication Date
SE0303612D0 true SE0303612D0 (sv) 2003-12-31
SE0303612L SE0303612L (sv) 2005-07-01
SE527091C2 SE527091C2 (sv) 2005-12-20

Family

ID=30768919

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0303612A SE527091C2 (sv) 2003-12-31 2003-12-31 Metod och anordning för beröringsfri mätning av tjocklek och elektriska ledningsförmåga hos ett mätobjekt

Country Status (8)

Country Link
US (1) US7701205B2 (sv)
EP (1) EP1709390B1 (sv)
JP (1) JP4559435B2 (sv)
CN (1) CN100520277C (sv)
ES (1) ES2395727T3 (sv)
PT (1) PT1709390E (sv)
SE (1) SE527091C2 (sv)
WO (1) WO2005064268A1 (sv)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE602006020462D1 (de) 2006-11-23 2011-04-14 Abb Ab Signalverarbeitungsverfahren und Einheit für ein Größenmesssystem
CN101561466B (zh) * 2008-04-18 2011-01-26 中国科学院金属研究所 一种涡流电导率测量方法
CN101629923B (zh) * 2008-07-14 2013-05-15 梅特勒-托利多仪器（上海）有限公司 电磁式溶液电导率的测量方法及装置
ES2408590T3 (es) * 2009-03-17 2013-06-21 Abb Ab Un método y un aparato para medir el espesor de una capa de metal provista sobre un objeto metálico
KR101921462B1 (ko) * 2016-11-16 2018-11-23 유진인스텍코어 주식회사 금속박 두께 측정장치
US10557897B2 (en) 2018-01-19 2020-02-11 International Business Machines Corporation Non-contact conductivity and magnetic susceptibility measurement with parallel dipole line trap system
JP7132015B2 (ja) * 2018-07-24 2022-09-06 アズビル株式会社 電気伝導率計
US11143495B2 (en) * 2018-09-24 2021-10-12 Honeywell International Inc. Thickness measurement with inductive and optical displacement sensors
EP4053494A1 (en) 2021-03-02 2022-09-07 ABB Schweiz AG Thickness measurement using a pulsed eddy current system

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4006405A (en) * 1975-01-13 1977-02-01 The Singer Company Method and apparatus for measuring parameters of a conductive material which can be used in independently determining thickness and conductivity
US4271393A (en) 1978-12-29 1981-06-02 The Boeing Company Apparatus and method for eddy current detection of subsurface discontinuities in conductive bodies
JPH0249660B2 (ja) * 1983-06-15 1990-10-30 Nippon Steel Corp Hentairyoritsunosokuteihoho
JPS59231447A (ja) * 1983-06-15 1984-12-26 Nippon Steel Corp パルス電流による変態量率の測定方法
US4740747A (en) * 1983-06-15 1988-04-26 Nippon Steel Corporation Method of and apparatus for measuring transformation degree
US4639669A (en) * 1983-09-26 1987-01-27 Lockheed Missiles & Space Company, Inc. Pulsed electromagnetic nondestructive test method for determining volume density of graphite fibers in a graphite-epoxy composite material
US4818936A (en) * 1985-02-15 1989-04-04 The Broken Hill Proprietary Company Limited Method and apparatus for identifying and classifying steels
SE451886B (sv) * 1986-10-10 1987-11-02 Sten Linder Sett och anordning for beroringsfri metning av storheter hos eller i anslutning till elektriskt ledande material
DE69000465T2 (de) * 1990-12-21 1993-05-13 Detra Sa Induktiver naeherungssensor.
US5283520A (en) * 1991-04-04 1994-02-01 Martin Philip W Method of determining thickness of magnetic pipe by measuring the time it takes the pipe to reach magnetic saturation
US5512821A (en) * 1991-06-04 1996-04-30 Nkk Corporation Method and apparatus for magnetically detecting defects in an object with compensation for magnetic field shift by means of a compensating coil
JP3091556B2 (ja) * 1992-02-25 2000-09-25 同和鉱業株式会社 導体の厚さ測定方法及びその装置
SE506154C2 (sv) * 1995-10-13 1997-11-17 Asea Brown Boveri Förfarande och anordning för induktiv mätning av mått och läge hos objekt av elektriskt ledande material
WO1997023762A2 (de) * 1995-12-22 1997-07-03 Siemens Aktiengesellschaft Verfahren und vorrichtung zur bestimmung der dicke einer elektrisch leitfähigen schicht
JPH11326284A (ja) * 1998-05-08 1999-11-26 Yonekura Seisakusho:Kk パルス渦流探傷方法およびその装置
JP2000009414A (ja) * 1998-06-26 2000-01-14 Nippon Steel Corp 表層厚さ測定方法
SE517293C2 (sv) * 1999-06-30 2002-05-21 Abb Ab Förfarande och anordning för induktiv mätning av geometrisk dimension och elektrisk egenskap med motriktade magnetfält
JP2001041703A (ja) * 1999-07-29 2001-02-16 Sanki System Engineering Kk 距離計及び厚み計
US6593737B2 (en) * 2000-08-24 2003-07-15 Shell Oil Company Method for measuring the wall thickness of an electrically conductive object

Also Published As

Publication number Publication date
ES2395727T3 (es) 2013-02-14
JP2007519898A (ja) 2007-07-19
SE0303612L (sv) 2005-07-01
US20070273371A1 (en) 2007-11-29
WO2005064268A1 (en) 2005-07-14
PT1709390E (pt) 2012-12-17
EP1709390A1 (en) 2006-10-11
JP4559435B2 (ja) 2010-10-06
CN1910426A (zh) 2007-02-07
US7701205B2 (en) 2010-04-20
CN100520277C (zh) 2009-07-29
SE527091C2 (sv) 2005-12-20
EP1709390B1 (en) 2012-11-21

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Legal Events

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NUG Patent has lapsed